HN27C4000G Series

524288-Word

8-Bit/262144-Word

16-Bit

CMOS UV Erasable and Programmable ROM

Rev. 1

Nov. 10, 1994

The Hitachi HN27C4000 is a 4-Mbit UV erasable
and electrically programmable ROM that is
organized either as 524288-word

8 bit or as

262144-word

16 bit, featuring extra-high speed

burst mode that gives two times faster 4-word or 8-
byte serial access than normal. And also high
speed and fast programming are served as well as
the existing Hitachi 4M device HN27C4096 and
HN27C4001. Fabricated on advanced fine process
and high speed circuitry technique, HN27C4000
makes high speed access time and low power
dissipation in either active or stand-by mode.
Therefore, it is suitable for all systems featuring
high speed microprocessor such as the 80386,
80486, 68030, 68040 and so on.

Features

· Organization: 524288-word

8-bit/262144-

word

16-bit (

BYTE/V

enables

selection byte-wide or word-wide)

· High speed: Access time 100 ns/120 ns/150 ns

(max)
Burst access time 50 ns/60 ns/60 ns
(max)

· Low power dissipation:

Standby mode; 5 µW (typ),
Active mode; 150 mW/MHz (typ)

· Fast high reliability page programming, fast

high-reliability programming and option
programming: Program voltage; +12.5 V DC

Program time; 3.5 sec (min)
(Theoretical in Page
programming)

· Inputs and outputs TTL compatible during both

read and program modes

· Pin arrangement: 40-pin EIAJ standard pin

compatible with HN62414/
HN62434

· Device identifier mode: Manufacturer code and

device code

ADE-203-311A (Z)

Pin Arrangement

HN27C4000G Series

A17

I/O0

I/O8

I/O1

I/O9

I/O2

I/O10

I/O3

I/O11

A10

A11

A12

A13

A14

A15

A16

BYTE/V

I/O15/A-1

I/O7

I/O14

I/O6

I/O13

I/O5

I/O12

I/O4

HN27C4000G Series

(Top view)

Ordering Information

Access

Type No.

time

Package

HN27C4000G-10

100 ns

600-mil

HN27C4000G-12

120 ns

40-pin cerdip

HN27C4000G-15

150 ns

(DG-40A)

Pin Description

Pin name

Function

A0 A17

Address

I/O0 I/O14

Input/output

I/O15/A-1

Input/output/address

Chip enable

Output enable

Power supply

BYTE

Byte/word selection/
Programming power supply

Ground

Block Diagram

Mode Selection

Pin

BYTE

I/O0 I/O7, I/O8 I/O14, I/O15/A-1

Mode

DG-40A

(10)

(12)

(39)

(31)

(21)

(13 20,

22 28,

29)

Read (X16 bit)

Dout

Read (X8 bit)

Dout

High-Z

Output disable (X16 bit)

High-Z

Output disable (X8 bit)

High-Z

HN27C4000G Series

I/O0

I/O15

X-
Decoder

2,048 x 2,048
Memory Matrix

Y-Decoder

Input
Data
Control

Y-Gating

A0 A6

: High threshold inverter

A17

. . . . . . . . . . . . .

Mode Selection (cont)

Pin

BYTE

I/O0 I/O7, I/O8 I/O14, I/O15/A-1

Mode

DG-40A

(10)

(12)

(39)

(31)

(21)

(13 20,

22 28,

29)

Standby

High-Z

Page Page program set

High-Z

prog.

Page data latch

Din

Page program

High-Z

Page program verify V

Dout

Page program reset V

High-Z

Word Program

Din

prog.

Program verify

Dout

Optional verify

Dout

Program inhibit

High-Z

Identifier

Code

Notes: 1. X: Don't care.

2. V

: 12.0 V ± 0.5 V

Absolute Maximum Ratings

Item

Symbol

Value

Unit

All input and output voltages

Vin, Vout

0.6

to +7.0

Voltage on pin A9 and

0.6

to +13.0

voltage

0.6 to +13.5

voltage

0.6 to +7.0

Operating temperature range

Topr

0 to +70

°C

Storage temperature range

Tstg

65 to +125

°C

Storage temperature under bias

Tbias

20 to +80

°C

Notes: 1. Relative to V

2. Vin, Vout, V

min = 2.0 V for pulse width

20 ns

3. Storage temperature range of device before programming.

HN27C4000G Series

Capacitance (Ta = 25°C, f = 1 MHz)

Item

Symbol

Min

Typ

Max

Unit

Test conditions

Notes

Input capacitance

Cin

Vin = 0 V

Except

BYTE

Output capacitance

Cout

Vout = 0 V

Read Operation

DC Characteristics (V

= 5 V ± 10%, V

= V

to V

, Ta = 0 to +70°C)

Item

Symbol

Min

Typ

Max

Unit

Test conditions

Input leakage current

µA

Vin = 5.5 V

Output leakage current

µA

Vout = 5.5 V/0.45 V

current

PP1

µA

= 5.5 V

Standby V

current

SB1

= V

SB2

µA

= V

± 0.3 V

Operating V

current

CC1

Iout = 0 mA, f = 1 MHz

CC2

120

Iout = 0 mA, f = 10 MHz

Input voltage

0.3

0.8

2.2

+ 1

Output voltage

0.45

= 2.1 mA

2.4

= 400 µA

Notes: 1. V

min = 1.0 V for pulse width

50 ns

min = 2.0 V for pulse width

20 ns

2. V

max = V

+1.5 V for pulse width

20 ns

If V

is over the specified maximum value, read operation cannot be guaranteed.

HN27C4000G Series

AC Characteristics (V

= 5 V ± 10%, V

= V

to V

, Ta = 0 to +70°C)

Test Conditions

· Input pulse levels: 0.45 to 2.4 V
· Input rise and fall times:

10 ns

· Output load: 1 TTL gate +100 pF
· Reference levels for measuring timing: 0.8 V, 2.0 V

HN27C4000 HN27C4000 HN27C4000
-10

-12

-15

Item

Symbol

Min

Max

Min

Max

Min

Max

Unit

Test conditions

Address to output delay

ACC

100

120

150

= V

to output delay

100

120

150

= V

to output delay

= V

Burst address to

BAC

= V

output delay

high to output float

= V

Address to output hold

= V

Note:

1. t

is defined as the time at which the output achieves the open circuit condition and data is no

longer driven.

Read Timing Waveform

HN27C4000G Series

Address

Data Out

Data Out Valid

ACC

Standby mode

Active mode

Standby mode

In Burst Access mode, fast read-out of 8 byte data
is selected by address A-1, A0, A1. (Valid only for
Read

8 mode)

HN27C4000G Series

tBAC

t CE

t OE

tBAC

Valid

Output

A2 to A17

A-1, A0, A1

Data Out

t ACC

Valid

Output

Valid

Output

Valid

Output

Valid

Output

Valid

Output

Valid

Output

Valid

Output

tBAC

Fast High-Reliability Page
Programming

This device can be applied the high performance
page programming algorithm shown in the
following flowchart. This algorithm allows to
obtain faster programming time without any
voltage stress to the device nor deterioration in
reliability of programmed data.

Page Program Set

Apply 12 V to

OE pin after applying 12.5 V to V

to set a page program mode.

The device operates in a page program mode until
reset.

Page Program Reset

Set V

to V

level or less to reset a page

program mode.

HN27C4000G Series

START

SET PAGE PROG LATCH MODE

V = 12.5 ± 0.3 V V = 6.25 ± 0.25 V

= 12.0 ± 0.5 V

Address = 0

n = 0

Latch

Address + 1 Address

Latch

Address + 1 Address

Latch

n + 1 n

SET PAGE PROG./VERIFY MODE

V = 12.5 ± 0.3 V V = 6.25 ± 0.25 V

Address + 1 Address

NOGO

YES

NOGO

VERIFY

END

FAIL

READ

all address

n = 10?

LAST

address?

SET READ MODE

V = 5.0 ± 0.5 V V = V

Program t = 50 s ± 5%

YES

Fast High-Reliability Page Programming Flowchart

HN27C4000G Series

DC Characteristics (V

= 6.25 V ± 0.25 V, V

= 12.5 V ± 0.3 V, Ta = 25°C ± 5°C)

Item

Symbol

Min

Typ

Max

Unit

Test conditions

Input leakage current

µA

Vin = 6.5 V/0.45 V

Output voltage during verify

0.45

= 2.1 mA

2.4

= 400 µA

Operating V

current

Input voltage

0.1

0.8

2.2

+ 0.5

11.5

12.0

12.5

supply current

= V

Notes: 1. V

must be applied simultaneously or before V

and removed simultaneously or after V

2. V

must not exceed 13 V including overshoot.

3. An influence may be had upon device reliability if the device is installed or removed while V

12.5 V.

4. Do not alter V

either V

to 12.5 V or 12.5 V to V

when

= low.

5. V

min = 0.6 V for pulse width

20 ns.

6. If V

is over the specified maximum value, programming operation cannot be guaranteed.

HN27C4000G Series

AC Characteristics (V

= 6.25 V ± 0.25 V, V

= 12.5 V ± 0.3 V, Ta = 25°C ± 5°C)

Test Conditions

· Input pulse levels: 0.45 to 2.4 V
· Input rise and fall times:

20 ns

· Reference levels for measuring timing: Inputs; 0.8 V, 2.0 V,

Outputs; 0.8 V, 2.0 V

Item

Symbol

Min

Typ

Max

Unit

Test conditions

Address setup time

µs

setup time

OES

µs

Data setup time

µs

Address hold time

µs

Data hold time

µs

high to output float delay

130

setup time

VPS

µs

setup time

VCS

µs

initial programming

47.5

50.0

52.5

µs

pulse width

setup time

CES

µs

Data valid from

150

pulse width during data latch

µs

= V

setup time

OHS

µs

= V

hold time

OHH

µs

hold time

VRS

µs

Notes: 1. t

is defined as the time at which the output achieves the open circuit condition and data is no

longer driven.

2. Page program mode will be reset when V

is set to V

or less.

HN27C4000G Series

Fast High-Reliability Page Programming Timing Waveform

Program data latch

Page program

Program verify

Data out valid

Data in

stable

Page program mode

VRS

OES

CES

OHH

VCS

VPS

OHS

A2 A17

A0, A1

Data

V + 1.25

Fast High-Reliability Programming

This device can be applied the fast high-reliability
programming algorithm shown in the following
flowchart. This algorithm allows to obtain faster

programming time without any voltage stress to the
device nor deterioration in reliability of
programmed data.

HN27C4000G Series

NOGO

START

Address = 0

n = 0

n + 1 n

SET PROG./VERIFY MODE

V = 12.5 ± 0.3 V V = 6.25 ± 0.25 V

Address + 1 Address

YES

NOGO

VERIFY

END

FAIL

READ

all address

n = 10?

LAST

address?

SET READ MODE

V = 5.0 ± 0.5 V V = V

Program t = 50 s ± 5%

YES

Fast High-Reliability Programming Flowchart

HN27C4000G Series

DC Characteristics (V

= 6.25 V ± 0.25 V, V

=12.5 V ± 0.3 V, Ta=25°C ± 5°C)

Item

Symbol

Min

Typ

Max

Unit

Test conditions

Input leakage current

µA

Vin = 6.5 V/0.45 V

supply current

= V

Operating V

current

Input voltage

0.1

0.8

2.2

+ 0.5

Output voltage

0.45

= 2.1 mA

2.4

= 400 µA

Notes: 1. V

must be applied simultaneously or before V

and removed simultaneously or after V

2. V

must not exceed 13 V including overshoot.

3. An influence may be had upon device reliability if the device is installed or removed while V

12.5 V.

4. Do not alter V

either V

to 12.5 V or 12.5 V to V

when

= low.

5. V

min = 0.6 V for pulse width

20 ns.

6. If V

is over the specified maximum value, programming operation cannot be guaranteed.

AC Characteristics (V

= 6.25 V ± 0.25 V, V

= 12.5 V ± 0.3 V, Ta = 25°C ± 5°C)

Test Conditions

· Input pulse levels: 0.45 to 2.4 V
· Input rise and fall times:

20 ns

· Reference levels for measuring timings: 0.8 V, 2.0 V

Item

Symbol

Min

Typ

Max

Unit

Test conditions

Address setup time

µs

setup time

OES

µs

Data setup time

µs

Address hold time

µs

Data hold time

µs

to output float delay

130

setup time

VPS

µs

setup time

VCS

µs

initial programming

47.5

50.0

52.5

µs

pulse width

Data valid from

150

Note:

1. t

is defined as the time at which the output achieves the open circuit condition and data is no

longer driven.

Fast High-Reliability Programming Timing Waveform

HN27C4000G Series

Program

Program Verify

Address

Data

Data In Stable

Data Out Valid

VPS

VCS

OES

V +1.25

Optional Page Programming

This device can be applied the optional page
programming algorithm shown in the following
flowchart. This algorithm allows to obtain faster
programming time without any voltage stress to the
device nor deterioration in reliability of
programmed data.

This programming algorithm is the combination of
page programming and word verify. It can avoid

the increase of programming verify time when a
programmer with slow machine cycle is used, and
shorten the total programming time.

Regarding the timing specifications for page
programming and word verify, please refer to the
specifications for fast high-reliability page
programming and fast high-reliability
programming.

HN27C4000G Series

START

SET PAGE PROG LATCH MODE

V = 12.5 ± 0.3 V V = 6.25 ± 0.25 V

= 12.0 ± 0.5 V

Address = 0

Latch

Address + 1 Address

Latch

Address + 1 Address

Latch

n + 1 n

SET PAGE PROG. MODE

V = 12.5 ± 0.3 V V = 6.25 ± 0.25 V

Address + 1 Address

NOGO

YES

NOGO

VERIFY

END

FAIL

READ

all address

n = 10?

LAST

address?

SET READ MODE

V = 5.0 ± 0.5 V V = V

Program t = 50 s ± 5%

SET WORD PROG./VERIFY MODE

V = 12.5 ± 0.3 V V = 6.25 ± 0.25 V

PAGE PROG. RESET

V = V = 6.25 ± 0.25 V

Address = 0

n = 0

Address + 1 Address

Program t = 50 s ± 5%

VERIFY

YES

LAST

all address?

NOGO

YES

Optional Page Programming Flowchart

HN27C4000G Series

DC Characteristics (V

= 6.25 V ± 0.25 V, V

=12.5 V ± 0.3 V, Ta = 25°C ± 5°C)

Item

Symbol

Min

Typ

Max

Unit

Test conditions

Input leakage current

µA

Vin = 6.5 V/0.45 V

Output voltage during verify

0.45

= 2.1 mA

2.4

= 400 µA

Operating V

current

Input voltage

0.1

0.8

2.2

+ 0.5

11.5

12.0

12.5

supply current

= V

Notes: 1. V

must be applied simultaneously or before V

and removed simultaneously or after V

2. V

must not exceed 13 V including overshoot.

3. An influence may be had upon device reliability if the device is installed or removed while V

12.5 V.

4. Do not alter V

either V

to 12.5 V or 12.5 V to V

when

= low.

5. V

min = 0.6 V for pulse width

20 ns.

6. If V

is over the specified maximum value, programming operation cannot be guaranteed.

HN27C4000G Series

AC Characteristics (V

= 6.25 V ± 0.25 V, V

= 12.5 V ± 0.3 V, Ta = 25°C ± 5°C)

Test Conditions

· Input pulse levels: 0.45 to 2.4 V
· Input rise and fall times:

20 ns

· Reference levels for measuring timings: Inputs;

0.8 V, 2.0 V

Outputs; 0.8 V, 2.0 V

Item

Symbol

Min

Typ

Max

Unit

Test conditions

Address setup time

µs

setup time

OES

µs

Data setup time

µs

Address hold time

µs

Data hold time

µs

high to output float delay

130

setup time

VPS

µs

setup time

VCS

µs

initial programming

47.5

50.0

52.5

µs

pulse width

setup time

CES

µs

Data valid from

150

pulse width during data latch

µs

= V

setup time

OHS

µs

= V

hold time

OHH

µs

Page programming reset time

VLW

µs

hold time

VRS

µs

Notes: 1. t

is defined as the time at which the output achieves the open circuit condition and data is no

longer driven.

2. Page program mode will be reset when V

is set to V

or less.

Option Page Programming Timing Waveform

HN27C4000G Series

Program data latch Page program

Program verify

Page program mode

t LW

OES

tOHH

VCS

VPS

A2 A17

A0, A1

Data

V + 1.25

VIL

VIH

Word program mode

Program

VPS

VRS

VLW

t CES

t PW

OHS

Data in

stable

Data

out

valid

Data in stable

HN27C4000G Series

Erase

Erasure of this device is performed by exposure to
ultraviolet light of 2537 Å and all the output data
are changed to "1" after this erasure procedure.
The minimum integrated dose (i.e. UV intensity X
exposure time) for erasure is 15 W·sec/cm

Mode Description

Device Identifier Mode

The device identifier mode allows the reading out
of binary codes that identify manufacturer and type
of device, from outputs of EPROM. By this mode,
the device will be automatically matched its own
corresponding programming algorithm, using
programming equipment.

HN27C4000G Identifier Code

I/O8 I/O15 I/O7

I/O6

I/O5

I/O4

I/O3

I/O2

I/O1

I/O0

Hex

Identifier

DG-40 (9)

(28) (26)

(24)

(22)

(19)

(17)

(15)

(13)

Data

Manufacturer code

Device code

Notes: 1. V

= 5.0 V ± 10%

2. A9 = 12.0 V ± 0.5 V

= V

4. A1 A8, A10 A17: Don't care.

5. X: Don't care.

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