1
0189FEPROM4/03
Features
Fast Read Access Time 70 ns
Low Power CMOS Operation
100
A Max Standby
30 mA Max Active at 5 MHz
JEDEC Standard Packages
32-lead, 600-mil PDIP
32-lead PLCC
32-lead TSOP
5V
10% Supply
High Reliability CMOS Technology
2000V ESD Protection
200 mA Latchup Immunity
RapidTM Programming Algorithm 100 s/Byte (Typical)
CMOS and TTL Compatible Inputs and Outputs
Integrated Product Identification Code
Commercial and Industrial Temperature Ranges
Description
The AT27C040 chip is a low-power, high-performance, 4,194,304-bit one-time pro-
grammable read-only memory (OTP EPROM) organized as 512K by 8 bits. The
AT27C040 requires only one 5V power supply in normal read mode operation. Any
byte can be accessed in less than 70 ns, eliminating the need for speed reducing
WAIT states on high-performance microprocessor systems.
4-Megabit
(512K x 8)
OTP EPROM
AT27C040
PDIP Top View
Pin Configurations
Pin Name
Function
A0 - A18
Addresses
O0 - O7
Outputs
CE
Chip Enable
OE
Output Enable
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
VPP
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
O0
O1
O2
GND
VCC
A18
A17
A14
A13
A8
A9
A11
OE
A10
CE
07
06
05
04
03
TSOP Top View
PLCC Top View
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A11
A9
A8
A13
A14
A17
A18
VCC
VPP
A16
A15
A12
A7
A6
A5
A4
OE
A10
CE
07
06
05
04
03
GND
02
01
O0
A0
A1
A2
A3
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A7
A6
A5
A4
A3
A2
A1
A0
O0
A14
A13
A8
A9
A11
OE
A10
CE
07
4
3
2
1
32
31
30
14
15
16
17
18
19
20
01
02
GND
03
04
05
06
A12
A15
A16
VPP
VCC
A18
A17
2
AT27C040
0189FEPROM4/03
Atmel's scaled CMOS technology provides low active power consumption, and fast program-
ming. Power consumption is typically 8 mA in active mode and less than 10
A in standby
mode.
The AT27C040 is available in a choice of industry standard JEDEC-approved one-time pro-
grammable (OTP) plastic PDIP, PLCC and TSOP packages. The device features two-line
control (CE, OE) to eliminate bus contention in high-speed systems.
Atmel's AT27C040 has additional features to ensure high quality and efficient production use.
The Rapid Programming Algorithm reduces the time required to program the part and guaran-
tees reliable programming. Programming time is typically only 100
s/byte. The Integrated
Product Identification Code electronically identifies the device and manufacturer. This feature
is used by industry standard programming equipment to select the proper programming algo-
rithms and voltages.
Switching
Considerations
Switching between active and standby conditions via the Chip Enable pin may produce tran-
sient voltage excursions. Unless accommodated by the system design, these transients may
exceed datasheet limits, resulting in device non-conformance. At a minimum, a 0.1
F high
frequency, low inherent inductance, ceramic capacitor should be utilized for each device. This
capacitor should be connected between the V
CC
and Ground terminals of the device, as close
to the device as possible. Additionally, to stabilize the supply voltage level on printed circuit
boards with large EPROM arrays, a 4.7
F bulk electrolytic capacitor should be utilized, again
connected between the V
CC
and Ground terminals. This capacitor should be positioned as
close as possible to the point where the power supply is connected to the array.
Block Diagram
3
AT27C040
0189FEPROM4/03
Notes:
1. X can be V
IL
or V
IH
.
2. Refer to Programming Characteristics
3. V
H
= 12.0 0.5V.
4. Two identifier bytes may be selected. All Ai inputs are held low (V
IL
), except A9 which is set to V
H
and A0 which is toggled
low (V
IL
) to select the Manufacturer's Identification byte and high (V
IH
) to select the Device Code byte.
Operating Modes
Mode/Pin
CE
OE
Ai
V
PP
Outputs
Read
V
IL
V
IL
Ai
X
(1)
D
OUT
Output Disable
X
V
IH
X
X
High Z
Standby
V
IH
X
X
X
High Z
Rapid Program
(2)
V
IL
V
IH
Ai
V
PP
D
IN
PGM Verify
X
V
IL
Ai
V
PP
D
OUT
PGM Inhibit
V
IH
V
IH
X
V
PP
High Z
Product Identification
(4)
V
IL
V
IL
A9 = V
H
(3)
A0 = V
IH
or V
IL
A1 - A18 = V
IL
X
Identification Code
Absolute Maximum Ratings*
Temperature Under Bias................................ -55C to +125C
*NOTICE:
Stresses beyond those listed under "Absolute
Maximum Ratings" may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
Storage Temperature ..................................... -65C to +150C
Voltage on Any Pin with
Respect to Ground ............................................-2.0V to +7.0V
Voltage on A9 with
Respect to Ground .........................................-2.0V to +14.0V
V
PP
Supply Voltage with
Respect to Ground ..........................................-2.0V to +14.0V
4
AT27C040
0189FEPROM4/03
Notes:
1. V
CC
must be applied simultaneously or before V
PP
, and removed simultaneously or after V
PP
.
2. V
PP
may be connected directly to V
CC
, except during programming. The supply current would then be the sum of I
CC
and I
PP
.
Note:
1. 2, 3, 4, 5 see AC Waveforms for Read Operation
DC and AC Operating Conditions for Read Operation
AT27C040-70
AT27C040-90
AT27C040-12
AT27C040-15
Operating
Temperature (Case)
Com.
0C - 70C
0C - 70C
0C - 70C
0C - 70C
Ind.
-40C - 85C
-40C - 85C
-40C - 85C
-40C - 85C
V
CC
Power Supply
5V
10%
5V
10%
5V
10%
5V
10%
DC and Operating Characteristics for Read Operation
Symbol
Parameter
Condition
Min
Max
Units
I
LI
Input Load Current
V
IN
= 0V to V
CC
1
A
I
LO
Output Leakage Current
V
OUT
= 0V to V
CC
5
A
I
PP1
(2)
V
PP
(1)
Read/Standby Current
V
PP
= V
CC
10
A
I
SB
V
CC1
(1)
Standby Current
I
SB1
(CMOS), CE = V
CC
0.3V
100
A
I
SB2
(TTL), CE = 2.0 to V
CC
+ 0.5V
1
mA
I
CC
V
CC
Active Current
f = 5 MHz, I
OUT
= 0 mA, CE = V
IL
30
mA
V
IL
Input Low Voltage
-0.6
0.8
V
V
IH
Input High Voltage
2.0
V
CC
+ 0.5
V
V
OL
Output Low Voltage
I
OL
= 2.1 mA
0.4
V
V
OH
Output High Voltage
I
OH
= -400
A
2.4
V
AC Characteristics for Read Operation
Symbol
Parameter
Condition
AT27C040
Units
-70
-90
-12
-15
Min
Max
Min
Max
Min
Max
Min
Max
t
ACC
(3)
Address to Output Delay
CE = OE
= V
IL
70
90
120
150
ns
t
CE
(2)
CE to Output Delay
OE = V
IL
70
90
120
150
ns
t
OE
(2)(3)
OE to Output Delay
CE = V
IL
30
35
35
40
ns
t
DF
(4)(5)
OE or CE High to Output Float, whichever
occurred first
20
20
30
30
ns
t
OH
Output Hold from Address, CE or OE,
whichever occurred first
0
0
0
0
ns
5
AT27C040
0189FEPROM4/03
AC Waveforms for Read Operation
(1)
Notes:
1. Timing measurement references are 0.8V and 2.0V. Input AC drive levels are 0.45V and 2.4V, unless otherwise specified.
2. OE may be delayed up to t
CE
- t
OE
after the falling edge of CE without impact on t
CE
.
3. OE may be delayed up to t
ACC
- t
OE
after the address is valid without impact on t
ACC
.
4. This parameter is only sampled and is not 100% tested.
5. Output float is defined as the point when data is no longer driven.
Input Test Waveforms and Measurement Levels
Output Test Load
Note:
1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
OUTPUT
PIN
1.3V
(1N914)
3.3K
CL
Pin Capacitance
f = 1 MHz, T = 25
C
(1)
Symbol
Typ
Max
Units
Conditions
C
IN
4
8
pF
V
IN
= 0V
C
OUT
8
12
pF
V
OUT
= 0V
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