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REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices.
a
ADG604
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
www.analog.com
Fax: 781/326-8703
Analog Devices, Inc., 2002
1 pC Charge Injection, 100 pA Leakage
CMOS 5 V/5 V/3 V 4-Channel Multiplexer
FUNCTIONAL BLOCK DIAGRAM
ADG604
S1
EN
A1
A0
14
1
2
4
1 OF 4
DECODER
S2
5
S3
11
S4
10
D
6
FEATURES
1 pC Charge Injection (Over the Full Signal Range)
2.7 V to 5.5 V Dual Supply
2.7 V to 5.5 V Single Supply
Automotive Temperature Range: 40 C to +125 C
100 pA Max @ 25 C Leakage Currents
85 Typ On Resistance
Rail-to-Rail Operation
Fast Switching Times
Typical Power Consumption (<0.1 W)
TTL/CMOS Compatible Inputs
14-Lead TSSOP Package
APPLICATIONS
Automatic Test Equipment
Data Acquisition Systems
Battery-Powered Instruments
Communication Systems
Sample and Hold Systems
Remote-Powered Equipment
Audio and Video Signal Routing
Relay Replacement
Avionics
GENERAL DESCRIPTION
The ADG604 is a CMOS analog multiplexer, comprising four
single channels. It operates from a dual supply of
2.7 V to
5.5 V, or from a single supply of 2.7 V to 5.5 V.
The ADG604 switches one of four inputs to a common output,
D, as determined by the 3-bit binary address lines, A0, A1, and
EN. A Logic "0" on the EN pin disables the device.
The ADG604 offers ultralow charge injection of
1.5 pC over the
entire signal range and leakage currents of 10 pA typical at 25
C.
It offers on resistance of 85
typ, which is matched to within 2
between channels. The ADG604 also has low power dissipation yet
gives high switching speeds. The ADG604 is available in a 14-lead
TSSOP package.
PRODUCT HIGHLIGHTS
1. Ultralow Charge Injection (Q
INJ
:
1.5 pC Typ over the Full
Signal Range)
2. Leakage Current <0.5 nA max @ 85
C
3. Dual
2.7 V to 5.5 V or Single 2.7 V to 5.5 V Supply
4. Fully Specified to 125
C
5. Small 14-Lead TSSOP Package
REV. 0
2
ADG604SPECIFICATIONS
40 C to
40 C to
Parameter
25 C
+85 C
+125 C
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
V
SS
to V
DD
V
V
DD
= +4.5 V, V
SS
= 4.5 V
On Resistance (R
ON
)
85
Typ
V
S
=
3 V, I
S
= 1 mA,
115
140
160
Max
Test Circuit 1
On Resistance Match Between
Channels ( R
ON
)
2
Typ
V
S
=
3 V, I
S
= 1 mA
4
5.5
6.5
Max
On-Resistance Flatness (R
FLAT(ON)
)
25
Typ
V
S
=
3 V, I
S
= 1 mA
40
55
60
Max
LEAKAGE CURRENTS
V
DD
= +5.5 V, V
SS
= 5.5 V
Source OFF Leakage I
S
(OFF)
0.01
nA Typ
V
S
=
4.5 V, V
D
= 4.5 V,
0.1
0.25
4
nA Max
Test Circuit 2
Drain OFF Leakage I
D
(OFF)
0.01
nA Typ
V
S
=
4.5 V, V
D
= 4.5 V,
0.1
0.5
8
nA Max
Test Circuit 2
Channel ON Leakage I
D,
I
S
(ON)
0.01
nA Typ
V
S
= V
D
=
4.5 V, Test Circuit 3
0.1
0.5
10
nA Max
DIGITAL INPUTS
Input High Voltage, V
INH
2.4
V Min
Input Low Voltage, V
INL
0.8
V Max
Input Current
I
INL
or I
INH
0.005
A Typ
V
IN
= V
INL
or V
INH
0.1
A Max
C
IN
, Digital Input Capacitance
2
pF Typ
DYNAMIC CHARACTERISTICS
2
Transition Time
70
ns Typ
V
S1
= +3 V, V
S4
= 3 V, R
L
= 300
,
100
120
150
ns Max
C
L
= 35 pF, Test Circuit 4
t
ON
Enable
80
ns Typ
R
L
= 300
, C
L
= 35 pF
105
130
150
ns Max
V
S
= 3 V, Test Circuit 6
t
OFF
Enable
30
ns Typ
R
L
= 300
, C
L
= 35 pF
45
55
65
ns Max
V
S
= 3 V, Test Circuit 6
Break-Before-Make Time Delay, t
BBM
20
ns Typ
R
L
= 300
, C
L
= 35 pF,
10
ns Min
V
S1
= V
S2
= 3 V, Test Circuit 5
Charge Injection
1
pC Typ
V
S
= 0 V, R
S
= 0
, C
L
= 1nF, Test Circuit 7
Off Isolation
75
dB Typ
R
L
= 50
, C
L
= 5 pF, f = 10 MHz,
Test Circuit 8
Channel-to-Channel Crosstalk
70
dB Typ
R
L
= 50
, C
L
= 5 pF, f = 10 MHz,
Test Circuit 10
Bandwidth 3 dB
280
MHz Typ
R
L
= 50
, C
L
= 5 pF, Test Circuit 9
C
S
(OFF)
5
pF Typ
f = 1 MHz
C
D
(OFF)
17
pF Typ
f = 1 MHz
C
D
,
C
S
(ON)
18
pF Typ
f = 1 MHz
POWER REQUIREMENTS
V
DD
= +5.5 V, V
SS
= 5.5 V
I
DD
0.001
A Typ
Digital Inputs = 0 V or 5.5 V
1.0
A Max
Iss
0.001
A Typ
Digital Inputs = 0 V or 5.5 V
1.0
A Max
NOTES
1
Y Version Temperature Range: 40
C to +125C
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
DUAL SUPPLY
1
(V
DD
= +5 V 10%, V
SS
= 5 V 10%, GND = 0 V. All specifications 40 C to +125 C unless otherwise noted.)
REV. 0
3
ADG604
SINGLE SUPPLY
1
(V
DD
= 5 V 10%, V
SS
= 0 V, GND = 0 V. All specifications 40 C to +125 C unless otherwise noted.)
40 C to
40 C to
Parameter
25 C
+85 C
+125 C
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
0 V to V
DD
V
V
DD
= 4.5 V, V
SS
= 0 V
On Resistance (R
ON
)
210
Typ
V
S
= 3.5 V, I
S
= 1 mA,
290
350
380
Max
Test Circuit 1
On Resistance Match Between
Channels ( R
ON
)
3
Typ
V
S
= 3.5 V, I
S
= 1 mA
12
13
Max
LEAKAGE CURRENTS
V
DD
= 5.5 V
Source OFF Leakage I
S
(OFF)
0.01
nA Typ
V
S
= 1 V/4.5 V, V
D
= 4.5 V/1 V,
0.1
0.25
4
nA Max
Test Circuit 2
Drain OFF Leakage I
D
(OFF)
0.01
nA Typ
V
S
= 1 V/4.5 V, V
D
= 4.5 V/1 V,
0.1
0.5
8
nA Max
Test Circuit 2
Channel ON Leakage I
D
, I
S
(ON)
0.01
nA Typ
V
S
= V
D
= 4.5 V/1 V,
0.1
0.5
10
nA Max
Test Circuit 3
DIGITAL INPUTS
Input High Voltage, V
INH
2.4
V Min
Input Low Voltage, V
INL
0.8
V Max
Input Current
I
INL
or I
INH
0.005
A Typ
V
IN
= V
INL
or V
INH
0.1
A Max
C
IN
, Digital Input Capacitance
2
pF Typ
DYNAMIC CHARACTERISTICS
2
Transition Time
90
ns Typ
V
S1
= 3 V, V
S4
= 0 V, R
L
= 300
,
150
185
210
ns Max
C
L
= 35 pF, Test Circuit 4
t
ON
Enable
105
ns Typ
R
L
= 300
, C
L
= 35 pF
150
190
220
ns Max
V
S
= 3 V, Test Circuit 6
t
OFF
Enable
45
ns Typ
R
L
= 300
, C
L
= 35 pF
70
80
90
ns Max
V
S
= 3 V, Test Circuit 6
Break-Before-Make Time Delay, t
BBM
30
ns Typ
R
L
= 300
, C
L
= 35 pF,
10
ns Min
V
S1
= V
S2
= 3 V, Test Circuit 5
Charge Injection
0.3
pC Typ
V
S
= 0 V , R
S
= 0
, C
L
= 1 nF,
Test Circuit 7
Off Isolation
65
dB Typ
R
L
= 50
, C
L
= 5 pF, f = 10 MHz,
Test Circuit 8
Channel-to-Channel Crosstalk
70
dB Typ
R
L
= 50
, C
L
= 5 pF, f = 10 MHz,
Test Circuit 10
Bandwidth 3 dB
250
MHz Typ
R
L
= 50
, C
L
= 5 pF, Test Circuit 9
C
S
(OFF)
5
pF Typ
f = 1 MHz
C
D
(OFF)
17
pF Typ
f = 1 MHz
C
D
, C
S
(ON)
18
pF Typ
f = 1 MHz
POWER REQUIREMENTS
V
DD
= 5.5 V
Digital Inputs = 0 V or 5.5 V
I
DD
0.001
A Typ
1.0
A Max
NOTES
1
Y Version Temperature Range: 40
C to +125C
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. 0
4
ADG604SPECIFICATIONS
SINGLE SUPPLY
1
(V
DD
= 3 V 10%, V
SS
= 0 V, GND = 0 V. All specifications 40 C to +125 C unless otherwise noted.)
40 C to
40 C to
Parameter
25 C
+85 C
+125 C
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
0 V to V
DD
V
V
DD
= 2.7 V, V
SS
= 0 V
On Resistance (R
ON
)
380
420
460
Typ
V
S
= 1.5 V, I
S
= 1 mA,
Test Circuit 1
On Resistance Match Between
Channels ( R
ON
)
5
Typ
V
S
= 1.5 V, I
S
= 1 mA
LEAKAGE CURRENTS
V
DD
= 3.3 V
Source OFF Leakage I
S
(OFF)
0.01
nA Typ
V
S
= 1 V/3 V, V
D
= 3 V/1 V,
0.1
0.25
4
nA Max
Test Circuit 2
Drain OFF Leakage I
D
(OFF)
0.01
nA Typ
V
S
= 1 V/3 V, V
D
= 3 V/1 V,
0.1
0.5
8
nA Max
Test Circuit 2
Channel ON Leakage I
D
, I
S
(ON)
0.01
nA Typ
V
S
= V
D
= 1 V/3 V,
0.1
0.5
10
nA Max
Test Circuit 3
DIGITAL INPUTS
Input High Voltage, V
INH
2.0
V Min
Input Low Voltage, V
INL
0.8
V Max
Input Current
I
INL
or I
INH
0.005
A Typ
V
IN
= V
INL
or V
INH
0.1
A Max
C
IN
, Digital Input Capacitance
2
pF Typ
DYNAMIC CHARACTERISTICS
2
Transition Time
170
ns Typ
V
S1
= 2 V, V
S4
= 0 V, R
L
= 300
,
320
390
450
ns Max
C
L
= 35 pF, Test Circuit 4
t
ON
Enable
180
ns Typ
R
L
= 300
, C
L
= 35 pF
250
265
390
ns Max
V
S
= 2 V, Test Circuit 6
t
OFF
Enable
100
ns Typ
R
L
= 300
, C
L
= 35 pF
160
205
225
ns Max
V
S
= 2 V, Test Circuit 6
Break-Before-Make Time Delay, t
BBM
100
ns Typ
R
L
= 300
, C
L
= 35 pF,
10
ns Min
V
S1
= V
S2
= 2 V, Test Circuit 5
Charge Injection
0.3
pC Typ
V
S
= 0 V to 3.3 V, R
S
= 0
, C
L
= 1
F,
Test Circuit 7
Off Isolation
65
dB Typ
R
L
= 50
, C
L
= 5 pF, f = 10 MHz,
Test Circuit 8
Channel-to-Channel Crosstalk
70
dB Typ
R
L
= 50
, C
L
= 5 pF, f = 10 MHz,
Test Circuit 10
Bandwidth 3 dB
250
MHz Typ
R
L
= 50
, C
L
= 5 pF, Test Circuit 9
C
S
(OFF)
5
pF Typ
f = 1 MHz
C
D
(OFF)
17
pF Typ
f = 1 MHz
C
D
,
C
S
(ON)
18
pF Typ
f = 1 MHz
POWER REQUIREMENTS
V
DD
= 3.3 V
Digital Inputs = 0 V or 3.3 V
I
DD
0.001
A Typ
1.0
A Max
NOTES
1
Y Version Temperature Range: 40
C to +125C
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. 0
ADG604
5
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the ADG604 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS
1
(T
A
= 25
C unless otherwise noted)
V
DD
to V
SS
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 V
V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +6.5 V
V
SS
to GND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to 6.5 V
Analog Inputs
2
. . . . . . . . . . . . . . . . V
SS
0.3 V to V
DD
+ 0.3 V
Digital Inputs
2
. . . . . . . . . . . . . . . . . 0.3 V to V
DD
+ 0.3 V or
. . . . . . . . . . . . . . . . . . . . . . 30 mA, Whichever Occurs First
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA
(Pulsed at 1 ms, 10% Duty Cycle Max)
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . 10 mA
Operating Temperature Range
Automotive (Y Version) . . . . . . . . . . . . . . 40
C to +125C
Storage Temperature Range . . . . . . . . . . . . 65
C to +150C
ORDERING GUIDE
Model Option
Temperature Range
Package Description
Package
ADG604YRU
40
C to +125C
Thin Shrink Small Outline (TSSOP)
RU-14
PIN CONFIGURATION
A0
EN
V
SS
S1
S2
D
NC
1
A1
GND
V
DD
S3
S4
NC
NC
ADG604
2
3
4
5
6
7
14
13
12
11
10
9
8
TOP VIEW
(Not To Scale)
NC = NO CONNECT
Table I. Truth Table
A1
A0
EN
ON Switch
X
X
0
None
0
0
1
1
0
1
1
2
1
0
1
3
1
1
1
4
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . 150
C
TSSOP Package
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . 150
C/W
JC
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 27
C/W
Lead Temperature, Soldering (10 seconds) . . . . . . . . . 300
C
IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . 220
C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability. Only one absolute
maximum rating may be applied at any one time.
2
Overvoltages at EN, A0, A1, S, or D will be clamped by internal diodes. Current
should be limited to the maximum ratings given.
REV. 0
ADG604
6
TERMINOLOGY
V
DD
Most Positive Power Supply Potential
V
SS
Most Negative Power Supply in a Dual Supply Application. In single supply applications, this should be tied to
ground at the device.
GND
Ground (0 V) Reference
I
DD
Positive Supply Current
I
SS
Negative Supply Current
S
Source Terminal. May be an input or output.
D
Drain Terminal. May be an input or output.
R
ON
Ohmic Resistance between D and S
R
ON
On Resistance Match between any two channels, i.e., R
ON
Max R
ON
Min
R
FLAT(ON)
Flatness is defined as the difference between the maximum and minimum value of On resistance as measured
over the specified analog signal range.
I
S
(OFF)
Source Leakage Current with the Switch "OFF"
I
D
(OFF)
Drain Leakage Current with the Switch "OFF"
I
D
, I
S
(ON)
Channel Leakage Current with the Switch "ON"
V
D
, V
S
Analog Voltage on Terminals D, S
V
INL
Maximum Input Voltage for Logic "0"
V
INH
Minimum Input Voltage for Logic "1"
I
INL
(I
INH
)
Input Current of the Digital Input
C
S
(OFF)
Channel Input Capacitance for "OFF" Condition
C
D
(OFF)
Channel Output Capacitance for "OFF" Condition
C
D
, C
S
(ON)
"On" Switch Capacitance
C
IN
Digital Input Capacitance
t
ON
(EN)
Delay time between the 50% and 90% points of the digital input and switch "ON" condition.
t
OFF
(EN)
Delay time between the 50% and 90% points of the digital input and switch "OFF" condition.
t
TRANSITION
Delay time between the 50% and 90% points of the digital input and switch "ON" condition when switching
from one address state to another.
t
BBM
"OFF" time or "ON" time measured between the 80% points of both switches, when switching from one address
state to another.
Charge Injection
A measure of the glitch impulse transferred from the digital input to the analog output during switching.
Crosstalk
A measure of unwanted signal that is coupled through from one channel to another as a result of parasitic capacitance.
Off Isolation
A measure of unwanted signal coupling through an "On" switch.
Bandwidth
Frequency Response of the "On" Switch
Insertion Loss
Loss Due to the On Resistance of the Switch
REV. 0
ADG604
7
0
50
100
150
200
250
V
D
, V
S
V
5
ON RESIST
ANCE
T
A
= 25 C
4
3
2
1
0
1
2
3
4
5
V
DD
, V
SS
= 2.5V
V
DD
, V
SS
= 3V
V
DD
, V
SS
= 3.3V
V
DD
, V
SS
= 4.5V
V
DD
, V
SS
= 5V
TPC 1. On Resistance vs. V
D
(V
S
), Dual Supply
0
50
100
150
200
250
300
350
400
500
V
D
, V
S
V
0.0
ON RESIST
ANCE
T
A
= 25 C
V
SS
= 0V
450
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
V
DD
= 2.7V
V
DD
= 3V
V
DD
= 3.3V
V
DD
= 4.5V
V
DD
= 5V
TPC 2. On Resistance vs. V
D
(V
S
), Single Supply
0
20
40
60
80
100
120
140
180
V
D
, V
S
V
5
ON RESIST
ANCE
160
4
3
2
1
0
1
2
3
4
5
T
A
= +125 C
V
DD
= +5V
V
SS
= 5V
T
A
= 40 C
T
A
= +25 C
T
A
= +85 C
TPC 3. On Resistance vs. V
D
(V
S
) for Different
Temperatures, Dual Supply
0
50
100
150
200
250
300
350
V
D
, V
S
V
0.0
ON RESIST
ANCE
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
T
A
= +125 C
V
DD
= 5V
V
SS
= 0V
T
A
= 40 C
T
A
= +25 C
T
A
= +85 C
TPC 4. On Resistance vs. V
D
(V
S
) for Different
Temperatures, Single Supply
6
5
4
3
2
1
1
3
TEMPERATURE C
0
CURRENT
nA
V
DD
= +5V
V
SS
= 5V
20
40
60
80
100
120
0
2
I
S
(OFF)
I
D
(OFF)
I
D
, I
S
(ON)
TPC 5. Leakage Currents vs. Temperature, Dual Supply
6
5
4
3
2
1
1
3
TEMPERATURE C
0
CURRENT
nA
V
DD
= 5V
V
SS
= 0V
20
40
60
80
100
120
0
2
I
S
(OFF)
I
D
(OFF)
I
D
, I
S
(ON)
TPC 6. Leakage Currents vs. Temperature, Single Supply
Typical Performance Characteristics
REV. 0
ADG604
8
V
DD
= 3V
V
SS
= 0V
2.0
1.5
1.0
0
0.5
1.0
V
S
V
5
CHARGE INJECTION
pC
T
A
= 25 C
4
3
2
1
0
1
2
3
4
5
V
DD
= +5V
V
SS
= 5V
V
DD
= +5V
V
SS
= 0V
0.5
TPC 7. Charge Injection vs. Source Voltage
0
20
40
80
120
160
TEMPERATURE C
40
TIME
ns
20
0
20
40
60
80
100
120
60
140
100
V
DD
= 5V
V
SS
= 0V
V
DD
= +5V
V
SS
= 5V
V
DD
= +5V
V
SS
= 5V
t
ON
t
OFF
V
DD
= 5V
V
SS
= 0V
TPC 8. t
ON
/t
OFF
Times vs. Temperature
90
80
70
60
50
40
20
0
FREQUENCY MHz
0.3
A
TTENU
A
TION
dB
1
10
100
1000
30
10
T
A
= 25 C
V
DD
= +5V
V
SS
= 0V
V
DD
= +5V
V
SS
= 5V
TPC 9. Off Isolation vs. Frequency
90
80
70
60
50
40
20
0
FREQUENCY MHz
0.3
A
TTENU
A
TION
dB
1
10
100
1000
30
10
T
A
= 25 C
V
DD
= +5V
V
SS
= 0V
V
DD
= +5V
V
SS
= 5V
TPC 10. Crosstalk vs. Frequency
18
16
14
12
10
8
4
0
FREQUENCY MHz
0.3
A
TTENU
A
TION
dB
1
10
100
1000
6
2
T
A
= 25 C
V
DD
= +5V
V
SS
= 0V
V
DD
= +5V
V
SS
= 5V
TPC 11. On Response vs. Frequency
REV. 0
9
ADG604
Test Circuits
I
DS
V1
S
D
R
ON
= V1/I
DS
V
S
Test Circuit 1. On Resistance
S
D
V
S
A
A
V
D
I
S
(OFF)
I
D
(OFF)
Test Circuit 2. Off Leakage
S
D
A
V
D
I
D
(ON)
NC
Test Circuit 3. On Leakage
V
S
V
DD
V
DD
EN
A0
A1
+2.4V
0.1 F
S1
V
SS
GND
D
V
SS
V
S1
V
OUT
R
L
300
C
L
35pF
S2
0.1 F
50%
50%
90%
90%
ADDRESS
DRIVE (V
IN
)
V
OUT
t
TRANSITION
0V
3V
t
TRANSITION
S3
S4
V
S2
Test Circuit 4. Switching Time of Multiplexer, t
TRANSITION
t
BBM
80%
80%
ADDRESS
DRIVE (V
IN
)
V
OUT
0V
3V
V
S
V
DD
V
DD
EN
A0
A1
+2.4V
0.1 F
S1
V
SS
GND
D
V
SS
V
S
V
OUT
R
L
300
C
L
35pF
S2
0.1 F
S3
S4
50
Test Circuit 5. Break-Before-Make Delay, t
BBM
V
DD
V
DD
EN
A1
A0
0.1 F
S1
V
SS
GND
D
V
SS
V
S
V
OUT
R
L
300
C
L
35pF
S2
0.1 F
V
S
50
S3
S4
50%
50%
0.9V
0
0.9V
0
ENABLE
DRIVE (V
IN
)
OUTPUT
t
ON
(EN)
0V
3V
t
OFF
(EN)
V
0
0V
Test Circuit 6. Enable Delay, t
ON
(EN), t
OFF
(EN)
REV. 0
ADG604
10
S
D
V
DD
V
S
GND
C
L
1nF
V
OUT
R
S
V
DD
SW ON
V
IN
SW OFF
V
OUT
Q
INJ
= C
L
V
OUT
V
OUT
V
SS
V
SS
SW ON
V
IN
SW OFF
SW ON
SW OFF
SW OFF
CHARGE INJECTION =
V
OUT
C
L
DECODER
A2
A1
EN
Test Circuit 7. Charge Injection
V
S
V
OUT
50
NETWORK
ANALYZER
GND
V
DD
S
D
50
OFF
ISOLATION
=
20
LOG
V
OUT
V
S
0.1 F
0.1 F
V
SS
V
DD
V
SS
R
L
50
Test Circuit 8. Off Isolation
V
S
V
OUT
50
NETWORK
ANALYZER
GND
V
DD
S
D
INSERTION LOSS = 20 LOG
V
OUT
WITH SWITCH
V
OUT
WITHOUT SWITCH
0.1 F
0.1 F
V
SS
V
DD
V
SS
R
L
50
Test Circuit 9. Bandwidth
GND
V
DD
D
CHANNEL-TO-CHANNEL CROSSTALK = 20 LOG
V
OUT
V
S
0.1 F
0.1 F
V
SS
V
DD
V
SS
R
L
50
NETWORK
ANALYZER
V
OUT
V
S
50
S1
S2
R
50
Test Circuit 10. Channel-to-Channel Crosstalk
REV. 0
ADG604
11
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
14-Lead TSSOP Package
(RU-14)
14
8
7
1
0.256 (6.50)
0.246 (6.25)
0.177 (4.50)
0.169 (4.30)
PIN 1
0.201 (5.10)
0.193 (4.90)
SEATING
PLANE
0.006 (0.15)
0.002 (0.05)
0.0118 (0.30)
0.0075 (0.19)
0.0256
(0.65)
BSC
0.0433 (1.10)
MAX
0.0079 (0.20)
0.0035 (0.090)
0.028 (0.70)
0.020 (0.50)
8
0
12
C0275202/02(0)
PRINTED IN U.S.A.
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