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Электронный компонент: QSE243

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EMITTER
0.174 (4.44)
0.060 (1.50)
0.030 (0.76)
0.047 (1.20)
0.177 (4.51)
0.224 (5.71)
0.5 (12.7)
MIN
0.020 (0.51)
SQ. (2X)
0.060 (1.52)
0.100 (2.54)
R 0.030 (0.76)
PACKAGE DIMENSIONS
NOTES:
1. Dimensions for all drawings are in inches (millimeters).
2. Tolerance of .010 (.25) on all non nominal dimensions
unless otherwise specified.
FEATURES
NPN Silicon Phototransistor with internal base-emitter resistance
Package Type: Sidelooker
Medium Reception Angle, 50
Clear Plastic Package
Matching Emitter: QEE213
Collector
Emitter
SCHEMATIC
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LOW LIGHT REJECTION PLASTIC SILICON
INFRARED PHOTOTRANSISTOR
QSE243
2001 Fairchild Semiconductor Corporation
DS300288
9/20/01
1 OF 3
www.fairchildsemi.com
DESCRIPTION
The QSE243 is a silicon phototransistor with low light level rejection, encapsulated in a medium angle, thin clear plastic sidelooker package.
Parameter
Symbol
Rating
Unit
Operating Temperature
T
OPR
-40 to + 100
C
Storage Temperature
T
STG
-40 to + 100
C
Soldering Temperature (Iron)
(2,3,4)
T
SOL-I
240 for 5 sec
C
Soldering Temperature (Flow)
(2,3)
T
SOL-F
260 for 10 sec
C
Collector-Emitter Voltage
V
CE
30
V
Emitter-Collector Voltage
V
EC
5
V
Power Dissipation
(1)
P
D
100
mW
ABSOLUTE MAXIMUM RATINGS
(T
A
= 25C unless otherwise specified)
NOTES
1. Derate power dissipation linearly 1.33 mW/C above 25C.
2. RMA flux is recommended.
3. Methanol or isopropyl alcohols are recommended as cleaning agents.
4. Soldering iron
1/16"
(1.6 mm) minimum from housing.
5. = 950 nm, GaAs source
6. The slope is defined by (I
C1
-I
C2
) / (E
C1
-E
C2
) where I
C1
is the collector current at E
e1
and I
C2
the collector current at E
e2
.
7. Knee point is defined as being required to increase I
C
to 50 A.
LOW LIGHT REJECTION PLASTIC SILICON
INFRARED PHOTOTRANSISTOR
QSE243
Parameter
Test Conditions
Symbol
Min
Typ
Max
Units
Peak Sensitivity
PS
--
880
--
nm
Reception Angle
--
25
--
Deg.
Collector Emitter Dark Current
V
CE
= 15 V, E
e
= 0
I
D
--
--
100
nA
Collector Emitter Breakdown
I
C
= 100 A
BV
CEO
30
--
--
V
Saturation Voltage
E
e
= 1 mW/cm2
V
CE (sat)
--
--
0.4
V
I
C
= 0.1 mA
(5)
Rise Time
V
CC
= 5 V, R
L
= 1000 V
t
r
--
15
--
s
Fall Time
I
C
= 1 mA
t
f
--
15
--
s
Light Current Slope
(6)
V
CE
= 5 V, E
e
1 = 1 mW/cm2
(5)
I
LS
1.0
mA/mW/cm2
E
e
2 = 0.5 mW/cm2
(5)
Knee Point
(5,7)
V
CE
= 5 V
E
ek
0.125
mW/cm2
ELECTRICAL / OPTICAL CHARACTERISTICS
(T
A
=25C)
www.fairchildsemi.com
2 OF 3
9/20/01
DS300288
LOW LIGHT REJECTION PLASTIC SILICON
INFRARED PHOTOTRANSISTOR
QSE243
DS300288
9/20/01
3 OF 3
www.fairchildsemi.com
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED
HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF
OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical
implant into the body,or (b) support or sustain life,
and (c) whose failure to perform when properly
used in accordance with instructions for use provided
in labeling, can be reasonably expected to result in a
significant injury of the user.
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.