DESCRIPTION
VEHICLE
READPOINT
REV DATE CODE
CONDITION
QUANTITY
FAILS FILE #
Reliability Report:
Process:
1P, 1M, 5.0um, 30V NF & PF, UVNd, UVPd ,N+ESD,TEOS Spacer,
Passivation w/Nov TEOS Oxide-Nitride
Metal:
Al / 0.5% Cu / 0.8% Si
Summary Data with Chi-Square Distribution Assumed.
Stress Ambient Temperature and Voltage to
Field Ambient Temperature And Voltage
Cf:
60%
Ea:
0.7
:
0
Gate Ox Thickness:
225
DS1808
DEVICE HRS
Tuse:
25
Vuse:
5.5
C
Volts
Assembly:
ATP (Amkor, PI)
Package:
SOIC
Pin Count:
16
Body Size:
150x1.4
HIGH TEMPERATURE OPERATING LIFE
DS1808
6
A2
0133
125C, 6.0 V (PSA) & +13.2 V (PS
80
0
452720
HIGH VOLTAGE LIFE
HOURS
DS1808
336
A2
0133
125C, 6.0 V (PSA) & +13.2 V (PS
80
0
24899612
HOURS
TOTALS:
2.54E+07
0
36
FAILURE RATE
DEVICE HRS:
3158
MTBF (yrs):
FITs:
PRODUCT
REV
DIE SIZE (x)
No. of Transistors
DIE SIZE (y)
159
A2
1700
DS1808
80
Thursday, May 16, 2002
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