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Электронный компонент: AM29LV320DB90R

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July 2003
The following document specifies Spansion memory products that are now offered by both Advanced
Micro Devices and Fujitsu. Although the document is marked with the name of the company that orig-
inally developed the specification, these products will be offered to customers of both AMD and
Fujitsu.
Continuity of Specifications
There is no change to this datasheet as a result of offering the device as a Spansion product. Any
changes that have been made are the result of normal datasheet improvement and are noted in the
document revision summary, where supported. Future routine revisions will occur when appropriate,
and changes will be noted in a revision summary.
Continuity of Ordering Part Numbers
AMD and Fujitsu continue to support existing part numbers beginning with "Am" and "MBM". To order
these products, please use only the Ordering Part Numbers listed in this document.
For More Information
Please contact your local AMD or Fujitsu sales office for additional information about Spansion
memory solutions.
Am29LV320D
Data Sheet
Publication Number 23579 Revision C Amendment +6 Issue Date November 15, 2004
THIS PAGE LEFT INTENTIONALLY BLANK.
Publication# 23579
Rev: C Amendment/+6
Issue Date: November 15, 2004
Am29LV320D
32 Megabit (4 M x 8-Bit/2 M x 16-Bit)
CMOS 3.0 Volt-only, Boot Sector Flash Memory
DISTINCTIVE CHARACTERISTICS
ARCHITECTURAL ADVANTAGES
Secured Silicon (SecSi
TM
Sector)
-- 64 Kbyte Sector Size; Replacement/substitute
devices (such as Mirrorbit
TM
) have 256 bytes.
-- Factory locked and identifiable: 16 bytes (8
words) available for secure, random factory
Electronic Serial Number; verifiable as factory
locked through autoselect function.
ExpressFlash option allows entire sector to be
available for factory-secured data
-- Customer lockable: Can be programmed once
and then permanently locked after being
shipped from AMD
Zero Power Operation
-- Sophisticated power management circuits
reduce power consumed during inactive
periods to nearly zero.
Package options
-- 48-pin TSOP
-- 48-ball FBGA
Sector Architecture
-- Eight 8 Kbyte sectors
-- Sixty-three 64 Kbyte sectors
Top or bottom boot block
Manufactured on 0.23 m process
technology
Compatible with JEDEC standards
-- Pinout and software compatible with
single-power-supply flash standard
PERFORMANCE CHARACTERISTICS
High performance
-- Access time as fast 90 ns
-- Program time: 7s/word typical utilizing
Accelerate function
Ultra low power consumption (typical
values)
-- 2 mA active read current at 1 MHz
-- 10 mA active read current at 5 MHz
-- 200 nA in standby or automatic sleep mode
Minimum 1 million erase cycles guaranteed
per sector
20 Year data retention at 125C
-- Reliable operation for the life of the system
SOFTWARE FEATURES
Supports Common Flash Memory Interface
(CFI)
Erase Suspend/Erase Resume
-- Suspends erase operations to allow
programming in non-suspended sectors
Data# Polling and Toggle Bits
-- Provides a software method of detecting the
status of program or erase cycles
Unlock Bypass Program command
-- Reduces overall programming time when
issuing multiple program command sequences
HARDWARE FEATURES
Any combination of sectors can be erased
Ready/Busy# output (RY/BY#)
-- Hardware method for detecting program or
erase cycle completion
Hardware reset pin (RESET#)
-- Hardware method of resetting the internal
state machine to the read mode
WP#/ACC input pin
-- Write protect (WP#) function allows protection
of two outermost boot sectors, regardless of
sector protect status
-- Acceleration (ACC) function provides
accelerated program times
Sector protection
-- Hardware method of locking a sector, either
in-system or using programming equipment,
to prevent any program or erase operation
within that sector
-- Temporary Sector Unprotect allows changing
data in protected sectors in-system
4
Am29LV320D
November 15, 2004
GENERAL DESCRIPTION
T he A m 2 9 LV 3 2 0 D i s a 3 2 m e g a b i t, 3 . 0
volt-only flash memory device, organized as
2,097,152 words of 16 bits each or 4,194,304
bytes of 8 bits each. Word mode data appears
on DQ0DQ15; byte mode data appears on
DQ0DQ7. The device is designed to be pro-
grammed in-system with the standard 3.0 volt
V
CC
supply, and can also be programmed in
standard EPROM programmers.
The device is available with an access time of
90 or 120 ns. The devices are offered in 48-pin
TSOP and 48-ball FBGA packages. Standard
control pins--chip enable (CE#), write enable
(WE#), and output enable (OE#)--control nor-
mal read and write operations, and avoid bus
contention issues.
The device requires only a single 3.0 volt
power supply for both read and write func-
tions. Internally generated and regulated volt-
ages are provided for the program and erase
operations.
Am29LV320D Features
The SecSi
TM
Sector (Secured Silicon) is an
extra sector capable of being permanently
locked by AMD or customers. The SecSi Indi-
cator Bit (DQ7) is permanently set to a 1 if the
part is factory locked, and set to a 0 if cus-
tomer lockable. This way, customer lockable
parts can never be used to replace a factory
locked part. Note that the Am29LV320D has
a SecSi Sector size of 64 Kbytes. AMD de-
vices designated as replacements or sub-
stitutes, such as the Am29LV320M, have
256 bytes. This should be considered dur-
ing system design.
Factory locked parts provide several options.
The SecSi Sector may store a secure, random
16 byte ESN (Electronic Serial Number), cus-
tomer code (programmed through AMD's Ex-
p r e ssF l a sh s e rv ic e), or bo th . C us to m er
Lockable parts may utilize the SecSi Sector as
bonus space, reading and writing like any other
flash sector, or may permanently lock their own
code there.
The device offers complete compatibility with
the JEDEC single-power-supply Flash com-
mand set standard. Commands are written to
the command register using standard micro-
processor write timings. Reading data out of
the device is similar to reading from other Flash
or EPROM devices.
The host system can detect whether a program
or erase operation is complete by using the de-
vice status bits: RY/BY# pin, DQ7 (Data# Poll-
ing) and DQ6/DQ2 (toggle bits). After a
program or erase cycle is completed, the device
automatically returns to the read mode.
The sector erase architecture allows mem-
ory sectors to be erased and reprogrammed
without affecting the data contents of other
sectors. The device is fully erased when
shipped from the factory.
Hardware data protection measures include
a low V
CC
detector that automatically inhibits
write operations during power transitions. The
hardware sector protection feature disables
both program and erase operations in any com-
bination of the sectors of memory. This can be
achieved in-system or via programming equip-
ment.
The device offers two power-saving features.
When addresses are stable for a specified
amount of time, the device enters the auto-
matic sleep mode. The system can also place
the device into the standby mode. Power con-
sumption is greatly reduced in both modes.
November 15, 2004
Am29LV320D
5
TABLE OF CONTENTS
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 6
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . 7
Special Package Handling Instructions .................................... 8
Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Ordering Information . . . . . . . . . . . . . . . . . . . . . . 10
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . 11
Table 1. Am29LV320D Device Bus Operations ..............................11
Word/Byte Configuration ........................................................ 11
Requirements for Reading Array Data ................................... 11
Writing Commands/Command Sequences ............................ 12
Accelerated Program Operation .......................................... 12
Autoselect Functions ........................................................... 12
Standby Mode ........................................................................ 12
Automatic Sleep Mode ........................................................... 13
RESET#: Hardware Reset Pin ............................................... 13
Output Disable Mode .............................................................. 13
Table 2. Top Boot Sector Addresses (Am29LV320DT) ..................13
Table 3. Top Boot SecSi
TM
Sector Addresses................................ 14
Table 4. Bottom Boot Sector Addresses (Am29LV320DB) .............15
Table 5. Bottom Boot SecSi
TM
Sector Addresses .......................... 16
Autoselect Mode ..................................................................... 16
Table 6. Autoselect Codes (High Voltage Method) ........................16
Sector/Sector Block Protection and Unprotection .................. 17
Table 7. Top Boot Sector/Sector Block Addresses
for Protection/Unprotection .............................................................17
Table 8. Bottom Boot Sector/Sector Block
Addresses for Protection/Unprotection ...........................................17
Write Protect (WP#) ................................................................ 18
Temporary Sector Unprotect .................................................. 18
Figure 1. Temporary Sector Unprotect Operation........................... 18
Figure 2. In-System Sector Protect/Unprotect Algorithms .............. 19
SecSi
TM
Sector (Secured Silicon) Flash Memory Region ....... 20
Factory Locked: SecSi Sector Programmed
and Protected at the Factory ............................................... 20
Customer Lockable: SecSi Sector NOT Programmed
or Protected at the Factory .................................................. 20
Figure 3. SecSi Sector Protect Verify.............................................. 21
Hardware Data Protection ...................................................... 21
Low VCC Write Inhibit ......................................................... 21
Write Pulse "Glitch" Protection ............................................ 21
Logical Inhibit ...................................................................... 21
Power-Up Write Inhibit ......................................................... 21
Common Flash Memory Interface (CFI) . . . . . . . 21
Table 9. CFI Query Identification String .......................................... 22
Table 10. System Interface String................................................... 22
Table 11. Device Geometry Definition ............................................ 23
Table 12. Primary Vendor-Specific Extended Query ...................... 24
Command Definitions . . . . . . . . . . . . . . . . . . . . . . 25
Reading Array Data ................................................................ 25
Reset Command ..................................................................... 25
Autoselect Command Sequence ............................................ 25
Table 13. Autoselect Codes ............................................................25
Enter SecSi
TM
Sector/Exit SecSi Sector
Command Sequence .............................................................. 26
Byte/Word Program Command Sequence ............................. 26
Unlock Bypass Command Sequence .................................. 26
Figure 4. Program Operation ......................................................... 27
Chip Erase Command Sequence ........................................... 27
Sector Erase Command Sequence ........................................ 27
Erase Suspend/Erase Resume Commands ........................... 28
Figure 5. Erase Operation.............................................................. 28
Command Definitions ............................................................. 29
Table 14. Am29LV320D Command Definitions ............................. 29
Write Operation Status . . . . . . . . . . . . . . . . . . . . 30
DQ7: Data# Polling ................................................................. 30
Figure 6. Data# Polling Algorithm .................................................. 30
RY/BY#: Ready/Busy# ............................................................ 31
DQ6: Toggle Bit I .................................................................... 31
Figure 7. Toggle Bit Algorithm........................................................ 31
DQ2: Toggle Bit II ................................................................... 32
Reading Toggle Bits DQ6/DQ2 ............................................... 32
DQ5: Exceeded Timing Limits ................................................ 32
DQ3: Sector Erase Timer ....................................................... 32
Table 15. Write Operation Status ................................................... 33
Absolute Maximum Ratings . . . . . . . . . . . . . . . . 34
Figure 8. Maximum Negative Overshoot Waveform ...................... 34
Figure 9. Maximum Positive Overshoot Waveform........................ 34
Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . 34
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 35
Figure 10. I
CC1
Current vs. Time (Showing Active and
Automatic Sleep Currents) ............................................................. 36
Figure 11. Typical I
CC1
vs. Frequency ............................................ 36
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 12. Test Setup.................................................................... 37
Table 16. Test Specifications ......................................................... 37
Figure 13. Input Waveforms and Measurement Levels ................. 37
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 38
Figure 14. Read Operation Timings ............................................... 38
Figure 15. Reset Timings ............................................................... 39
Word/Byte Configuration (BYTE#) ............................................. 40
Figure 16. BYTE# Timings for Read Operations............................ 40
Figure 17. BYTE# Timings for Write Operations............................ 40
Erase and Program Operations ................................................. 41
Figure 18. Program Operation Timings.......................................... 42
Figure 19. Chip/Sector Erase Operation Timings .......................... 43
Figure 20. Data# Polling Timings (During Embedded Algorithms). 44
Figure 21. Toggle Bit Timings (During Embedded Algorithms)...... 45
Figure 22. DQ2 vs. DQ6................................................................. 45
Temporary Sector Unprotect ..................................................... 46
Figure 23. Temporary Sector Unprotect Timing Diagram .............. 46
Figure 24. Accelerated Program Timing Diagram .......................... 46
Figure 25. Sector/Sector Block Protect and
Unprotect Timing Diagram ............................................................. 47
Alternate CE# Controlled Erase and Program Operations ........ 48
Figure 26. Alternate CE# Controlled Write
(Erase/Program) Operation Timings .............................................. 49
Erase And Programming Performance . . . . . . . 50
Latchup Characteristics . . . . . . . . . . . . . . . . . . . 50
TSOP and BGA Package Capacitance . . . . . . . . 50
Data Retention . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 51
FBD048--48-ball Fine-Pitch Ball Grid Array (FBGA)
6 x 12 mm package ................................................................... 51
TS 048--48-Pin Standard TSOP ............................................... 52
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 53
6
Am29LV320D
November 15, 2004
PRODUCT SELECTOR GUIDE
BLOCK DIAGRAM
Family Part Number
Am29LV320D
Speed Option
Standard Voltage Range: V
CC
= 2.73.6 V
90R Standard Voltage Range: V
CC
= 3.03.6 V
90
120
Max Access Time (ns)
90
120
CE# Access (ns)
90
120
OE# Access (ns)
40
50
Input/Output
Buffers
X-Decoder
Y-Decoder
Chip Enable
Output Enable
Logic
Erase Voltage
Generator
PGM Voltage
Generator
Timer
V
CC
Detector
State
Control
Command
Register
V
CC
V
SS
WE#
BYTE#
CE#
OE#
STB
STB
DQ0DQ15 (A-1)
Sector Switches
RY/BY#
RESET#
Data
Latch
Y-Gating
Cell Matrix
Add
r
e
s
s
Lat
c
h
A0A20
November 15, 2004
Am29LV320D
7
CONNECTION DIAGRAMS
1
16
2
3
4
5
6
7
8
17
18
19
20
21
22
23
24
9
10
11
12
13
14
15
48
33
47
46
45
44
43
42
41
40
39
38
37
36
35
34
25
32
31
30
29
28
27
26
A15
A18
A14
A13
A12
A11
A10
A9
A8
A19
A20
WE#
RESET#
NC
WP#/ACC
RY/BY#
A1
A17
A7
A6
A5
A4
A3
A2
A16
DQ2
BYTE#
V
SS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ9
DQ1
DQ8
DQ0
OE#
V
SS
CE#
A0
DQ5
DQ12
DQ4
V
CC
DQ11
DQ3
DQ10
48-Pin Standard
TSOP
8
Am29LV320D
November 15, 2004
CONNECTION DIAGRAMS
Special Package Handling Instructions
Special handling is required for Flash Memory
products in molded (TSOP, BGA) packages.
The package and/or data integrity may be com-
promised if the package body is exposed to
temperatures above 150
C for prolonged peri-
ods of time.
A1
B1
C1
D1
E1
F1
G1
H1
A2
B2
C2
D2
E2
F2
G2
H2
A3
B3
C3
D3
E3
F3
G3
H3
A4
B4
C4
D4
E4
F4
G4
H4
A5
B5
C5
D5
E5
F5
G5
H5
A6
B6
C6
D6
E6
F6
G6
H6
DQ15/A-1
V
SS
BYTE#
A16
A15
A14
A12
A13
DQ13
DQ6
DQ14
DQ7
A11
A10
A8
A9
V
CC
DQ4
DQ12
DQ5
A19
NC
RESET#
WE#
DQ11
DQ3
DQ10
DQ2
A20
A18
WP#/ACC
RY/BY#
DQ9
DQ1
DQ8
DQ0
A5
A6
A17
A7
OE#
V
SS
CE#
A0
A1
A2
A4
A3
48-Ball FBGA
Top View, Balls Facing Down
November 15, 2004
Am29LV320D
9
PIN DESCRIPTION
A0A20
= 21 Addresses
DQ0DQ14 = 15 Data Inputs/Outputs
DQ15/A-1 = DQ15 (Data Input/Output, word
mode), A-1 (LSB Address Input,
byte mode)
CE#
= Chip Enable
OE#
= Output Enable
WE#
= Write Enable
WP#/ACC = Hardware Write Protect/
Acceleration Pin
RESET#
= Hardware Reset Pin, Active Low
BYTE#
= Selects 8-bit or 16-bit mode
RY/BY#
= Ready/Busy Output
V
CC
= 3.0 volt-only single power supply
(see Product Selector Guide for
speed
options and voltage supply toler-
ances)
V
SS
= Device Ground
NC
= Pin Not Connected Internally
LOGIC SYMBOL
21
16 or 8
DQ0DQ15
(A-1)
A0A2
CE#
OE#
WE#
RESET#
BYTE#
RY/BY#
WP#/ACC
10
Am29LV320D
November 15, 2004
ORDERING INFORMATION
Standard Products
AMD standard products are available in several packages and operating ranges. The order number
(Valid Combination) is formed by a combination of the following:
Valid Combinations
Valid Combinations list configurations planned to be
supported in volume for this device. Consult the local
AMD sales office to confirm availability of specific
valid combinations and to check on newly released
combinations.
Am29LV32
0D
T
90
E
C
TEMPERATURE RANGE
I =
Industrial
(40
C to +85
C)
F =
Industrial
(40
C to +85
C) with Pb-free package
C = Commercial
(0
C to +70
C)
D = Commercial
(0
C to +70
C) with Pb-free package
V
= Automotive In-Cabin (-40
C to +105
C)
Y
= Automotive In-Cabin (-40
C to +105
C
) with Pb-free package
PACKAGE TYPE
E
= 48-Pin Thin Small Outline Package (TSOP)
Standard Pinout (TS 048)
WM
= 48-ball Fine-Pitch Ball Grid Array (FBGA)
0.80 mm pitch, 6 x 12 mm package (FBD048)
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T
= Top boot sector
B
= Bottom boot sector
DEVICE NUMBER/DESCRIPTION
Am29LV320D
32 Megabit (4 M x 8-Bit/2 M x 16-Bit) CMOS Boot Sector Flash Memory
3.0 Volt-only Read, Program and Erase
Valid Combinations for
TSOP Packages
Speed
(Ns)
V
CC
Range
AM29LV320DT90R,
AM29LV320DB90R
EC, EI,
ED, EF
90
3.0 3.6V
Am29LV320DT90,
Am29LV320DB90
90
2.7 3.6V
AM29LV320DT120,
AM29LV320DB120
120
2.7 3.6V
Am29LV320DT120
Am29LV320DB120
EV, EY
120
2.7 3,6V
Valid Combinations for FBGA Packages
Order Number
Package Marking
AM29LV320DT90,
AM29LV320DB90
WMC,W
MI,
WMD,
WMF
L320DT90V,
L320DB90V
C, I,
D, F
AM29LV320DT120,
AM29LV320DB120
L320DT12V,
L320DB12V
Am29LV320DT120
Am29LV320DB120
WNV
L320DT12V
L320DB12V
V, Y
November 15, 2004
Am29LV320D
11
DEVICE BUS OPERATIONS
This section describes the requirements and
use of the device bus operations, which are ini-
tiated through the internal command register.
The command register itself does not occupy
any addressable memory location. The register
is a latch used to store the commands, along
with the address and data information needed
to execute the command. The contents of the
register serve as inputs to the internal state
machine. The state machine outputs dictate the
function of the device.
Table 1
lists the device
bus operations, the inputs and control levels
they require, and the resulting output. The fol-
lowing subsections describe each of these oper-
ations in further detail.
Table 1. Am29LV320D Device Bus Operations
Legend: L = Logic Low = V
IL
, H = Logic High = V
IH
, V
ID
= 11.512.5 V, V
HH
= 11.512.5 V, X = Don't Care, SA
= Sector Address, A
IN
= Address In, D
IN
= Data In, D
OUT
= Data Out
Notes:
1. Addresses are A20:A0 in word mode (BYTE# = V
IH
), A20:A-1 in byte mode (BYTE# = V
IL
).
2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See
"Sector/Sector Block Protection and Unprotection" on page 17
.
3. If WP#/ACC = V
IL
, the two outermost boot sectors remain protected. If WP#/ACC = V
IH
, the two outermost boot
sector protection depends on whether they were last protected or unprotected using the method described in
"Sector/Sector Block Protection and Unprotection" on page 17
. If WP#/ACC = V
HH
, all sectors are unprotected.
4. D
IN
or D
OUT
as required by command sequence, data polling, or sector protection algorithm.
Word/Byte Configuration
The BYTE# pin controls whether the device
data I/O pins operate in the byte or word con-
figuration. If the BYTE# pin is set at logic `1',
the device is in word configuration, DQ0DQ15
are active and controlled by CE# and OE#.
If the BYTE# pin is set at logic `0', the device is
in byte configuration, and only data I/O pins
DQ0DQ7 are active and controlled by CE# and
O E # . T he d a ta I/ O p i n s D Q 8 D Q 1 4 a r e
tri-stated, and the DQ15 pin is used as an input
for the LSB (A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the sys-
tem must drive the CE# and OE# pins to V
IL
.
CE# is the power control and selects the de-
vice. OE# is the output control and gates array
data to the output pins. WE# should remain at
V
IH
. The BYTE# pin determines whether the de-
vice outputs array data in words or bytes.
Operation
CE# OE#
WE
#
RESET
#
WP#/AC
C
Addresses
(Note 2)
DQ0
DQ7
DQ8DQ15
BYTE
#
= V
IH
BYTE#
= V
IL
Read
L
L
H
H
L/H
A
IN
D
OUT
D
OUT
DQ8DQ14
= High-Z,
DQ15 = A-1
Write
L
H
L
H
(Note 3)
A
IN
(Note 4) (Note 4)
Accelerated Program
L
H
L
H
V
HH
A
IN
(Note 4) (Note 4)
Standby
V
CC
0.3 V
X
X
V
CC
0.3 V
H
X
High-Z
High-Z
High-Z
Output Disable
L
H
H
H
L/H
X
High-Z
High-Z
High-Z
Reset
X
X
X
L
L/H
X
High-Z
High-Z
High-Z
Sector Protect (Note 2)
L
H
L
V
ID
L/H
SA, A6 = L,
A1 = H, A0 = L
(Note 4)
X
X
Sector Unprotect
(Note 2)
L
H
L
V
ID
(Note 3)
SA, A6 = H,
A1 = H, A0 = L
(Note 4)
X
X
Temporary Sector
Unprotect
X
X
X
V
ID
(Note 3)
A
IN
(Note 4) (Note 4)
High-Z
12
Am29LV320D
November 15, 2004
The internal state machine is set for reading
array data upon device power-up, or after a
hardware reset. This ensures that no spurious
alteration of the memory content occurs during
the power transition. No command is necessary
in this mode to obtain array data. Standard mi-
croprocessor read cycles that assert valid ad-
dresses on the device address inputs produce
valid data on the device data outputs. The de-
vice remains enabled for read access until the
command register contents are altered.
See
"Requirements for Reading Array Data" on
page 11
for more information. Refer to the AC
Read-Only Operations table for timing specifi-
cations and to
Figure 14, on page 38
for the
timing diagram. I
CC1
in the DC Characteristics
table represents the active current specification
for reading array data.
Writing Commands/Command Sequences
To write a command or command sequence
(which includes programming data to the de-
vice and erasing sectors of memory), the sys-
tem must drive WE# and CE# to V
IL
, and OE#
to V
IH
.
For program operations, the BYTE# pin deter-
mines whether the device accepts program
data in bytes or words. Refer to
"Word/Byte
Configuration" on page 11
for more informa-
tion.
The device features an Unlock Bypass mode
to facilitate faster programming. Once the de-
vice enters the Unlock Bypass mode, only two
write cycles are required to program a word or
byte, instead of four. The
"Word/Byte Configu-
ration" on page 11
section contains details on
programming data to the device using both
standard and Unlock Bypass command se-
quences.
An erase operation can erase one sector, multi-
ple sectors, or the entire device.
Table 2, on
page 13
through
Table 5, on page 16
indicate
the address space that each sector occupies. A
"sector address" is the address bits required to
uniquely select a sector.
I
CC2
in the DC Characteristics table represents
the active current specification for the write
mode. The
"AC Characteristics" on page 38
sec-
tion contains timing specification tables and
timing diagrams for write operations.
Accelerated Program Operation
The device offers accelerated program opera-
tions through the ACC function. This is one of
two functions provided by the WP#/ACC pin.
This function is primarily intended to allow
faster manufacturing throughput at the factory.
If the system asserts V
HH
on this pin, the device
automatically enters the aforementioned Un-
lock Bypass mode, temporarily unprotects any
protected sectors, and uses the higher voltage
on the pin to reduce the time required for pro-
gram operations. The system would use a
two-cycle program command sequence as re-
quired by the Unlock Bypass mode. Removing
V
HH
from the WP#/ACC pin returns the device
to normal operation. Note that the WP#/ACC
pin must not be at V
HH
for operations other
than accelerated programming, or device dam-
age may result. In addition, the WP#/ACC pin
must not be left floating or unconnected; incon-
sistent behavior of the device may result.
Autoselect Functions
If the system writes the autoselect command
sequence, the device enters the autoselect
mode. The system can then read autoselect
codes from the internal register (which is sepa-
rate from the memory array) on DQ7DQ0.
Standard read cycle timings apply in this mode.
Refer to the
"Autoselect Mode" on page 16
and
"Autoselect Command Sequence" on page 25
sections for more information.
I
CC6
and I
CC7
in the DC Characteristics table
r epresent the curr ent sp ecifications for
read-while-program and read-while-erase, re-
spectively.
Standby Mode
When the system is not reading or writing to
the device, it can place the device in the
standby mode. In this mode, current consump-
tion is greatly reduced, and the outputs are
placed in the high impedance state, indepen-
dent of the OE# input.
The device enters the CMOS standby mode
when the CE# and RESET# pins are both held
at V
CC
0.3 V. (Note that this is a more re-
stricted voltage range than V
IH
.) If CE# and RE-
SET# are held at V
IH
, but not within V
CC
0.3
V, the device is in the standby mode, but the
standby current is greater. The device requires
standard access time (t
CE
) for read access when
the device is in either of these standby modes,
before it is ready to read data.
If the device is deselected during erasure or
programming, the device draws active current
until the operation is completed.
I
CC3
in the DC Characteristics table represents
the standby current specification.
November 15, 2004
Am29LV320D
13
Automatic Sleep Mode
The automatic sleep mode minimizes Flash de-
vice energy consumption. The device automati-
cally enables this mode when addresses remain
stable for t
ACC
+ 30 ns. The automatic sleep
mode is independent of the CE#, WE#, and
OE# control signals. Standard address access
timings provide new data when addresses are
changed. While in sleep mode, output data is
latched and always available to the system. I
CC4
in the
"DC Characteristics" on page 35
table
represents the automatic sleep mode current
specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method
of resetting the device to reading array data.
When the RESET# pin is driven low for at least
a period of t
RP
, the device immediately termi-
nates any operation in progress, tristates all
output pins, and ignores all read/write com-
mands for the duration of the RESET# pulse.
The device also resets the internal state ma-
chine to reading array data. The operation that
was interrupted should be reinitiated once the
device is ready to accept another command se-
quence, to ensure data integrity.
Current is reduced for the duration of the RE-
SET# pulse. When RESET# is held at V
SS
0.3
V, the device draws CMOS standby current
(I
CC4
). If RESET# is held at V
IL
but not within
V
SS
0.3 V, the standby current is greater.
The RESET# pin may be tied to the system
reset circuitry. A system reset would thus also
reset the Flash memory, enabling the system to
read the boot-up firmware from the Flash
memory.
If RESET# is asserted during a program or
erase operation, the RY/BY# pin remains a "0"
(busy) until the internal reset operation is com-
plete, which requires a time of t
READY
(during
Embedded Algorithms). The system can thus
monitor RY/BY# to determine whether the
reset operation is complete. If RESET# is as-
serted when a program or erase operation is
not executing (RY/BY# pin is "1"), the reset op-
eration is completed within a time of t
READY
(not
during Embedded Algorithms). The system can
read data t
RH
after the RESET# pin returns to
V
IH
.
Refer to the AC Characteristics tables for RE-
SET# parameters and to
Figure 15, on page 39
for the timing diagram.
Output Disable Mode
When the OE# input is at V
IH
, output from the
device is disabled. The output pins are placed in
the high impedance state.
Table 2. Top Boot Sector Addresses (Am29LV320DT) (Sheet 1 of 2)
Sector
Sector Address
A20A12
Sector Size
(Kbytes/Kwords)
(x8)
Address Range
(x16)
Address Range
SA0
000000xxx
64/32
000000h00FFFFh
000000h07FFFh
SA1
000001xxx
64/32
010000h01FFFFh
008000h0FFFFh
SA2
000010xxx
64/32
020000h02FFFFh
010000h17FFFh
SA3
000011xxx
64/32
030000h03FFFFh
018000h01FFFFh
SA4
000100xxx
64/32
040000h04FFFFh
020000h027FFFh
SA5
000101xxx
64/32
050000h05FFFFh
028000h02FFFFh
SA6
000110xxx
64/32
060000h06FFFFh
030000h037FFFh
SA7
000111xxx
64/32
070000h07FFFFh
038000h03FFFFh
SA8
001000xxx
64/32
080000h08FFFFh
040000h047FFFh
SA9
001001xxx
64/32
090000h09FFFFh
048000h04FFFFh
SA10
001010xxx
64/32
0A0000h0AFFFFh
050000h057FFFh
SA11
001011xxx
64/32
0B0000h0BFFFFh
058000h05FFFFh
SA12
001100xxx
64/32
0C0000h0CFFFFh
060000h067FFFh
SA13
001101xxx
64/32
0D0000h0DFFFFh
068000h06FFFFh
SA14
001110xxx
64/32
0E0000h0EFFFFh
070000h077FFFh
SA15
001111xxx
64/32
0F0000h0FFFFFh
078000h07FFFFh
SA16
010000xxx
64/32
100000h10FFFFh
080000h087FFFh
SA17
010001xxx
64/32
110000h11FFFFh
088000h08FFFFh
SA18
010010xxx
64/32
120000h12FFFFh
090000h097FFFh
14
Am29LV320D
November 15, 2004
Note: The address range is A20:A-1 in byte mode (BYTE#=V
IL
) or A20:A0 in word mode (BYTE#=V
IH
).
Table 3. Top Boot SecSi
TM
Sector Addresses
SA19
010011xxx
64/32
130000h13FFFFh
098000h09FFFFh
SA20
010100xxx
64/32
140000h14FFFFh
0A0000h0A7FFFh
SA21
010101xxx
64/32
150000h15FFFFh
0A8000h0AFFFFh
SA22
010110xxx
64/32
160000h16FFFFh
0B0000h0B7FFFh
SA23
010111xxx
64/32
170000h17FFFFh
0B8000h0BFFFFh
SA24
011000xxx
64/32
180000h18FFFFh
0C0000h0C7FFFh
SA25
011001xxx
64/32
190000h19FFFFh
0C8000h0CFFFFh
SA26
011010xxx
64/32
1A0000h1AFFFFh
0D0000h0D7FFFh
SA27
011011xxx
64/32
1B0000h1BFFFFh
0D8000h0DFFFFh
SA28
011100xxx
64/32
1C0000h1CFFFFh
0E0000h0E7FFFh
SA29
011101xxx
64/32
1D0000h1DFFFFh
0E8000h0EFFFFh
SA30
011110xxx
64/32
1E0000h1EFFFFh
0F0000h0F7FFFh
SA31
011111xxx
64/32
1F0000h1FFFFFh
0F8000h0FFFFFh
SA32
100000xxx
64/32
200000h20FFFFh
100000h107FFFh
SA33
100001xxx
64/32
210000h21FFFFh
108000h10FFFFh
SA34
100010xxx
64/32
220000h22FFFFh
110000h117FFFh
SA35
100011xxx
64/32
230000h23FFFFh
118000h11FFFFh
SA36
100100xxx
64/32
240000h24FFFFh
120000h127FFFh
SA37
100101xxx
64/32
250000h25FFFFh
128000h12FFFFh
SA38
100110xxx
64/32
260000h26FFFFh
130000h137FFFh
SA39
100111xxx
64/32
270000h27FFFFh
138000h13FFFFh
SA40
101000xxx
64/32
280000h28FFFFh
140000h147FFFh
SA41
101001xxx
64/32
290000h29FFFFh
148000h14FFFFh
SA42
101010xxx
64/32
2A0000h2AFFFFh
150000h157FFFh
SA43
101011xxx
64/32
2B0000h2BFFFFh
158000h15FFFFh
SA44
101100xxx
64/32
2C0000h2CFFFFh
160000h167FFFh
SA45
101101xxx
64/32
2D0000h2DFFFFh
168000h16FFFFh
SA46
101110xxx
64/32
2E0000h2EFFFFh
170000h177FFFh
SA47
101111xxx
64/32
2F0000h2FFFFFh
178000h17FFFFh
SA48
110000xxx
64/32
300000h30FFFFh
180000h187FFFh
SA49
110001xxx
64/32
310000h31FFFFh
188000h18FFFFh
SA50
110010xxx
64/32
320000h32FFFFh
190000h197FFFh
SA51
110011xxx
64/32
330000h33FFFFh
198000h19FFFFh
SA52
110100xxx
64/32
340000h34FFFFh
1A0000h1A7FFFh
SA53
110101xxx
64/32
350000h35FFFFh
1A8000h1AFFFFh
SA54
110110xxx
64/32
360000h36FFFFh
1B0000h1B7FFFh
SA55
110111xxx
64/32
370000h37FFFFh
1B8000h1BFFFFh
SA56
111000xxx
64/32
380000h38FFFFh
1C0000h1C7FFFh
SA57
111001xxx
64/32
390000h39FFFFh
1C8000h1CFFFFh
SA58
111010xxx
64/32
3A0000h3AFFFFh
1D0000h1D7FFFh
SA59
111011xxx
64/32
3B0000h3BFFFFh
1D8000h1DFFFFh
SA60
111100xxx
64/32
3C0000h3CFFFFh
1E0000h1E7FFFh
SA61
111101xxx
64/32
3D0000h3DFFFFh
1E8000h1EFFFFh
SA62
111110xxx
64/32
3E0000h3EFFFFh
1F0000h1F7FFFh
SA63
111111000
8/4
3F0000h3F1FFFh
1F8000h1F8FFFh
SA64
111111001
8/4
3F2000h3F3FFFh
1F9000h1F9FFFh
SA65
111111010
8/4
3F4000h3F5FFFh
1FA000h1FAFFFh
SA66
111111011
8/4
3F6000h3F7FFFh
1FB000h1FBFFFh
SA67
111111100
8/4
3F8000h3F9FFFh
1FC000h1FCFFFh
SA68
111111101
8/4
3FA000h3FBFFFh
1FD000h1FDFFFh
SA69
111111110
8/4
3FC000h3FDFFFh
1FE000h1FEFFFh
SA70
111111111
8/4
3FE000h3FFFFFh
1FF000h1FFFFFh
Table 2. Top Boot Sector Addresses (Am29LV320DT) (Sheet 2 of 2)
Sector
Sector Address
A20A12
Sector Size
(Kbytes/Kwords)
(x8)
Address Range
(x16)
Address Range
Sector Address
A20A12
Sector Size
(Kbytes/Kwords)
(x8)
Address Range
(x16)
Address Range
111111xxx
64/32
3F0000h3FFFFFh
1F8000h1FFFFFh
November 15, 2004
Am29LV320D
15
Table 4. Bottom Boot Sector Addresses (Am29LV320DB) (Sheet 1 of 2)
Sector
Sector Address
A20A12
Sector Size
(Kbytes/Kwords)
(x8)
Address Range
(x16)
Address Range
SA0
000000000
8/4
000000h-001FFFh
000000h000FFFh
SA1
000000001
8/4
002000h-003FFFh
001000h001FFFh
SA2
000000010
8/4
004000h-005FFFh
002000h002FFFh
SA3
000000011
8/4
006000h-007FFFh
003000h003FFFh
SA4
000000100
8/4
008000h-009FFFh
004000h004FFFh
SA5
000000101
8/4
00A000h-00BFFFh
005000h005FFFh
SA6
000000110
8/4
00C000h-00DFFFh
006000h006FFFh
SA7
000000111
8/4
00E000h-00FFFFh
007000h007FFFh
SA8
000001xxx
64/32
010000h-01FFFFh
008000h00FFFFh
SA9
000010xxx
64/32
020000h-02FFFFh
010000h017FFFh
SA10
000011xxx
64/32
030000h-03FFFFh
018000h01FFFFh
SA11
000100xxx
64/32
040000h-04FFFFh
020000h027FFFh
SA12
000101xxx
64/32
050000h-05FFFFh
028000h02FFFFh
SA13
000110xxx
64/32
060000h-06FFFFh
030000h037FFFh
SA14
000111xxx
64/32
070000h-07FFFFh
038000h03FFFFh
SA15
001000xxx
64/32
080000h-08FFFFh
040000h047FFFh
SA16
001001xxx
64/32
090000h-09FFFFh
048000h04FFFFh
SA17
001010xxx
64/32
0A0000h-0AFFFFh
050000h057FFFh
SA18
001011xxx
64/32
0B0000h-0BFFFFh
058000h05FFFFh
SA19
001100xxx
64/32
0C0000h-0CFFFFh
060000h067FFFh
SA20
001101xxx
64/32
0D0000h-0DFFFFh
068000h06FFFFh
SA21
001110xxx
64/32
0E0000h-0EFFFFh
070000h077FFFh
SA22
001111xxx
64/32
0F0000h-0FFFFFh
078000h07FFFFh
SA23
010000xxx
64/32
100000h-10FFFFh
080000h087FFFh
SA24
010001xxx
64/32
110000h-11FFFFh
088000h08FFFFh
SA25
010010xxx
64/32
120000h-12FFFFh
090000h097FFFh
SA26
010011xxx
64/32
130000h-13FFFFh
098000h09FFFFh
SA27
010100xxx
64/32
140000h-14FFFFh
0A0000h0A7FFFh
SA28
010101xxx
64/32
150000h-15FFFFh
0A8000h0AFFFFh
SA29
010110xxx
64/32
160000h-16FFFFh
0B0000h0B7FFFh
SA30
010111xxx
64/32
170000h-17FFFFh
0B8000h0BFFFFh
SA31
011000xxx
64/32
180000h-18FFFFh
0C0000h0C7FFFh
SA32
011001xxx
64/32
190000h-19FFFFh
0C8000h0CFFFFh
SA33
011010xxx
64/32
1A0000h-1AFFFFh
0D0000h0D7FFFh
SA34
011011xxx
64/32
1B0000h-1BFFFFh
0D8000h0DFFFFh
SA35
011100xxx
64/32
1C0000h-1CFFFFh
0E0000h0E7FFFh
SA36
011101xxx
64/32
1D0000h-1DFFFFh
0E8000h0EFFFFh
SA37
011110xxx
64/32
1E0000h-1EFFFFh
0F0000h0F7FFFh
SA38
011111xxx
64/32
1F0000h-1FFFFFh
0F8000h0FFFFFh
SA39
100000xxx
64/32
200000h-20FFFFh
100000h107FFFh
SA40
100001xxx
64/32
210000h-21FFFFh
108000h10FFFFh
SA41
100010xxx
64/32
220000h-22FFFFh
110000h117FFFh
SA42
100011xxx
64/32
230000h-23FFFFh
118000h11FFFFh
SA43
100100xxx
64/32
240000h-24FFFFh
120000h127FFFh
SA44
100101xxx
64/32
250000h-25FFFFh
128000h12FFFFh
SA45
100110xxx
64/32
260000h-26FFFFh
130000h137FFFh
SA46
100111xxx
64/32
270000h-27FFFFh
138000h13FFFFh
SA47
101000xxx
64/32
280000h-28FFFFh
140000h147FFFh
SA48
101001xxx
64/32
290000h-29FFFFh
148000h14FFFFh
SA49
101010xxx
64/32
2A0000h-2AFFFFh
150000h157FFFh
SA50
101011xxx
64/32
2B0000h-2BFFFFh
158000h15FFFFh
SA51
101100xxx
64/32
2C0000h-2CFFFFh
160000h167FFFh
SA52
101101xxx
64/32
2D0000h-2DFFFFh
168000h16FFFFh
16
Am29LV320D
November 15, 2004
Note: The address range is A20:A-1 in byte mode (BYTE#=V
IL
) or A20:A0 in word mode (BYTE#=V
IH
).
Table 5. Bottom Boot SecSi
TM
Sector Addresses
Autoselect Mode
The autoselect mode provides manufacturer
and device identification, and sector protection
verification, through identifier codes output on
DQ7DQ0. This mode is primarily intended for
programming equipment to automatically
match a device to be programmed with its cor-
responding programming algorithm. However,
the autoselect codes can also be accessed
in-system through the command register.
When using programming equipment, the au-
toselect mode requires V
ID
(11.5 V to 12.5 V)
on address pin A9. Address pins A6, A1, and A0
must be as shown in
Table 6, on page 16
. In
addition, when verifying sector protection, the
sector address must appear on the appropriate
highest order address bits (see
Table 2, on
page 13
through
Table 5, on page 16
).
Table 6,
on page 16
shows the remaining address bits
that are don't care. When all necessary bits are
set as required, the programming equipment
may then read the corresponding identifier
code on DQ7DQ0.
To access the autoselect codes in-system, the
host system can issue the autoselect command
v i a t he c o m m a n d r e g is t e r, a s sh o w n in
Table 14, on page 29
. This method does not re-
quire V
ID
. Refer to the
"Autoselect Command
Sequence" on page 25
section for more infor-
mation.
Table 6. Autoselect Codes (High Voltage Method)
Legend: T = Top Boot Block, B = Bottom Boot Block, L = Logic Low = V
IL
, H = Logic High = V
IH
, SA = Sector
Address, X = Don't care.
SA53
101110xxx
64/32
2E0000h-2EFFFFh
170000h177FFFh
SA54
101111xxx
64/32
2F0000h-2FFFFFh
178000h17FFFFh
SA55
111000xxx
64/32
300000h-30FFFFh
180000h187FFFh
SA56
110001xxx
64/32
310000h-31FFFFh
188000h18FFFFh
SA57
110010xxx
64/32
320000h-32FFFFh
190000h197FFFh
SA58
110011xxx
64/32
330000h-33FFFFh
198000h19FFFFh
SA59
110100xxx
64/32
340000h-34FFFFh
1A0000h1A7FFFh
SA60
110101xxx
64/32
350000h-35FFFFh
1A8000h1AFFFFh
SA61
110110xxx
64/32
360000h-36FFFFh
1B0000h1B7FFFh
SA62
110111xxx
64/32
370000h-37FFFFh
1B8000h1BFFFFh
SA63
111000xxx
64/32
380000h-38FFFFh
1C0000h1C7FFFh
SA64
111001xxx
64/32
390000h-39FFFFh
1C8000h1CFFFFh
SA65
111010xxx
64/32
3A0000h-3AFFFFh
1D0000h1D7FFFh
SA66
111011xxx
64/32
3B0000h-3BFFFFh
1D8000h1DFFFFh
SA67
111100xxx
64/32
3C0000h-3CFFFFh
1E0000h1E7FFFh
SA68
111101xxx
64/32
3D0000h-3DFFFFh
1E8000h1EFFFFh
SA69
111110xxx
64/32
3E0000h-3EFFFFh
1F0000h1F7FFFh
SA70
111111xxx
64/32
3F0000h-3FFFFFh
1F8000h1FFFFFh
Sector Address
A20A12
Sector Size
(Kbytes/Kwords)
(x8)
Address Range
(x16)
Address Range
000000xxx
64/32
000000h-00FFFFh
00000h-07FFFh
Table 4. Bottom Boot Sector Addresses (Am29LV320DB) (Sheet 2 of 2)
Sector
Sector Address
A20A12
Sector Size
(Kbytes/Kwords)
(x8)
Address Range
(x16)
Address Range
Description
CE# OE# WE#
A20
to
A12
A11
to
A10
A9
A8
to
A7
A6
A5
to
A2
A1
A0
DQ8 to DQ15
DQ7
to
DQ0
BYTE#
= V
IH
BYTE#
= V
IL
Manufacturer ID: AMD
L
L
H
X
X
V
ID
X
L
X
L
L
X
X
01h
Device ID: Am29LV320D
L
L
H
X
X
V
ID
X
L
X
L
H
22h
X
F6 (T), F9h (B)
Sector Protection
Verification
L
L
H
SA
X
V
ID
X
L
X
H
L
X
X
01h (protected),
00h (unprotected)
SecSi
TM
Sector Indicator
Bit (DQ7)
L
L
H
X
X
V
ID
X
L
X
H
H
X
X
99h (factory locked),
19h (not factory
locked)
November 15, 2004
Am29LV320D
17
Sector/Sector Block Protection and
Unprotection
The hardware sector protection feature disables
both program and erase operations in any sec-
tor. The hardware sector unprotection feature
re-enables both program and erase operations
in previously protected sectors. Sector protec-
tion/unprotection can be implemented via two
methods.
(Note: For the following discussion, the term
"sector" applies to both sectors and sector
blocks. A sector block consists of two or more
adjacent sectors that are protected or unpro-
tected at the same time (see
Table 7, on
page 17
and
Table 8, on page 17
).
Table 7. Top Boot Sector/Sector Block
Addresses for Protection/Unprotection
Table 8. Bottom Boot Sector/Sector Block
Addresses for Protection/Unprotection
Sector Protection and unprotection requires V
ID
on the RESET# pin only, and can be imple-
mented either in-system or via programming
equipment.
Figure 2, on page 19
shows the al-
gorithms and
Figure 25, on page 47
shows the
timing diagram. This method uses standard mi-
croprocessor bus cycle timing. For sector un-
protect, all unprotected sectors must first be
protected prior to the first sector unprotect
write cycle.
The sector unprotect algorithm unprotects all
sectors in parallel. All previously protected sec-
tors must be individually re-protected. To
change data in protected sectors efficiently, the
temporary sector unprotect function is avail-
able. See
"Temporary Sector Unprotect" on
page 18
.
The alternate method intended only for pro-
gramming equipment, and requires V
ID
on ad-
d r e s s p i n A 9 a n d O E # . Th i s m e t h o d i s
Sector / Sector
Block
A20A12
Sector/Sector Block
Size
SA0-SA3
000000XXX,
000001XXX,
000010XXX
000011XXX
256 (4x64) Kbytes
SA4-SA7
0001XXXXX
256 (4x64) Kbytes
SA8-SA11
0010XXXXX
256 (4x64) Kbytes
SA12-SA15
0011XXXXX
256 (4x64) Kbytes
SA16-SA19
0100XXXXX
256 (4x64) Kbytes
SA20-SA23
0101XXXXX
256 (4x64) Kbytes
SA24-SA27
0110XXXXX
256 (4x64) Kbytes
SA28-SA31
0111XXXXX
256 (4x64) Kbytes
SA32-SA35
1000XXXXX
256 (4x64) Kbytes
SA36-SA39
1001XXXXX
256 (4x64) Kbytes
SA40-SA43
1010XXXXX
256 (4x64) Kbytes
SA44-SA47
1011XXXXX
256 (4x64) Kbytes
SA48-SA51
1100XXXXX
256 (4x64) Kbytes
SA52-SA55
1101XXXXX
256 (4x64) Kbytes
SA56-SA59
1110XXXXX
256 (4x64) Kbytes
SA60-SA62
111100XXX,
111101XXX,
111110XXX
192 (3x64) Kbytes
SA63
111111000
8 Kbytes
SA64
111111001
8 Kbytes
SA65
111111010
8 Kbytes
SA66
111111011
8 Kbytes
SA67
111111100
8 Kbytes
SA68
111111101
8 Kbytes
SA69
111111110
8 Kbytes
SA70
111111111
8 Kbytes
Sector / Sector
Block
A20A12
Sector/Sector Block
Size
SA70-SA67
111111XXX,
111110XXX,
111101XXX,
111100XXX
256 (4x64) Kbytes
SA66-SA63
1110XXXXX
256 (4x64) Kbytes
SA62-SA59
1101XXXXX
256 (4x64) Kbytes
SA58-SA55
1100XXXXX
256 (4x64) Kbytes
SA54-SA51
1011XXXXX
256 (4x64) Kbytes
SA50-SA47
1010XXXXX
256 (4x64) Kbytes
SA46-SA43
1001XXXXX
256 (4x64) Kbytes
SA42-SA39
1000XXXXX
256 (4x64) Kbytes
SA38-SA35
0111XXXXX
256 (4x64) Kbytes
SA34-SA31
0110XXXXX
256 (4x64) Kbytes
SA30-SA27
0101XXXXX
256 (4x64) Kbytes
SA26-SA23
0100XXXXX
256 (4x64) Kbytes
SA22SA19
0011XXXXX
256 (4x64) Kbytes
SA18-SA15
0010XXXXX
256 (4x64) Kbytes
SA14-SA11
0001XXXXX
256 (4x64) Kbytes
SA10-SA8
000011XXX,
000010XXX,
000001XXX
192 (3x64) Kbytes
SA7
000000111
8 Kbytes
SA6
000000110
8 Kbytes
SA5
000000101
8 Kbytes
SA4
000000100
8 Kbytes
SA3
000000011
8 Kbytes
SA2
000000010
8 Kbytes
SA1
000000001
8 Kbytes
SA0
000000000
8 Kbytes
18
Am29LV320D
November 15, 2004
compatible with programmer routines written
for earlier 3.0 volt-only AMD flash devices. For
detailed information, contact an AMD represen-
tative.
The device is shipped with all sectors unpro-
tected. AMD offers the option of programming
and protecting sectors at its factory prior to
shipping the device through AMD's Express-
FlashTM Service. Contact an AMD representative
for details.
It is possible to determine whether a sector is
protected or unprotected. See
"Autoselect
Mode" on page 16
for details.
Write Protect (WP#)
The Write Protect function provides a hardware
method of protecting certain boot sectors with-
out using V
ID
. This function is one of two pro-
vided by the WP#/ACC pin.
If the system asserts V
IL
on the WP#/ACC pin,
the device disables program and erase func-
tions in the two "outermost" 8 Kbyte boot sec-
tors independently of whether those sectors
were protected or unprotected using the
method described in
"Sector/Sector Block Pro-
tection and Unprotection" on page 17
. The two
outermost 8 Kbyte boot sectors are the two
sectors containing the lowest addresses in a
bottom-boot-configured device, or the two sec-
tors containing the highest addresses in a
top-boot-configured device.
If the system asserts V
IH
on the WP#/ACC pin,
the device reverts to whether the two outer-
most 8K Byte boot sectors were last set to be
protected or unprotected. That is, sector pro-
tection or unprotection for these two sectors
depends on whether they were last protected
or unprotected using the method described in
"Sector/Sector Block Protection and Unprotec-
tion" on page 17
.
Note that the WP#/ACC pin must not be left
floating or unconnected; inconsistent behavior
of the device may result.
Temporary Sector Unprotect
This feature allows temporary unprotection of
previously protected sectors to change data
in-system. The Sector Unprotect mode is acti-
vated by setting the RESET# pin to V
ID
(11.5 V
12.5 V). During this mode, formerly pro-
tected sectors can be programmed or erased by
selecting the sector addresses. Once V
ID
is re-
moved from the RESET# pin, all the previously
protected sectors are protected again.
Figure 1,
on page 18
shows the algorithm, and
Figure
23, on page 46
shows the timing diagrams, for
this feature.
Figure 1. Temporary Sector Unprotect
Operation
START
Perform Erase or
Program
RESET# = V
IH
Temporary Sector
Unprotect Completed
(Note 2)
RESET# = V
ID
(Note 1)
Notes:
1. All protected sectors unprotected (If WP#/ACC =
V
IL
, outermost boot sectors remain protected).
2. All previously protected sectors are protected
once again.
November 15, 2004
Am29LV320D
19
Figure 2. In-System Sector Protect/Unprotect Algorithms
Sector Protect:
Write 60h to sector
address with
A6 = 0, A1 = 1,
A0 = 0
Set up sector
address
Wait 150 s
Verify Sector
Protect: Write 40h
to sector address
with A6 = 0,
A1 = 1, A0 = 0
Read from
sector address
with A6 = 0,
A1 = 1, A0 = 0
START
PLSCNT = 1
RESET# = V
ID
Wait 1
s
First Write
Cycle = 60h?
Data = 01h?
Remove V
ID
from RESET#
Write reset
command
Sector Protect
complete
Yes
Yes
No
PLSCNT
= 25?
Yes
Device failed
Increment
PLSCNT
Temporary Sector
Unprotect Mode
No
Sector Unprotect:
Write 60h to sector
address with
A6 = 1, A1 = 1,
A0 = 0
Set up first sector
address
Wait 15 ms
Verify Sector
Unprotect: Write
40h to sector
address with
A6 = 1, A1 = 1,
A0 = 0
Read from
sector address
with A6 = 1,
A1 = 1, A0 = 0
START
PLSCNT = 1
RESET# = V
ID
Wait 1
s
Data = 00h?
Last sector
verified?
Remove V
ID
from RESET#
Write reset
command
Sector Unprotect
complete
Yes
No
PLSCNT
= 1000?
Yes
Device failed
Increment
PLSCNT
Temporary Sector
Unprotect Mode
No
All sectors
protected?
Yes
Protect all sectors:
The indicated portion
of the sector protect
algorithm must be
performed for all
unprotected sectors
prior to issuing the
first sector
unprotect address
Set up
next sector
address
No
Yes
No
Yes
No
No
Yes
No
Sector Protect
Algorithm
Sector Unprotect
Algorithm
First Write
Cycle = 60h?
Protect another
sector?
Reset
PLSCNT = 1
20
Am29LV320D
November 15, 2004
SecSi
TM
Sector (Secured Silicon) Flash
Memory Region
The Secured Silicon Sector (SecSi Sector) fea-
ture provides a Flash memory region that en-
ables permanent part identification through an
Electronic Serial Number (ESN). The SecSi Sec-
tor uses a SecSi Sector Indicator Bit (DQ7) to
indicate whether or not the SecSi Sector is
locked when shipped from the factory. This bit
is permanently set at the factory and cannot be
changed, which prevents cloning of a factory
locked part. This ensures the security of the
ESN once the product is shipped to the field.
Note that the Am29LV320D has a SecSi
Sector size of 64 Kbytes. AMD devices des-
ignated as replacements or substitutes,
such as the Am29LV320M, have 256 bytes.
This should be considered during system
design.
AMD offers the device with the SecSi Sector ei-
ther factory locked or customer lockable. The
factory-locked version is always protected
when shipped from the factory, and has the
SecSi Sector Indicator Bit permanently set to a
"1." The customer-lockable version is shipped
with the SecSi Sector unprotected, allowing
customers to utilize the that sector in any man-
ner they choose. The customer-lockable ver-
s io n ha s t he S e cS i Se ct or In di ca to r B i t
permanently set to a "0." Thus, the SecSi Sec-
tor Indicator Bit prevents customer-lockable
devices from being used to replace devices that
are factory locked.
The system accesses the SecSi Sector through
a command sequence (see
"Enter SecSi
TM
Sec-
tor/Exit SecSi Sector Command Sequence" on
page 26
). After the system writes the Enter
SecSi Sector command sequence, it may read
the SecSi Sector by using the addresses nor-
mally occupied by the boot sectors. This mode
of operation continues until the system issues
the Exit SecSi Sector command sequence, or
until power is removed from the device. On
power-up, or following a hardware reset, the
device reverts to sending commands to the
boot sectors.
Factory Locked: SecSi Sector Programmed
and Protected at the Factory
In a factory locked device, the SecSi Sector is
protected when the device is shipped from the
factory. The SecSi Sector cannot be modified in
any way. The device is available prepro-
grammed with one of the following:
A random, secure ESN only
Customer code through the ExpressFlash
service
Both a random, secure ESN and customer
code through the ExpressFlash service.
In devices that have an ESN, a Bottom Boot de-
vice has the 16-byte (8-word) ESN in sector 0
at addresses 00000h0000Fh in byte mode (or
00000h00007h in word mode). In the Top
Boot device the ESN is in sector 63 at ad-
dresses 3F0000h3F000Fh in byte mode (or
1F8000h1F8007h in word mode). Note that in
upcoming top boot versions of this device, the
ESN is located in sector 70 at addresses
3 F E 0 0 0 h 3 F E 0 0 F h i n b y t e m o d e ( o r
1FF000h1FF007h in word mode).
Customers may opt to have their code pro-
grammed by AMD through the AMD Express-
Flash service. AMD programs the customer's
code, with or without the random ESN. The de-
vices are then shipped from AMD's factory with
the SecSi Sector permanently locked. Contact
an AMD representative for details on using
AMD's ExpressFlash service.
Customer Lockable: SecSi Sector NOT
Programmed or Protected at the Factory
The customer lockable version allows the SecSi
Sector to be programmed once and then per-
manently locked after it ships from AMD. Note
that the Am29LV320D has a SecSi Sector
size of 64 Kbytes. AMD devices designated
as replacements or substitutes, such as
the Am29LV320M, have 256 bytes. This
should be considered during system de-
sign. Additionally, note the change in the
location of the ESN in upcoming top boot
factory locked devices. Note that the accel-
erated programming (ACC) and unlock bypass
functions are not available when programming
the SecSi Sector.
The SecSi Sector area can be protected using
the following procedures:
Write the three-cycle Enter SecSi Region
command sequence, and then follow the
in-system sector protect algorithm as shown
in
Figure 2, on page 19
, except that RESET#
may be at either V
IH
or V
ID
. This allows
in-system protection of the SecSi Sector
without raising any device pin to a high volt-
age. Note that this method is only applicable
to the SecSi Sector.
To verify the protect/unprotect status of the
SecSi Sector, follow the algorithm shown in
Figure 3, on page 21
.
November 15, 2004
Am29LV320D
21
Once the SecSi Sector is locked and verified,
the system must write the Exit SecSi Sector
Region command sequence to return to reading
and writing the remainder of the array.
The SecSi Sector protection must be used with
caution since, once protected, there is no pro-
cedure available for unprotecting the SecSi
Sector area and none of the bits in the SecSi
Sector memory space can be modified in any
way.
Figure 3. SecSi Sector Protect Verify
Hardware Data Protection
The command sequence requirement of unlock
cycles for programming or erasing provides
data protection against inadvertent writes (re-
fer to
Table 14, on page 29
for command defi-
nitions). In addition, the following hardware
data protection measures prevent accidental
erasure or programming, which might other-
wise be caused by spurious system level signals
during V
CC
power-up and power-down transi-
tions, or from system noise.
Low V
CC
Write Inhibit
When V
CC
is less than V
LKO
, the device does not
accept any write cycles. This protects data dur-
ing V
CC
power-up and power-down. The com-
mand register and all internal program/erase
circuits are disabled, and the device resets to
the read mode. Subsequent writes are ignored
until V
CC
is greater than V
LKO
. The system must
provide the proper signals to the control pins to
prevent unintentional writes when V
C C
is
greater than V
LKO
.
Write Pulse "Glitch" Protection
Noise pulses of less than 5 ns (typical) on OE#,
CE# or WE# do not initiate a write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of
OE# = V
IL
, CE# = V
IH
or WE# = V
IH
. To initiate
a write cycle, CE# and WE# must be a logical
zero while OE# is a logical one.
Power-Up Write Inhibit
If WE# = CE# = V
IL
and OE# = V
IH
during
power up, the device does not accept com-
mands on the rising edge of WE#. The internal
state machine is automatically reset to the read
mode on power-up.
COMMON FLASH MEMORY
INTERFACE (CFI)
The Common Flash Interface (CFI) specification
outlines device and host system software inter-
rogation handshake, which allows specific ven-
dor-specified software algorithms to be used
for entire families of devices. Software support
can then be device-independent, JEDEC ID-in-
dependent, and forward- and backward-com-
patible for the specified flash device families.
Flash vendors can standardize their existing in-
terfaces for long-term compatibility.
This device enters the CFI Query mode when
the system writes the CFI Query command,
98h, to address 55h in word mode (or address
AAh in byte mode), any time the device is
ready to read array data. The system can read
CFI information at the addresses given in
Table 9, on page 22
through
Table 12, on
page 24
. To terminate reading CFI data, the
system must write the reset command.
The system can also write the CFI query com-
mand when the device is in the autoselect
mode. The device enters the CFI query mode,
and the system can read CFI data at the ad-
dresses given in
Table 9, on page 22
through
Table 12, on page 24
. The system must write
the reset command to return the device to the
reading array data.
For further information, please refer to the CFI
Specification and CFI Publication 100, available
v i a t h e Wo r l d W i d e We b a t
http://www.amd.com/flash/cfi. Alternatively,
contact an AMD representative for copies of
these documents.
Write 60h to
any address
Write 40h to SecSi
Sector address
with A6 = 0,
A1 = 1, A0 = 0
START
RESET# =
V
IH
or V
ID
Wait 1
s
Read from SecSi
Sector address
with A6 = 0,
A1 = 1, A0 = 0
If data = 00h,
SecSi Sector is
unprotected.
If data = 01h,
SecSi Sector is
protected.
Remove V
IH
or V
ID
from RESET#
Write reset
command
SecSi Sector
Protect Verify
complete
22
Am29LV320D
November 15, 2004
Table 9. CFI Query Identification String
Table 10. System Interface String
Addresses
(Word Mode)
Addresses
(Byte Mode)
Data
Description
10h
11h
12h
20h
22h
24h
0051h
0052h
0059h
Query Unique ASCII string "QRY"
13h
14h
26h
28h
0002h
0000h
Primary OEM Command Set
15h
16h
2Ah
2Ch
0040h
0000h
Address for Primary Extended Table
17h
18h
2Eh
30h
0000h
0000h
Alternate OEM Command Set (00h = none exists)
19h
1Ah
32h
34h
0000h
0000h
Address for Alternate OEM Extended Table (00h = none exists)
Addresses
(Word Mode)
Addresses
(Byte Mode)
Data
Description
1Bh
36h
0027h
V
CC
Min. (write/erase)
D7D4: volt, D3D0: 100 millivolt
1Ch
38h
0036h
V
CC
Max. (write/erase)
D7D4: volt, D3D0: 100 millivolt
1Dh
3Ah
0000h
V
PP
Min. voltage (00h = no V
PP
pin present)
1Eh
3Ch
0000h
V
PP
Max. voltage (00h = no V
PP
pin present)
1Fh
3Eh
0004h
Typical timeout per single byte/word write 2
N
s
20h
40h
0000h
Typical timeout for Min. size buffer write 2
N
s (00h = not supported)
21h
42h
000Ah
Typical timeout per individual block erase 2
N
ms
22h
44h
0000h
Typical timeout for full chip erase 2
N
ms (00h = not supported)
23h
46h
0005h
Max. timeout for byte/word write 2
N
times typical
24h
48h
0000h
Max. timeout for buffer write 2
N
times typical
25h
4Ah
0004h
Max. timeout per individual block erase 2
N
times typical
26h
4Ch
0000h
Max. timeout for full chip erase 2
N
times typical (00h = not supported)
November 15, 2004
Am29LV320D
23
Table 11. Device Geometry Definition
Addresses
(Word Mode)
Addresses
(Byte Mode)
Data
Description
27h
4Eh
0016h
Device Size = 2
N
byte
28h
29h
50h
52h
0002h
0000h
Flash Device Interface description (refer to CFI publication 100)
2Ah
2Bh
54h
56h
0000h
0000h
Max. number of bytes in multi-byte write = 2
N
(00h = not supported)
2Ch
58h
0002h
Number of Erase Block Regions within device
2Dh
2Eh
2Fh
30h
5Ah
5Ch
5Eh
60h
0007h
0000h
0020h
0000h
Erase Block Region 1 Information
(refer to the CFI specification or CFI publication 100)
31h
32h
33h
34h
62h
64h
66h
68h
003Eh
0000h
0000h
0001h
Erase Block Region 2 Information
35h
36h
37h
38h
6Ah
6Ch
6Eh
70h
0000h
0000h
0000h
0000h
Erase Block Region 3 Information
39h
3Ah
3Bh
3Ch
72h
74h
76h
78h
0000h
0000h
0000h
0000h
Erase Block Region 4 Information
24
Am29LV320D
November 15, 2004
Table 12. Primary Vendor-Specific Extended Query
Addresses
(Word Mode)
Addresses
(Byte Mode)
Data
Description
40h
41h
42h
80h
82h
84h
0050h
0052h
0049h
Query-unique ASCII string "PRI"
43h
86h
0031h
Major version number, ASCII
44h
88h
0031h
Minor version number, ASCII
45h
8Ah
0000h
Address Sensitive Unlock (Bits 1-0)
0 = Required, 1 = Not Required
Silicon Revision Number (Bits 7-2)
46h
8Ch
0002h
Erase Suspend
0 = Not Supported, 1 = To Read Only, 2 = To Read & Write
47h
8Eh
0004h
Sector Protect
0 = Not Supported, X = Number of sectors in per group
48h
90h
0001h
Sector Temporary Unprotect
00 = Not Supported, 01 = Supported
49h
92h
0004h
Sector Protect/Unprotect scheme
04 = 29LV800 mode
4Ah
94h
0000h
Simultaneous Operation
00 = Not Supported
4Bh
96h
0000h
Burst Mode Type
00 = Not Supported, 01 = Supported
4Ch
98h
0000h
Page Mode Type
00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page
4Dh
9Ah
00B5h
ACC (Acceleration) Supply Minimum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
4Eh
9Ch
00C5h
ACC (Acceleration) Supply Maximum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
4Fh
9Eh
000Xh
Top/Bottom Boot Sector Flag
02h = Bottom Boot Device, 03h = Top Boot Device
November 15, 2004
Am29LV320D
25
COMMAND DEFINITIONS
Writing specific address and data commands or
sequences into the command register initiates
device operations.
Table 14, on page 29
defines
the valid register command sequences. Note
that writing incorrect address and data values
or writing them in the improper sequence may
place the device in an unknown state. A reset
command is required to return the device to
normal operation.
All addresses are latched on the falling edge of
WE# or CE#, whichever happens later. All data
is latched on the rising edge of WE# or CE#,
whichever happens first. Refer to the AC Char-
acteristics section for timing diagrams.
Reading Array Data
The device is automatically set to reading array
data after device power-up. No commands are
required to retrieve data. The device is ready to
read array data after completing an Embedded
Program or Embedded Erase algorithm.
After the device accepts an Erase Suspend
command, the device enters the erase-sus-
pend-read mode, after which the system can
read data from any non-erase-suspended sec-
tor. After completing a programming operation
in the Erase Suspend mode, the system may
once again read array data with the same ex-
ception. See
"Erase Suspend/Erase Resume
Commands" on page 28
for more information.
The system must issue the reset command to
return the device to the read (or erase-sus-
pend-read) mode if DQ5 goes high during an
active program or erase operation, or if the de-
vice is in the autoselect mode. See the next
section,
"Reset Command
, for more informa-
tion.
See also
"Requirements for Reading Array
Data" on page 11
for more information. The
Read-Only Operations table provides the read
parameters, and
Figure 14, on page 38
shows
the timing diagram.
Reset Command
Writing the reset command resets the device to
the read or erase-suspend-read mode. Address
bits are don't cares for this command.
The reset command may be written between
the sequence cycles in an erase command se-
quence before erasing begins. This resets the
device to which the system was writing to the
read mode. Once erasure begins, however, the
device ignores reset commands until the opera-
tion is complete.
The reset command may be written between
the sequence cycles in a program command se-
quence before programming begins. This resets
the device to which the system was writing to
the read mode. If the program command se-
quence is written to a sector that is in the Erase
Suspend mode, writing the reset command re-
turns the device to the erase-suspend-read
mode. Once programming begins, however, the
device ignores reset commands until the opera-
tion is complete.
The reset command may be written between
the sequence cycles in an autoselect command
sequence. Once in the autoselect mode, the
reset command must be written to return to
the read mode. If the device entered the au-
toselect mode while in the Erase Suspend
mode, writing the reset command returns the
device to the erase-suspend-read mode.
If DQ5 goes high during a program or erase op-
eration, writing the reset command returns the
d evice to the rea d m ode (or era se-sus-
pend-read mode if the device was in Erase Sus-
pend).
Autoselect Command Sequence
The autoselect command sequence allows the
host system to read several identifier codes at
specific addresses:
Table 13. Autoselect Codes
Table 14, on page 29
shows the address and
data requirements. This method is an alterna-
tive to that shown in
Table 6, on page 16
,
which is intended for PROM programmers and
requires V
ID
on address pin A9. The autoselect
command sequence may be written to an ad-
dress within sector that is either in the read or
erase-suspend-read mode. The autoselect
command may not be written while the device
is actively programming or erasing.
The autoselect command sequence is initiated
by first writing two unlock cycles. This is fol-
lowed by a third write cycle that contains the
autoselect command. The device then enters
the autoselect mode. The system may read at
any address any number of times without initi-
ating another autoselect command sequence.
The system must write the reset command to
retu rn to the rea d m ode (or e ra se-su s-
pend-read mode if the device was previously in
Erase Suspend).
Identifier Code
Address
Manufacturer ID
00h
Device ID
01h
SecSi Sector Factory Protect
03h
Sector Group Protect Verify
(SA)02h
26
Am29LV320D
November 15, 2004
Enter SecSi
TM
Sector/Exit SecSi Sector
Command Sequence
The SecSi Sector region provides a secured
data area containing a random, sixteen-byte
electronic serial number (ESN). The system can
access the SecSi Sector region by issuing the
three-cycle Enter SecSi Sector command se-
quence. The device continues to access the
SecSi Sector region until the system issues the
four-cycle Exit SecSi Sector command se-
quence. The Exit SecSi Sector command se-
quence returns the device to normal operation.
Table 14, on page 29
shows the address and
data requirements for both command se-
quences. Note that the ACC function and unlock
bypass modes are not available when the de-
vice enters the SecSi Sector. See also
"SecSi
TM
Sector (Secured Silicon) Flash Memory Region"
on page 20
for further information.
Byte/Word Program Command Sequence
The system may program the device by word or
byte, depending on the state of the BYTE# pin.
Programming is a four-bus-cycle operation. The
program command sequence is initiated by
writing two unlock write cycles, followed by the
program set-up command. The program ad-
dress and data are written next, which in turn
initiate the Embedded Program algorithm. The
system is not required to provide further con-
trols or timings. The device automatically pro-
vides internally generated program pulses and
verifies the programmed cell margin.
Table 14,
on page 29
shows the address and data re-
quirements for the byte program command se-
quence. Note that the autoselect, SecSi Sector,
and CFI modes are unavailable while a pro-
gramming operation is in progress.
When the Embedded Program algorithm is
complete, the device then returns to the read
mode and addresses are no longer latched. The
system can determine the status of the pro-
gram operation by using DQ7, DQ6, or RY/BY#.
Refer to
"Write Operation Status" on page 30
for information on these status bits.
Any commands written to the device during the
Embedded Program Algorithm are ignored.
Note that a hardware reset immediately ter-
minates the program operation. The program
command sequence should be reinitiated once
the device returns to the read mode, to ensure
data integrity.
Programming is allowed in any sequence and
across sector boundaries. A bit cannot be
programmed from "0" back to a "1." At-
tempting to do so may cause the device to set
DQ5 = 1, or cause the DQ7 and DQ6 status bits
to indicate the operation was successful. How-
ever, a succeeding read shows that the data is
still "0." Only erase operations can convert a
"0" to a "1."
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to
program bytes or words to the device faster
than using the standard program command se-
quence. The unlock bypass command sequence
is initiated by first writing two unlock cycles.
This is followed by a third write cycle containing
the unlock bypass command, 20h. The device
then enters the unlock bypass mode. A two-cy-
cle unlock bypass program command sequence
is all that is required to program in this mode.
The first cycle in this sequence contains the un-
lock bypass program command, A0h; the sec-
ond cycle contains the program address and
data. Additional data is programmed in the
same manner. This mode dispenses with the
initial two unlock cycles required in the stan-
dard program command sequence, resulting in
faster total programming time.
Table 14, on
page 29
shows the requirements for the com-
mand sequence.
During the unlock bypass mode, only the Un-
lock Bypass Program and Unlock Bypass Reset
commands are valid. To exit the unlock bypass
mode, the system must issue the two-cycle un-
lock bypass reset command sequence. The first
cycle must contain the data 90h. The second
cycle need only contain the data 00h. The de-
vice then re turns to the read mode.
The device offers accelerated program opera-
tions through the WP#/ACC pin. When the sys-
tem asserts V
HH
on the WP#/ACC pin, the
device automatically enters the Unlock Bypass
mode. The system may then write the two-cy-
cle Unlock Bypass program command se-
quence. The device uses the higher voltage on
the WP#/ACC pin to accelerate the operation.
Note that the WP#/ACC pin must not be at V
HH
any operation other than accelerated program-
ming, or device damage may result. In addi-
tion, the WP#/ACC pin must not be left floating
or unconnected; inconsistent behavior of the
device may result.
Figure 4, on page 27
illustrates the algorithm
for the program operation. Refer to the table
"Erase and Program Operations" on page 41
for
parameters, and
Figure 18, on page 42
for tim-
ing diagrams.
November 15, 2004
Am29LV320D
27
Figure 4. Program Operation
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip
erase command sequence is initiated by writing
two unlock cycles, followed by a set-up com-
mand. Two additional unlock write cycles are
then followed by the chip erase command,
which in turn invokes the Embedded Erase al-
gorithm. The device does not require the sys-
t e m t o p r e p r o g ra m p r i o r t o e ra s e . T h e
Embedded Erase algorithm automatically pre-
programs and verifies the entire memory for an
all zero data pattern prior to electrical erase.
The system is not required to provide any con-
trols or timings during these operations.
Table 14, on page 29
shows the address and
data requirements for the chip erase command
sequence. Note that the autoselect, SecSi Sec-
tor, and CFI modes are unavailable while an
erase operation is in progress.
When the Embedded Erase algorithm is com-
plete, the device returns to the read mode and
addresses are no longer latched. The system
can determine the status of the erase operation
by using DQ7, DQ6, DQ2, or RY/BY#. Refer to
"Write Operation Status" on page 30
for infor-
mation on these status bits.
Any commands written during the chip erase
operation are ignored. However, note that a
hardware reset immediately terminates the
erase operation. If that occurs, the chip erase
command sequence should be reinitiated once
the device returns to reading array data, to en-
sure data integrity.
Figure 5, on page 28
illustrates the algorithm
for the erase operation. Refer to table
"Erase
and Program Operations" on page 41
for pa-
rameters, and
Figure 19, on page 43
section for
timing diagrams.
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The
sector erase command sequence is initiated by
writing two unlock cycles, followed by a set-up
command. Two additional unlock cycles are
written, and are then followed by the address
of the sector to be erased, and the sector erase
command.
Table 14, on page 29
shows the ad-
dress and data requirements for the sector
erase command sequence. Note that the au-
toselect, SecSi Sector, and CFI modes are un-
a vailable while an erase operation is in
progress.
The device does not require the system to pre-
program prior to erase. The Embedded Erase
algorithm automatically programs and verifies
the entire memory for an all zero data pattern
prior to electrical erase. The system is not re-
quired to provide any controls or timings during
these operations.
After the command sequence is written, a sec-
tor erase time-out of 50 s occurs. During the
time-out period, additional sector addresses
and sector erase commands may be written.
Loading the sector erase buffer may be done in
any sequence, and the number of sectors may
be from one sector to all sectors. The time be-
tween these additional cycles must be less than
50 s, otherwise the last address and com-
mand may not be accepted, and erasure may
begin. It is recommended that processor inter-
rupts be disabled during this time to ensure all
commands are accepted. The interrupts can be
re-enabled after the last Sector Erase com-
mand is written. Any command other than
Sector Erase or Erase Suspend during the
START
Write Program
Command Sequence
Data Poll
from System
Verify Data?
No
Yes
Last Address?
No
Yes
Programming
Completed
Increment Address
Embedded
Program
algorithm
in progress
Note: See
Table 14, on page 29
for program
command sequence.
28
Am29LV320D
November 15, 2004
time-out period resets the device to the
read mode. The system must rewrite the com-
mand sequence and any additional addresses
and commands.
The system can monitor DQ3 to determine if
the sector erase timer timed out (See the sec-
tion
"DQ3: Sector Erase Timer" on page 32
.).
The time-out begins from the rising edge of the
final WE# pulse in the command sequence.
When the Embedded Erase algorithm is com-
plete, the device returns to reading array data
and addresses are no longer latched. The sys-
tem can determine the status of the erase op-
eration by reading DQ7, DQ6, DQ2, or RY/BY#
in the erasing sector. Refer to
"Write Operation
Status" on page 30
for information on these
status bits.
Once the sector erase operation begins, only
the Erase Suspend command is valid. All other
commands are ignored. However, note that a
hardware reset immediately terminates the
erase operation. If that occurs, the sector erase
command sequence should be reinitiated once
the device returns to reading array data, to en-
sure data integrity.
Figure 5, on page 28
illustrates the algorithm
for the erase operation. Refer to table
"Erase
and Program Operations" on page 41
for pa-
rameters, and
Figure 19, on page 43
for timing
diagrams.
Erase Suspend/Erase Resume Commands
The Erase Suspend command, B0h, allows the
system to interrupt a sector erase operation
and then read data from, or program data to,
any sector not selected for erasure. This com-
mand is valid only during the sector erase oper-
ation, including the 50 s time-out period
during the sector erase command sequence.
The Erase Suspend command is ignored if writ-
ten during the chip erase operation or Embed-
ded Program algorithm.
When the Erase Suspend command is written
during the sector erase operation, the device
requires a maximum of 20 s to suspend the
erase operation. However, when the Erase Sus-
pend command is written during the sector
erase time-out, the device immediately termi-
nates the time-out period and suspends the
erase operation.
After the erase operation is suspended, the de-
vice enters the erase-suspend-read mode. The
system can read data from or program data to
any sector not selected for erasure. (The device
"erase suspends" all sectors selected for era-
sure.) Reading at any address within erase-sus-
pended sectors produces status information on
DQ7DQ0. The system can use DQ7, or DQ6
and DQ2 together, to determine if a sector is
actively erasing or is erase-suspended. Refer to
the
"Write Operation Status" on page 30
sec-
tion for information on these status bits.
After an erase-suspended program operation is
complete, the device returns to the erase-sus-
pend-read mode. The system can determine
the status of the program operation using the
DQ7 or DQ6 status bits, just as in the standard
Byte Program operation. Refer to
"Write Opera-
tion Status" on page 30
for more information.
In the erase-suspend-read mode, the system
can also issue the autoselect command se-
quence. Refer to
"Autoselect Mode" on page 16
and
"Autoselect Command Sequence" on
page 25
for details.
To resume the sector erase operation, the sys-
tem must write the Erase Resume command.
Further writes of the Resume command are ig-
nored. Another Erase Suspend command can
be written after the chip resumes erasing.
Figure 5. Erase Operation
START
Write Erase
Command Sequence
(Notes 1, 2)
Data Poll to Erasing
Bank from System
Data = FFh?
No
Yes
Erasure Completed
Embedded
Erase
algorithm
in progress
Notes:
1. See
Table 14, on page 29
for erase command
sequence.
2. See the section on DQ3 for information on the
sector erase timer.
November 15, 2004
Am29LV320D
29
Command Definitions
Table 14. Am29LV320D Command Definitions
Legend:
X = Don't care
RA = Address of the memory location to be read.
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed.
Addresses latch on the falling edge of the WE# or CE# pulse,
whichever happens later.
PD = Data to be programmed at location PA. Data latches on
the rising edge of WE# or CE# pulse, whichever happens first.
SA = Address of the sector to be verified (in autoselect mode)
or erased. Address bits A20A12 uniquely select any sector.
Notes:
1. See
Table 1
for description of bus operations.
2. All values are in hexadecimal.
3. Except for the read cycle and the fourth cycle of the autoselect
command sequence, all bus cycles are write cycles.
4. Data bits DQ15DQ8 are don't care in command sequences,
except for RD and PD.
5. Unless otherwise noted, address bits A20A11 are don't cares.
6. No unlock or command cycles required when device is in read
mode.
7. The Reset command is required to return to the read mode (or
to the erase-suspend-read mode if previously in Erase Suspend)
when a device is in the autoselect mode, or if DQ5 goes high
(while the device is providing status information).
8. The fourth cycle of the autoselect command sequence is a read
cycle. Data bits DQ15DQ8 are don't care. See the Autoselect
Command Sequence section for more information.
9. The data is 99h for factory locked and 19h for not factory
locked.
10. The data is 00h for an unprotected sector and 01h for a
protected sector.
11. The Unlock Bypass command is required prior to the Unlock
Bypass Program command.
12. The Unlock Bypass Reset command is required to return to the
read mode when the device is in the unlock bypass mode.
13. The system may read and program in non-erasing sectors, or
enter the autoselect mode, when in the Erase Suspend mode.
The Erase Suspend command is valid only during a sector erase
operation.
14. The Erase Resume command is valid only during the Erase
Suspend mode.
15. Command is valid when device is ready to read array data or
when device is in autoselect mode.
Command
Sequence
(Note 1)
Cy
c
l
e
s
Bus Cycles (Notes 25)
First
Second Third
Fourth Fifth Sixth
Addr Data Addr Data
Addr
Data Addr
Data
Addr Data Addr Data
Read (Note 6)
1
RA
RD
Reset (Note 7)
1
XXX
F0
Au
to
s
e
l
e
ct
(
N
o
t
e

8)
Manufacturer ID
Word
4
555
AA
2AA
55
555
90
X00
01
Byte
AAA
555
AAA
Device ID
Word
4
555
AA
2AA
55
555
90
X01
(see
Table 6
)
Byte
AAA
555
AAA
X02
SecSi Sector
Factory Protect
(Note 9)
Word
4
555
AA
2AA
55
555
90
X03
99/19
Byte
AAA
555
AAA
X06
Sector Protect
Verify (Note 10)
Word
4
555
AA
2AA
55
555
90
(SA)X0
2
00/01
Byte
AAA
555
AAA
(SA)X0
4
Enter
SecSiTM Sector
Region
Word
3
555
AA
2AA
55
555
88
Byte
AAA
555
AAA
Exit
SecSi Sector
Region
Word
4
555
AA
2AA
55
555
90
XXX
00
Byte
AAA
555
AAA
Program
Word
4
555
AA
2AA
55
555
A0
PA
PD
Byte
AAA
555
AAA
Unlock Bypass
Word
3
555
AA
2AA
55
555
20
Byte
AAA
555
AAA
Unlock Bypass Program (Note
11)
2
XXX
A0
PA
PD
Unlock Bypass Reset (Note 12)
2
XXX
90
XXX
00
Chip Erase
Word
6
555
AA
2AA
55
555
80
555
AA
2AA
55
555
10
Byte
AAA
555
AAA
AAA
555
AAA
Sector Erase
Word
6
555
AA
2AA
55
555
80
555
AA
2AA
55
SA
30
Byte
AAA
555
AAA
AAA
555
Erase Suspend (Note 13)
1
XXX
B0
Erase Resume (Note 14)
1
XXX
30
CFI Query (Note 15)
Word
1
55
98
Byte
AA
30
Am29LV320D
November 15, 2004
WRITE OPERATION STATUS
The device provides several bits to determine
the status of a program or erase operation:
DQ2, DQ3, DQ5, DQ6, and DQ7.
Table 15, on
page 33
and the following subsections describe
the function of these bits. DQ7 and DQ6 each
offer a method for determining whether a pro-
gram or erase operation is complete or in
progress. The device also provides a hard-
ware-based output signal, RY/BY#, to deter-
mine whether an Embedded Program or Erase
operation is in progress or is completed.
DQ7: Data# Polling
The Data# Polling bit, DQ7, indicates to the
host system whether an Embedded Program or
Erase algorithm is in progress or completed, or
whether a device is in Erase Suspend. Data#
Polling is valid after the rising edge of the final
WE# pulse in the command sequence.
During the Embedded Program algorithm, the
device outputs on DQ7 the complement of the
datum programmed to DQ7. This DQ7 status
also applies to programming during Erase Sus-
pend. When the Embedded Program algorithm
is complete, the device outputs the datum pro-
grammed to DQ7. The system must provide the
program address to read valid status informa-
tion on DQ7. If a program address falls within a
protected sector, Data# Polling on DQ7 is active
for approximately 1 s, then the device returns
to the read mode.
During the Embedded Erase algorithm, Data#
Polling produces a "0" on DQ7. When the Em-
bedded Erase algorithm is complete, or if the
device enters the Erase Suspend mode, Data#
Polling produces a "1" on DQ7. The system
must provide an address within any of the sec-
tors selected for erasure to read valid status in-
formation on DQ7.
After an erase command sequence is written, if
all sectors selected for erasing are protected,
Data# Polling on DQ7 is active for approxi-
mately 100 s, then the device returns to the
read mode. If not all selected sectors are pro-
tected, the Embedded Erase algorithm erases
the unprotected sectors, and ignores the se-
lected sectors that are protected. However, if
the system reads DQ7 at an address within a
protected sector, the status may not be valid.
Just prior to the completion of an Embedded
Program or Erase operation, DQ7 may change
asynchronously with DQ0DQ6 while Output
Enable (OE#) is asserted low. That is, the de-
vice may change from providing status infor-
mation to valid data on DQ7. Depending on
when the system samples the DQ7 output, it
may read the status or valid data. Even if the
device completes the program or erase opera-
tion and DQ7 contains valid data, the data out-
puts on DQ0DQ6 may be still invalid. Valid
data on DQ0DQ7 appears on successive read
cycles.
Table 15, on page 33
shows the outputs for
Data# Polling on DQ7.
Figure 6, on page 30
shows the Data# Polling algorithm.
Figure 20,
on page 44
in the AC Characteristics section
shows the Data# Polling timing diagram.
Figure 6. Data# Polling Algorithm
DQ7 = Data?
Yes
No
No
DQ5 = 1?
No
Yes
Yes
FAIL
PASS
Read DQ7DQ0
Addr = VA
Read DQ7DQ0
Addr = VA
DQ7 = Data?
START
Notes:
1. VA = Valid address for programming. During a
sector erase operation, a valid address is any
sector address within the sector being erased.
During chip erase, a valid address is any
non-protected sector address.
2. DQ7 should be rechecked even if DQ5 = "1"
because DQ7 may change simultaneously with
DQ5.
November 15, 2004
Am29LV320D
31
RY/BY#: Ready/Busy#
The RY/BY# is a dedicated, open-drain output
pin which indicates whether an Embedded Al-
gorithm is in progress or complete. The RY/BY#
status is valid after the rising edge of the final
WE# pulse in the command sequence. Since
RY/BY# is an open-drain output, several
RY/BY# pins can be tied together in parallel
with a pull-up resistor to V
CC
.
If the output is low (Busy), the device is ac-
tively erasing or programming. (This includes
programming in the Erase Suspend mode.) If
the output is high (Ready), the device is in the
read mode, the standby mode, or in the
erase-suspend-read m ode.
Table 15, on
page 33
shows the outputs for RY/BY#.
DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an Em-
bedded Program or Erase algorithm is in
progress or complete, or whether the device
entered the Erase Suspend mode. Toggle Bit I
may be read at any address, and is valid after
the rising edge of the final WE# pulse in the
command sequence (prior to the program or
erase operation), and during the sector erase
time-out.
During an Embedded Program or Erase algo-
rithm operation, successive read cycles to any
address cause DQ6 to toggle. The system may
use either OE# or CE# to control the read cy-
cles. When the operation is complete, DQ6
stops toggling.
After an erase command sequence is written, if
all sectors selected for erasing are protected,
DQ6 toggles for approximately 100 s, then re-
turns to reading array data. If not all selected
sectors are protected, the Embedded Erase al-
gorithm erases the unprotected sectors, and ig-
nores the selected sectors that are protected.
The system can use DQ6 and DQ2 together to
determine whether a sector is actively erasing
or is erase-suspended. When the device is ac-
tively erasing (that is, the Embedded Erase al-
gorithm is in progress), DQ6 toggles. When the
device enters the Erase Suspend mode, DQ6
stops toggling. However, the system must also
use DQ2 to determine which sectors are eras-
ing or erase-suspended. Alternatively, the sys-
tem can use DQ7 (see the subsection on
"DQ7:
Data# Polling" on page 30
).
If a program address falls within a protected
sector, DQ6 toggles for approximately 1 s
after the program command sequence is writ-
ten, then returns to reading array data.
D Q 6 als o to ggl es du rin g the era se-su s-
pend-program mode, and stops toggling once
the Embedded Program algorithm is complete.
Table 15, on page 33
shows the outputs for
Toggle Bit I on DQ6.
Figure 7, on page 31
shows the toggle bit algorithm.
Figure 21, on
page 45
in the
"AC Characteristics"
section
shows the toggle bit timing diagrams.
Figure
22, on page 45
shows the differences between
DQ2 and DQ6 in graphical form. See also the
subsection on DQ2: Toggle Bit II.
Figure 7. Toggle Bit Algorithm
START
No
Yes
Yes
DQ5 = 1?
No
Yes
Toggle Bit
= Toggle?
No
Program/Erase
Operation Not
Complete, Write
Reset Command
Program/Erase
Operation Complete
Read DQ7DQ0
Toggle Bit
= Toggle?
Read DQ7DQ0
Twice
Read DQ7DQ0
Note: The system should recheck the toggle bit
even if DQ5 = "1" because the toggle bit may stop
toggling as DQ5 changes to "1." See the subsections
on DQ6 and DQ2 for more information.
32
Am29LV320D
November 15, 2004
DQ2: Toggle Bit II
The "Toggle Bit II" on DQ2, when used with
DQ6, indicates whether a particular sector is
actively erasing (that is, the Embedded Erase
algorithm is in progress), or whether that sec-
tor is erase-suspended. Toggle Bit II is valid
after the rising edge of the final WE# pulse in
the command sequence.
DQ2 toggles when the system reads at ad-
dresses within those sectors that were selected
for erasure. (The system may use either OE#
or CE# to control the read cycles.) But DQ2
cannot distinguish whether the sector is ac-
tively erasing or is erase-suspended. DQ6, by
comparison, indicates whether the device is ac-
tively erasing, or is in Erase Suspend, but can-
not distinguish which sectors are selected for
erasure. Thus, both status bits are required for
sector and mode information. Refer to
Table 15,
on page 33
to compare outputs for DQ2 and
DQ6.
Figure 7, on page 31
shows the toggle bit algo-
rithm in flowchart form, and the section
"DQ2:
Toggle Bit II" on page 32
explains the algo-
rithm. See also the DQ6: Toggle Bit I subsec-
tion.
Figure 21, on page 45
shows the toggle bit
timing diagram.
Figure 22, on page 45
shows
the differences between DQ2 and DQ6 in
graphical form.
Reading Toggle Bits DQ6/DQ2
Refer to
Figure 7, on page 31
for the following
discussion. Whenever the system initially be-
gins reading toggle bit status, it must read
DQ7DQ0 at least twice in a row to determine
whether a toggle bit is toggling. Typically, the
system would note and store the value of the
toggle bit after the first read. After the second
read, the system would compare the new value
of the toggle bit with the first. If the toggle bit
is not toggling, the device completed the pro-
gram or erase operation. The system can read
array data on DQ7DQ0 on the following read
cycle.
However, if after the initial two read cycles, the
system determines that the toggle bit is still
toggling, the system also should note whether
the value of DQ5 is high (see the section on
DQ5). If it is, the system should then deter-
mine again whether the toggle bit is toggling,
since the toggle bit may have stopped toggling
just as DQ5 went high. If the toggle bit is no
longer toggling, the device successfully com-
pleted the program or erase operation. If it is
still toggling, the device did not completed the
operation successfully, and the system must
write the reset command to return to reading
array data.
The remaining scenario is that the system ini-
tially determines that the toggle bit is toggling
and DQ5 has not gone high. The system may
continue to monitor the toggle bit and DQ5
through successive read cycles, determining
the status as described in the previous para-
graph. Alternatively, it may choose to perform
other system tasks. In this case, the system
must start at the beginning of the algorithm
when it returns to determine the status of the
operation (top of
Figure 7, on page 31
).
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase
time exceeded a specified internal pulse count
limit. Under these conditions DQ5 produces a
"1," indicating that the program or erase cycle
was not successfully completed.
The device may output a "1" on DQ5 if the sys-
tem tries to program a "1" to a location that
was previously programmed to "0." Only an
erase operation can change a "0" back to a
"1." Under this condition, the device halts the
operation, and when the timing limit is ex-
ceeded, DQ5 produces a "1."
Under both these conditions, the system must
write the reset command to return to the read
mode (or to the erase-suspend-read mode if
the device was previously in the erase-sus-
pend-program mode).
DQ3: Sector Erase Timer
After writing a sector erase command se-
quence, the system may read DQ3 to deter-
mine whether or not erasure started. (The
sector erase timer does not apply to the chip
erase command.) If additional sectors are se-
lected for erasure, the entire time-out also ap-
p lies af te r e ach ad ditiona l s ector e rase
command. When the time-out period is com-
plete, DQ3 switches from a "0" to a "1." If the
time between additional sector erase com-
mands from the system can be assumed to be
less than 50 s, the system need not monitor
DQ3. See also the Sector Erase Command Se-
quence section.
After the sector erase command is written, the
system should read the status of DQ7 (Data#
Polling) or DQ6 (Toggle Bit I) to ensure that the
device accepted the command sequence, and
then read DQ3. If DQ3 is "1," the Embedded
Erase algorithm started; all further commands
(except Erase Suspend) are ignored until the
erase operation is complete. If DQ3 is "0," the
November 15, 2004
Am29LV320D
33
device accepts additional sector erase com-
mands. To ensure the command is accepted,
the system software should check the status of
DQ3 prior to and following each subsequent
sector erase command. If DQ3 is high on the
second status check, the last command might
not have been accepted.
Table 15, on page 33
shows the status of DQ3
relative to the other status bits.
Table 15. Write Operation Status
Notes:
1. DQ5 switches to `1' when an Embedded Program or Embedded Erase operation exceeds the maximum
timing limits. Refer to the section on DQ5 for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection
for further details.
Status
DQ7
(Note
2)
DQ6
DQ5
(Note 1)
DQ3
DQ2
(Note 2)
RY/BY#
Standard
Mode
Embedded Program Algorithm
DQ7#
Toggle
0
N/A
No toggle
0
Embedded Erase Algorithm
0
Toggle
0
1
Toggle
0
Erase
Suspend
Mode
Erase-Suspend-R
ead
Erase
Suspended Sector
1
No toggle
0
N/A
Toggle
1
Non-Erase
Suspended Sector
Data
Data
Data
Data
Data
1
Erase-Suspend-Program
DQ7#
Toggle
0
N/A
N/A
0
34
Am29LV320D
November 15, 2004
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
Plastic Packages. . . . . . . . . . 65C to +150C
Ambient Temperature
with Power Applied. . . . . . . . 65C to +125C
Voltage with Respect to Ground
V
CC
(Note 1) . . . . . . . . . . 0.5 V to +4.0 V
A9, OE#, RESET#,
and WP#/ACC (Note 2). . 0.5 V to +12.5 V
All other pins (Note 1) 0.5 V to V
CC
+0.5 V
Output Short Circuit Current (Note 3). 200 mA
Notes:
1. Minimum DC voltage on input or I/O pins is 0.5
V. During voltage transitions, input or I/O pins
may overshoot V
SS
to 2.0 V for periods of up to
20 ns. Maximum DC voltage on input or I/O pins
is V
CC
+0.5 V. See
Figure 8, on page 34
. During
voltage transitions, input or I/O pins may
overshoot to V
CC
+2.0 V for periods up to 20 ns.
See
Figure 9, on page 34
.
2. Minimum DC input voltage on pins A9, OE#,
RESET#, and WP#/ACC is 0.5 V. During voltage
transitions, A9, OE#, WP#/ACC, and RESET#
may overshoot V
SS
to 2.0 V for periods of up to
20 ns. See
Figure 8, on page 34
. Maximum DC
input voltage on pin A9 is +12.5 V which may
overshoot to +14.0 V for periods up to 20 ns.
Maximum DC input voltage on WP#/ACC is +9.5
V which may overshoot to +12.0 V for periods up
to 20 ns.
3. No more than one output may be shorted to
ground at a time. Duration of the short circuit
should not be greater than one second.
Stresses above those listed under "A bsolute
Maximum Ratings" may cause permanent damage to
the device. This is a stress rating only; functional
operation of the device at these or any other
conditions above those indicated in the operational
sections of this data sheet is not implied. Exposure
of the device to absolute maximum rating conditions
for extended periods may affect device reliability.
OPERATING RANGES
Industrial (I) Devices
Ambient Temperature (T
A
). . . . 40C to +85C
V
CC
Supply Voltages
V
CC
for all devices . . . . . . . . . . 2.7 V to 3.6 V
Operating ranges define those limits between which the
functionality of the device is guaranteed.
20 ns
20 ns
+0.8
V
SS
0.5
20 ns
V
SS
2.0
Figure 8. Maximum Negative
Overshoot Waveform
Figure 9. Maximum Positive
Overshoot Waveform
20 ns
20 ns
V
CC
+2.0
V
CC
+0.5
20 ns
2.0 V
November 15, 2004
Am29LV320D
35
DC CHARACTERISTICS
CMOS Compatible
Notes:
1. The I
CC
current listed is typically less than 2 mA/MHz, with OE# at V
IH
.
2. Maximum I
CC
specifications are tested with V
CC
= V
CC
max.
3. I
CC
active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for t
ACC
+ 30 ns. Typical sleep
mode current is 200 nA.
5. Not 100% tested.
Paramet
er
Symbol
Parameter Description
Test Conditions
Min
Typ
Max
Unit
I
LI
Input Load Current
V
IN
= V
SS
to V
CC
,
V
CC
= V
CC
max
3.0
A
I
LIT
A9 Input Load Current
V
CC
= V
CC max
; A9 = 12.5 V
35
A
I
LR
RESET# Input Load Current
V
CC
= V
CC max
; RESET# = 12.5 V
35
A
I
LO
Output Leakage Current
V
OUT
= V
SS
to V
CC
,
V
CC
= V
CC max
1.0
A
I
CC1
V
CC
Active Read Current
(Notes 1, 2)
CE# = V
IL,
OE#
=
V
IH
,
Byte Mode
5 MHz
10
16
mA
1 MHz
2
4
CE# = V
IL,
OE#
=
V
IH
,
Word Mode
5 MHz
10
16
1 MHz
2
4
I
CC2
V
CC
Active Write Current (Notes 2, 3) CE# = V
IL,
OE#
=
V
IH
, WE# = V
IL
15
30
mA
I
CC3
V
CC
Standby Current (Note 2)
CE#, RESET# = V
CC
0.3 V
0.2
5
A
I
CC4
V
CC
Reset Current (Note 2)
RESET# = V
SS
0.3 V
0.2
5
A
I
CC5
Automatic Sleep Mode (Notes 2, 4)
V
IH
= V
CC
0.3 V;
V
IL
= V
SS
0.3 V
0.2
5
A
V
IL
Input Low Voltage
0.5
0.8
V
V
IH
Input High Voltage
0.7 x V
CC
V
CC
+ 0.3
V
V
HH
Voltage for WP#/ACC Sector
Protect/Unprotect and Program
Acceleration
V
CC
= 3.0 V 10%
11.5
12.5
V
V
ID
Voltage for Autoselect and Temporary
Sector Unprotect
V
CC
= 3.0 V 10%
11.5
12.5
V
V
OL
Output Low Voltage
I
OL
= 4.0 mA, V
CC
= V
CC min
0.45
V
V
OH1
Output High Voltage
I
OH
= 2.0 mA, V
CC
= V
CC min
0.85
V
CC
V
V
OH2
I
OH
= 100 A, V
CC
= V
CC min
V
CC
0.4
V
LKO
Low V
CC
Lock-Out Voltage (Note 5)
2.3
2.5
V
36
Am29LV320D
November 15, 2004
DC CHARACTERISTICS
Zero-Power Flash
Note: Addresses are switching at 1 MHz
Figure 10. I
CC1
Current vs. Time (Showing Active and Automatic Sleep Currents)
25
20
15
10
5
0
0
500
1000
1500
2000
2500
3000
3500
4000
S
u
ppl
y C
u
rr
ent i
n

m
A
Time in ns
10
8
2
0
1
2
3
4
5
Frequency in MHz
S
u
pp
l
y

C
u
r
r
e
nt
in
mA
Note: T = 25 C
Figure 11. Typical I
CC1
vs. Frequency
2.7 V
3.6 V
4
6
12
November 15, 2004
Am29LV320D
37
TEST CONDITIONS
Table 16. Test Specifications
Key To Switching Waveforms
2.7 k
C
L
6.2 k
3.3 V
Device
Under
Test
Note: Diodes are IN3064 or equivalent
Figure 12. Test Setup
Test Condition
90
120
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.03.0
V
Input timing measurement
reference levels
1.5 V
Output timing measurement
reference levels
1.5
V
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don't Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
3.0 V
0.0 V
1.5 V
1.5 V
Output
Measurement Level
Input
Figure 13. Input Waveforms and Measurement Levels
38
Am29LV320D
November 15, 2004
AC CHARACTERISTICS
Read-Only Operations
Notes:
1. Not 100% tested.
2. See
Figure 12, on page 37
and
Table 16, on page 37
for test specifications.
Parameter
Description
Test Setup
Speed
Options
JEDEC
Std.
90
120
Unit
t
AVAV
t
RC
Read Cycle Time (Note 1)
Min
90
120
ns
t
AVQV
t
ACC
Address to Output Delay
CE#, OE# = V
IL
Max
90
120
ns
t
ELQV
t
CE
Chip Enable to Output Delay
OE# = V
IL
Max
90
120
ns
t
GLQV
t
OE
Output Enable to Output Delay
Max
40
50
ns
t
EHQZ
t
DF
Chip Enable to Output High Z (Note 1)
Max
16
ns
t
GHQZ
t
DF
Output Enable to Output High Z (Note 1)
Max
16
ns
t
AXQX
t
OH
Output Hold Time From Addresses, CE# or OE#,
Whichever Occurs First
Min
0
ns
t
OEH
Output Enable Hold Time
(Note 1)
Read
Min
0
ns
Toggle and
Data# Polling
Min
10
ns
t
OH
t
CE
Outputs
WE#
Addresses
CE#
OE#
HIGH Z
Output Valid
HIGH Z
Addresses Stable
t
RC
t
ACC
t
OEH
t
RH
t
OE
t
RH
0 V
RY/BY#
RESET#
t
DF
Figure 14. Read Operation Timings
November 15, 2004
Am29LV320D
39
AC CHARACTERISTICS
Hardware Reset (RESET#)
Note: Not 100% tested.
Parameter
Description
All Speed Options
Unit
JEDEC
Std
t
Ready
RESET# Pin Low (During Embedded Algorithms) to
Read Mode (See Note)
Max
20
s
t
Ready
RESET# Pin Low (NOT During Embedded
Algorithms) to Read Mode (See Note)
Max
500
ns
t
RP
RESET# Pulse Width
Min
500
ns
t
RH
Reset High Time Before Read (See Note)
Min
50
ns
t
RPD
RESET# Low to Standby Mode
Min
20
s
t
RB
RY/BY# Recovery Time
Min
0
ns
RESET#
RY/BY#
RY/BY#
t
RP
t
Ready
Reset Timings NOT during Embedded Algorithms
t
Ready
CE#, OE#
t
RH
CE#, OE#
Reset Timings during Embedded Algorithms
RESET#
t
RP
t
RB
tRH
Figure 15. Reset Timings
40
Am29LV320D
November 15, 2004
AC CHARACTERISTICS
Word/Byte Configuration (BYTE#)
Parameter
90
120
JEDEC
Std.
Description
Unit
t
ELFL/
t
ELFH
CE# to BYTE# Switching Low or High
Max
5
ns
t
FLQZ
BYTE# Switching Low to Output HIGH Z
Max
16
ns
t
FHQV
BYTE# Switching High to Output Active
Min
90
120
ns
DQ15
Output
Data
Output
CE#
OE#
BYTE#
t
ELFL
DQ0DQ14
Data Output
(DQ0DQ14)
DQ15/A-1
Address
Input
t
FLQZ
BYTE#
Switchin
g from
word to
byte
mode
DQ15
Output
Data
Output
BYTE#
t
ELFH
DQ0DQ14
Data Output
(DQ0DQ14)
DQ15/A-1
Address
Input
t
FHQ
BYTE#
Switchin
g from
byte to
word
mode
Figure 16. BYTE# Timings for Read Operations
Note: Refer to the Erase/Program Operations table for t
AS
and t
AH
specifications.
Figure 17. BYTE# Timings for Write Operations
CE#
WE#
BYTE#
The falling edge of the last WE#
t
HOLD
(t
AH
)
t
SET
(t
AS
)
November 15, 2004
Am29LV320D
41
AC CHARACTERISTICS
Erase and Program Operations
Notes:
1. Not 100% tested.
2. See
"Erase And Programming Performance" on page 50
for more information.
Parameter
90
120
JEDEC
Std.
Description
Unit
t
AVAV
t
WC
Write Cycle Time (Note 1)
Min
90
120
ns
t
AVWL
t
AS
Address Setup Time
Min
0
ns
t
ASO
Address Setup Time to OE# low during toggle bit polling
Min
15
ns
t
WLAX
t
AH
Address Hold Time
Min
45
50
ns
t
AHT
Address Hold Time From CE# or OE# high
during toggle bit polling
Min
0
ns
t
DVWH
t
DS
Data Setup Time
Min
45
50
ns
t
WHDX
t
DH
Data Hold Time
Min
0
ns
t
OEPH
Output Enable High during toggle bit polling
Min
20
ns
t
GHWL
t
GHWL
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
t
ELWL
t
CS
CE# Setup Time
Min
0
ns
t
WHEH
t
CH
CE# Hold Time
Min
0
ns
t
WLWH
t
WP
Write Pulse Width
Min
35
50
ns
t
WHDL
t
WPH
Write Pulse Width High
Min
30
ns
t
SR/W
Latency Between Read and Write Operations
Min
0
ns
t
WHWH1
t
WHWH1
Programming Operation (Note 2)
Byte
Typ
9
s
Word
Typ
11
t
WHWH1
t
WHWH1
Accelerated Programming Operation,
Word or Byte (Note 2)
Typ
7
s
t
WHWH2
t
WHWH2
Sector Erase Operation (Note 2)
Typ
0.7
sec
t
VCS
V
CC
Setup Time (Note 1)
Min
50
s
t
RB
Write Recovery Time from RY/BY#
Min
0
ns
t
BUSY
Program/Erase Valid to RY/BY# Delay
Max
90
ns
42
Am29LV320D
November 15, 2004
AC CHARACTERISTICS
OE#
WE#
CE#
V
CC
Data
Addresses
t
DS
t
AH
t
DH
t
WP
PD
t
WHWH1
t
WC
t
AS
t
WPH
t
VCS
555h
PA
PA
Read Status Data (last two cycles)
A0h
t
CS
Status
D
OUT
Program Command Sequence (last two cycles)
RY/BY#
t
RB
t
BUSY
t
CH
PA
Notes:
1. PA = program address, PD = program data, D
OUT
is the true data at the program address.
2. Illustration shows device in word mode.
Figure 18. Program Operation Timings
November 15, 2004
Am29LV320D
43
AC CHARACTERISTICS
OE#
CE#
Addresses
V
CC
WE#
Data
2AAh
SA
t
AH
t
WP
t
WC
t
AS
t
WPH
555h for chip erase
10 for Chip Erase
30h
t
DS
t
VCS
t
CS
t
DH
55h
t
CH
In
Progress
Complete
t
WHWH2
VA
VA
Erase Command Sequence (last two cycles)
Read Status Data
RY/BY#
t
RB
t
BUSY
Notes:
1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see
"Write Operation
Status" on page 30
).
2. These waveforms are for the word mode.
Figure 19. Chip/Sector Erase Operation Timings
44
Am29LV320D
November 15, 2004
AC CHARACTERISTICS
WE#
CE#
OE#
High Z
t
OE
High Z
DQ7
DQ0DQ6
RY/BY#
t
BUSY
Complement
True
Addresses
VA
t
OEH
t
CE
t
CH
t
OH
t
DF
VA
VA
Status Data
Complement
Status Data
True
Valid Data
Valid Data
t
ACC
t
RC
Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle,
and array data read cycle.
Figure 20. Data# Polling Timings (During Embedded Algorithms)
November 15, 2004
Am29LV320D
45
AC CHARACTERISTICS
OE#
CE#
WE#
Addresses
t
OEH
t
DH
t
AHT
t
ASO
t
OEPH
t
OE
Valid Data
(first read)
(second read)
(stops toggling)
t
CEPH
t
AHT
t
AS
DQ6/DQ2
Valid Data
Valid
Status
Valid
Status
Valid
Status
RY/BY#
Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command
sequence, last status read cycle, and array data read cycle
Figure 21. Toggle Bit Timings (During Embedded Algorithms)
Note: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE#
or CE# to toggle DQ2 and DQ6.
Figure 22. DQ2 vs. DQ6
Enter
Erase
Erase
Erase
Enter Erase
Suspend Program
Erase Suspend
Read
Erase Suspend
Read
Erase
WE#
DQ6
DQ2
Erase
Complete
Erase
Suspend
Suspend
Program
Resume
Embedded
Erasing
46
Am29LV320D
November 15, 2004
AC CHARACTERISTICS
Temporary Sector Unprotect
Note: Not 100% tested.
Figure 24. Accelerated Program Timing Diagram
Parameter
All Speed Options
JEDEC
Std.
Description
Unit
t
VIDR
V
ID
Rise and Fall Time (See Note)
Min
500
ns
t
VHH
V
HH
Rise and Fall Time (See Note)
Min
250
ns
t
RSP
RESET# Setup Time for Temporary Sector
Unprotect
Min
4
s
t
RRB
RESET# Hold Time from RY/BY# High for
Temporary Sector Unprotect
Min
4
s
RESET#
t
VIDR
V
ID
V
SS
, V
IL
,
or V
IH
V
ID
V
SS
, V
IL
,
or V
IH
CE#
WE#
RY/BY#
t
VIDR
t
RSP
Program or Erase Command Sequence
t
RRB
Figure 23. Temporary Sector Unprotect Timing Diagram
WP#/ACC
t
VHH
V
HH
V
IL
or V
IH
V
IL
or V
IH
t
VHH
November 15, 2004
Am29LV320D
47
AC CHARACTERISTICS
Sector/Sector Block Protect: 150 s,
Sector/Sector Block Unprotect: 15 ms
1 s
RESET#
SA, A6,
A1, A0
Data
CE#
WE#
OE#
60h
60h
40h
Valid*
Valid*
Valid*
Status
Sector/Sector Block Protect or Unprotect
Verify
V
ID
V
IH
* For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0.
Figure 25. Sector/Sector Block Protect and
Unprotect Timing Diagram
48
Am29LV320D
November 15, 2004
AC CHARACTERISTICS
Alternate CE# Controlled Erase and Program Operations
Notes:
1. Not 100% tested.
2. See
"Erase And Programming Performance" on page 50
for more information.
Parameter
90
120
JEDEC
Std.
Description
Unit
t
AVAV
t
WC
Write Cycle Time (Note 1)
Min
90
120
ns
t
AVWL
t
AS
Address Setup Time
Min
0
ns
t
ELAX
t
AH
Address Hold Time
Min
45
50
ns
t
DVEH
t
DS
Data Setup Time
Min
45
50
ns
t
EHDX
t
DH
Data Hold Time
Min
0
ns
t
GHEL
t
GHEL
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
t
WLEL
t
WS
WE# Setup Time
Min
0
ns
t
EHWH
t
WH
WE# Hold Time
Min
0
ns
t
ELEH
t
CP
CE# Pulse Width
Min
45
50
ns
t
EHEL
t
CPH
CE# Pulse Width High
Min
30
ns
t
WHWH1
t
WHWH1
Programming Operation
(Note 2)
Byte
Typ
9
s
Word
Typ
11
t
WHWH1
t
WHWH1
Accelerated Programming Operation,
Word or Byte (Note 2)
Typ
7
s
t
WHWH2
t
WHWH2
Sector Erase Operation (Note 2)
Typ
0.7
sec
November 15, 2004
Am29LV320D
49
AC CHARACTERISTICS
t
GHEL
t
WS
OE#
CE#
WE#
RESET#
t
DS
Data
t
AH
Addresses
t
DH
t
CP
DQ7#
D
OUT
t
WC
t
AS
t
CPH
PA
Data# Polling
A0 for program
55 for erase
t
RH
t
WHWH1 or 2
RY/BY#
t
WH
PD for program
30 for sector erase
10 for chip erase
555 for program
2AA for erase
PA for program
SA for sector erase
555 for chip erase
t
BUSY
Notes:
1. Figure indicates last two bus cycles of a program or erase operation.
2. PA = program address, SA = sector address, PD = program data.
3. DQ7# is the complement of the data written to the device. D
OUT
is the data written to the device.
4. Waveforms are for the word mode.
Figure 26. Alternate CE# Controlled Write (Erase/Program) Operation Timings
50
Am29LV320D
November 15, 2004
ERASE AND PROGRAMMING PERFORMANCE
Notes:
1. Typical program and erase times assume the following conditions: 25
C, 3.0 V V
CC
, 1,000,000 cycles.
Additionally, programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90C, V
CC
= 2.7 V, 1,000,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since
most bytes program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before
erasure.
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program
command. See
Table 14, on page 29
for further information on command definitions.
6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles.
LATCHUP CHARACTERISTICS
Note: Includes all pins except V
CC
. Test conditions: V
CC
= 3.0 V, one pin at a time.
TSOP AND BGA PACKAGE CAPACITANCE
Notes:
1. Sampled, not 100% tested.
2. Test conditions T
A
= 25C, f = 1.0 MHz.
DATA RETENTION
Parameter
Typ (Note 1) Max (Note 2)
Unit
Comments
Sector Erase Time
0.7
15
sec
Excludes 00h programming
prior to erasure (Note 4)
Chip Erase Time
50
sec
Byte Program Time
9
300
s
Excludes system level
overhead (Note 5)
Word Program Time
11
360
s
Accelerated Byte/Word Program Time
7
210
s
Chip Program Time
(Note 3)
Byte Mode
36
108
sec
Word Mode
24
72
Description
Min
Max
Input voltage with respect to V
SS
on all pins except I/O pins
(including A9, OE#, and RESET#)
1.0 V
12.5 V
Input voltage with respect to V
SS
on all I/O pins
1.0 V
V
CC
+ 1.0 V
V
CC
Current
100 mA
+100 mA
Parameter Symbol
Parameter Description
Test Setup
Typ
Max
Unit
C
IN
Input Capacitance
V
IN
= 0
TSOP
6
7.5
pF
Fine-pitch BGA
4.2
5.0
pF
C
OUT
Output Capacitance
V
OUT
= 0
TSOP
8.5
12
pF
Fine-pitch BGA
5.4
6.5
pF
C
IN2
Control Pin Capacitance
V
IN
= 0
TSOP
7.5
9
pF
Fine-pitch BGA
3.9
4.7
pF
Parameter Description
Test Conditions
Min
Unit
Minimum Pattern Data Retention Time
150C
10
Years
125C
20
Years
November 15, 2004
Am29LV320D
51
PHYSICAL DIMENSIONS
FBD048--48-ball Fine-Pitch Ball Grid Array (FBGA)
6 x 12 mm package
Dwg rev AF; 1/2000
xFBD 048
6.00 mm x 12.00 mm
PACKAGE
1.20
0.20
0.84
0.94
12.00 BSC
6.00 BSC
5.60 BSC
4.00 BSC
8
6
48
0.25
0.30 0.35
0.80 BSC
0.40 BSC
52
Am29LV320D
November 15, 2004
PHYSICAL DIMENSIONS
TS 048--48-Pin Standard TSOP
Dwg rev AA; 10/99
November 15, 2004
Am29LV320D
53
REVISION SUMMARY
Revision A (November 1, 2000)
Initial release.
Revision A+1 (January 23, 2001)
Ordering Information
Corrected FBGA part number table to include
bottom boot part numbers.
Revision A+2 (February 1, 2001)
Connection Diagrams
Corrected FBGA ball matrix.
Revision A+3 (July 2, 2001)
Global
Changed data sheet status from Advance Infor-
mation to Preliminary.
Table 3
, Top Boot SecSi
TM
Sector Addresses
Corrected sector block size for SA60SA62 to
3x64.
Sector/Sector Block Protection and
Unprotection
Noted that sectors are erased in parallel.
SecSi
TM
Sector (Secured Silicon) Flash Memory
Region
Noted changes for upcoming versions of these
devices: reduced SecSi Sector size, different
ESN location for top boot devices, and deletion
of SecSi Sector erase functionality. Current ver-
sions of these devices remain unaffected.
Revision B (July 12, 2002)
Global
Deleted Preliminary status from document.
Ordering Information
Deleted burn-in option.
Table 1
, Am29LV320D Device Bus Operations
In the legend, corrected V
HH
maximum voltage
to 12.5 V.
SecSi
TM
Sector (Secured Silicon) Flash Memory
Region
Added description of SecSi Sector protection
verification.
Autoselect Command Sequence
Clarified description of function.
Table 14
, Am29LV320D Command Definitions
Corrected autoselect codes for SecSi Sector
Factory Protect.
Erase and Program Operations table
Corrected to indicate t
BUSY
specification is a
maximum value.
Revision B+1 (July 30, 2002)
Figure 3
, SecSi Sector Protect Verify
Deleted fifth block in flowchart and modified
text in fourth block.
Revision C (October 25, 2002)
Distinctive Characteristics
Changed endurance from "write" to "erase" cy-
cles.
Connection Diagrams
Deleted ultrasonic reference and added pack-
age types to special package handling text.
Ordering Information
Added commercial temperature range and re-
moved extended temperature range.
SecSi Sector Flash Memory Region
Customer Lockable subsection: Deleted refer-
ence to alternate method of sector protection.
Command Definitions
Noted the following:
Autoselect, SecSi Sector, and CFI functions are
not available during a program or erase opera-
tion.
ACC and unlock bypass modes are not available
when the SecSi Sector is enabled.
Writing incorrect data or commands may place
the device in an unknown state. A reset com-
mand is then required.
AC Characteristics
Read-only Operations; Word/Byte Configura-
tion: Changed t
DF
and t
FLQZ
to 16 ns for all
speed options.
DC Characteristics
Deleted I
ACC
and added I
LR
specifications from
table.
TSOP, SO, and BGA Package Capacitance
Added BGA capacitance to table.
54
Am29LV320D
November 15, 2004
Revision C+1 (February 16, 2003)
Distinctive Characteristics
Added reference to MirrorBit in Secured Silicon
section.
Added Sector Architecture section.
SecSi Sector Flash Memory Region
Referenced MirrorBit for an example in last sen-
tence of first paragraph.
Command Definitions
Changed the first address of the Unlock Bypass
Reset from BA to XXX.
Erase and Programming Performance
Corrected the Sector Erase Time Typical to 0.7.
Revision C+2 (April 4, 2003)
Distinctive Characteristics
Clarified reference to MirrorBit in Secured Sili-
con section.
SecSi Sector Flash Memory Region
Clarified reference of MirrorBit for an example
in last sentence of first paragraph.
Revision C+3 (September 19, 2003)
Valid Combinations
Added the 90R package to table.
Revision C+4 (April 5, 2004)
Command Definitions
Changed first address data for Erase Sus-
pend/Resume from BA to XXX.
Revision C+5 (June 4, 2004)
Ordering Information
Added Lead-free (Pb-free) options to the tem-
perature ranges breakout table and valid com-
binations table.
Product Selector Guide
Added 90R voltage range.
Revision C+6 (November 15, 2004)
Global
Added Colophon
Updated Trademarks
Added reference links
Ordering Information
Added Automotive In-Cabin temperature range
and associated part numbers in the valid com-
bination table.
Erase and Programming Performance
Updated Chip Erase Time
AC Characteristics
Added t
RH
line to Figure 15.
Erase and Program Operations
C o r r e c t e d S e c to r E ra s e O p e ra t i o n t i m e
(
t
WHWH2)
Alternate CE# Control Erase and Program Operations
C o r r e c t e d S e c to r E ra s e O p e ra t i o n t i m e
(
t
WHWH2)
Command Definitions
Update text in Sector Erase Command Se-
quence paragraph.
November 15, 2004
Am29LV320D
55
Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, includ-
ing without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, de-
veloped and manufactured as contemplated (1) for
any
use
that includes
fatal risks or dangers that, unless extremely high
safety is secured, could have a serious effect to the public, and could lead directly to death, personal injury, severe physical
damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport
control, medical life support system, missile launch control in weapon system), or (2)
for any use where chance of failure is
intolerable
(i.e., submersible repeater and artificial satellite). Please note that Spansion LLC will not be liable
to
you and/or
any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor
devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating
safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current
levels and other abnormal operating conditions. If any products described in this document represent goods or technologies
subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan
, the US Export Adminis-
tration Regulations or the applicable laws of any other country,
the prior authorization by
the respective government entity
will
be required for export of those products.
Trademarks
Copyright 2000
-2004
Advanced Micro Devices, Inc. All rights reserved.
AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.
ExpressFlash is a trademark of Advanced Micro Devices, Inc.
Product names used in this publication are for identification purposes only and may be trademarks of their respective compa-
nies
.