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Электронный компонент: HCTS283MS

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1
TM
HCTS283MS
Radiation Hardened
4 Bit Binary Full Adder with Fast Carry
Pinouts
16 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T16, LEAD FINISH C
TOP VIEW
16 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDIP2-T16, LEAD FINISH C
TOP VIEW
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
S1
B1
A1
S0
A0
B0
GND
CIN
VCC
A2
S2
A3
B3
S3
COUT
B2
S1
B1
A1
S0
A0
B0
CIN
GND
2
3
4
5
6
7
8
1
16
15
14
13
12
11
10
9
VCC
B2
A2
S2
A3
B3
S3
COUT
Features
3 Micron Radiation Hardened CMOS SOS
Total Dose 200K RAD (Si)
SEP Effective LET No Upsets: >100 MEV-cm
2
/mg
Single Event Upset (SEU) Immunity < 2 x 10
-9
Errors/
Bit-Day (Typ)
Dose Rate Survivability: >1 x 10
12
RAD (Si)/s
Dose Rate Upset >10
10
RAD (Si)/s 20ns Pulse
Latch-Up Free Under Any Conditions
Military Temperature Range: -55
o
C to +125
o
C
Significant Power Reduction Compared to LSTTL ICs
DC Operating Voltage Range: 4.5V to 5.5V
LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2V Min
Input Current Levels Ii
5
A at VOL, VOH
Description
The Intersil HCTS283MS is a Radiation Hardened 4 bit
binary full adder with fast carry that adds two 4 bit binary
numbers and generates a carry-out bit if the sum exceeds 15.
This device can be used in positive or negative logic. When
using positive logic the carry-in input must be tied low, if
there is no carry-in.
The HCTS283MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family .
The HCTS283MS is supplied in a 16 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
September 1995
Spec Number
518641
FN3381.1
Ordering Information
PART NUMBER
TEMPERATURE RANGE
SCREENING LEVEL
PACKAGE
HCTS283DMSR
-55
o
C to +125
o
C
Intersil Class S Equivalent
16 Lead SBDIP
HCTS283KMSR
-55
o
C to +125
o
C
Intersil Class S Equivalent
16 Lead Ceramic Flatpack
HCTS283D/Sample
+25
o
C
Sample
16 Lead SBDIP
HCTS283K/Sample
+25
o
C
Sample
16 Lead Ceramic Flatpack
HCTS283HMSR
+25
o
C
Die
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143
|
Intersil (and design) is a trademark of Intersil Americas Inc.
Copyright Intersil Americas Inc. 2002. All Rights Reserved
2
HCTS283MS
Functional Diagram
9
COUT
10
S3
13
S2
1
S1
4
S0
A3
12
B3
11
B2
15
A2
14
B1
2
A1
3
B0
6
A0
5
CIN
7
GND
8
VCC
16
Spec Number
518641
3
Specifications HCTS283MS
Absolute Maximum Ratings
Reliability Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input
. . . . . . . . . . . . . . . . . . . . . . . .
10mA
DC Drain Current, Any One Output
. . . . . . . . . . . . . . . . . . . . . . .
25mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG) . . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . . +265
o
C
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175
o
C
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Resistance
JA
JC
SBDIP Package. . . . . . . . . . . . . . . . . . . .
73
o
C/W
24
o
C/W
Ceramic Flatpack Package . . . . . . . . . . .
114
o
C/W
29
o
C/W
Maximum Package Power Dissipation at +125
o
C Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.68W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.44W
If device power exceeds package dissipation capability, provide
heat sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13.7mW/
o
C
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . 8.8mW/
o
C
CAUTION: As with all semiconductors, stress listed under "Absolute Maximum Ratings" may be applied to devices (one at a time) without resulting in permanent
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed
under "Electrical Performance Characteristics" are the only conditions recommended for satisfactory device operation.
Operating Conditions
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range (T
A
) . . . . . . . . . . . . -55
o
C to +125
o
C
Input Rise and Fall Times at 4.5V VCC (TR, TF) . . . . . . 10ns/V Max
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . . . . . . 0.0V to 0.8V
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . . . . . . . 2.0V to VCC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTE 1)
CONDITIONS
GROUP
A SUB-
GROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Quiescent Current
ICC
VCC = 5.5V,
VIN = VCC or GND
1
+25
o
C
-
40
A
2, 3
+125
o
C, -55
o
C
-
750
A
Delta ICC
DICC
VCC = 5.5V, VIN = VCC or
GND, 1 Input at 2.4V
1
+25
o
C
-
1.6
mA
2, 3
+125
o
C, -55
o
C
-
3.2
mA
Output Current
(Sink)
IOL
VCC = 4.5V, VIH = 4.5V,
VOUT = 0.4V, VIL = 0V
(Note 2)
1
+25
o
C
4.8
-
mA
2, 3
+125
o
C, -55
o
C
4.0
-
mA
Output Current
(Source)
IOH
VCC = VIH = 4.5V,
VOUT = VCC - 0.4V,
VIL = 0V (Note 2)
1
+25
o
C
-4.8
-
mA
2, 3
+125
o
C, -55
o
C
-4.0
-
mA
Output Voltage Low
VOL
VCC = 4.5V, VIH = 2.25V,
IOL = 50
A, VIL = 0.8V
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
-
0.1
V
VCC = 5.5V, VIH = 2.75V,
IOL = 50
A, VIL = 0.80V
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V, VIH = 2.25V,
IOH = -50
A, VIL = 0.8V
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
VCC
-0.1
-
V
VCC = 5.5V, VIH = 2.75V,
IOH = -50
A, VIL = 0.80V
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
VCC
-0.1
-
V
Input Leakage
Current
IIN
VCC = 5.5V, VIN = VCC or
GND
1
+25
o
C
-
0.5
A
2, 3
+125
o
C, -55
o
C
-
5.0
A
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 2.25V,
VIL = 0.80V (Note 3)
7, 8A, 8B
+25
o
C, +125
o
C, -55
o
C
-
-
-
NOTES:
1. All voltages referenced to device GND.
2. Force/Measure functions may be interchanged.
3. For functional tests VO
4.0V is recognized as a logic "1", and VO
0.5V is recognized as a logic "0".
Spec Number
518641
4
Specifications HCTS283MS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
GROUP
A SUB-
GROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Propagation Delay
CIN to S0
TPLH
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
23
ns
10, 11
+125
o
C, -55
o
C
2
27
ns
TPHL
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
26
ns
10, 11
+125
o
C, -55
o
C
2
30
ns
Propagation Delay
CIN to S1
TPLH
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
27
ns
10, 11
+125
o
C, -55
o
C
2
31
ns
TPHL
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
30
ns
10, 11
+125
o
C, -55
o
C
2
35
ns
Propagation Delay
CIN to S2 CIN to
COUT
TPLH
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
31
ns
10, 11
+125
o
C, -55
o
C
2
37
ns
TPHL
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
34
ns
10, 11
+125
o
C, -55
o
C
2
40
ns
Propagation Delay
CIN to S3
TPLH
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
38
ns
10, 11
+125
o
C, -55
o
C
2
47
ns
TPHL
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
40
ns
10, 11
+125
o
C, -55
o
C
2
48
ns
Propagation Delay
An, Bn to COUT
TPLH
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
53
ns
10, 11
+125
o
C, -55
o
C
2
67
ns
TPHL
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
54
ns
10, 11
+125
o
C, -55
o
C
2
63
ns
Propagation Delay
An, Bn to Sn
TPLH
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
50
ns
10, 11
+125
o
C, -55
o
C
2
63
ns
TPHL
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
60
ns
10, 11
+125
o
C, -55
o
C
2
73
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR = TF = 3ns.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Input Capacitance
CIN
VCC = 5V, VIH = 5V,
VIL = 0V, f = 1MHz
1
+25
o
C
-
10
pF
1
+125
o
C, -55
o
C
-
10
pF
Output Transition
Time
TTHL,
TTLH
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
1
+25
o
C
-
15
ns
1
+125
o
C, -55
o
C
-
22
ns
Capacitance Power
Dissipation
CPD
VCC = 5.5V, f = 1MHz
1
+25
o
C
-
250
pF
1
+125
o
C, -55
o
C
-
315
pF
NOTE:
1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly
tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.
Spec Number
518641
5
Specifications HCTS283MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTES 1)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Quiescent Current
ICC
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
0.75
mA
Delta ICC
DICC
VCC = 5.5V, VIN = VCC or GND,
1 Input at 2.4V
+25
o
C
-
3.2
mA
Output Current (Sink)
IOL
VCC = 4.5V, VIH = 4.5, VOUT = 0.4V,
VIL = 0V
+25
o
C
4.0
-
mA
Output Current
(Source)
IOH
VCC = 4.5V, VIH = 4.5, VOUT = VCC -0.4V
VIL = 0V
+25
o
C
-4.0
-
mA
Output Voltage Low
VOL
VCC = 4.5V, VIH = 2.25V, VIL = 0.80V,
IOL = 50
A
+25
o
C
-
0.1
V
VCC = 5.5V, VIH = 2.75V, VIL = 0.80V,
IOL = 50
A
+25
o
C
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V, VIH = 2.25V, VIL = 0.80V,
IOL = 50
A
+25
o
C
VCC
-0.1
-
V
VCC = 5.5V, VIH = 2.75V, VIL = 0.80V,
IOL = 50
A
+25
o
C
VCC
-0.1
-
V
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
5
A
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 2.25V, VIL = 0.80V,
(Note 2)
+25
o
C
-
-
-
Propgation Delay
CIN to S0
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
27
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
30
ns
Propagation Delay
CIN to S1
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
31
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
35
ns
Propagation Delay
CIN to S2, CIN to COUT
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
37
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
40
ns
Propagation Delay
CIN to S3
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
47
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
48
ns
Propagation Delay
An, Bn to COUT
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
67
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
63
ns
Propagation Delay
An, Bn to Sn
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
63
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
73
ns
NOTES:
1. All voltages referenced to device GND.
2. For functional tests VO
4.0V is recognized as a logic "1", and VO
0.5V is recognized as a logic "0".
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12
A
IOL/IOH
5
-15% of 0 Hour
Spec Number
518641