SCOPE: +8V-CHANNEL/DUAL 4-CHANNEL MONOLITHIC CMOS, ANALOG MULTIPLEXER
Device Type Generic Number
01
MAX358M(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835 Case Outline Package Code
MAXIM SMD
JE
E
GDIP1-T16 or CDIP2-T16 16 LEAD CERDIP J16
LP 2 CQCC1-N20 20-Pin Ceramic LCC L20
Absolute Maximum Ratings
Voltage Referenced to V
-
V
+
to V
-
............................................................................................................................... 40V
V
+
to GND .......................................................................................................................... 20V
V
-
to GND ........................................................................................................................... 20V
Digital Inputs, Overvoltage Range ................................................................... -4V to (V
+
+4V)
Analog Input Voltage ........................................................................... (V-) -20V to (V+)+20V
Lead Temperature (soldering, 10 seconds) ........................................................................ +300
C
Storage Temperature ........................................................................................... -65
C to +150
C
Continuous Power Dissipation .............................................................................. T
A
=
+
70
C
16 lead CERDIP(derate 10.0mW/
C above +70
C) ................................................. 800mW
20 lead LCC (derate 9.1mW/
C above +70
C) ......................................................... 727mW
Junction Temperature T
J
........................................................................................ +150
C
Thermal Resistance, Junction to Case,
JC:
Case Outline 16 lead CERDIP................................................................... 50
C/W
Case Outline 20 lead LCC ........................................................................ 20
C/W
Thermal Resistance, Junction to Ambient,
JA:
Case Outline 16 lead CERDIP.................................................................. 100
C/W
Case Outline 20 lead LCC ....................................................................... 110
C/W
Recommended Operating Conditions.
Ambient Operating Range (T
A
) ............................................................... -55
C to
+
125
C
Positive Supply Voltage (V+) ......................................................................................+15V
Negative Supply Voltage (V-) ..................................................................................... -15V
Logic Low Level Address Input Voltage (V
IL
) .................................................. 0V to 0.8V
Logic High Level Address Input Voltage (V
IH
) ..................................... 2.4V to (V+)-0.7V
Enable Voltage (V
EN
) ............................................................................. 2.4V to (V+)-0.7V
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of MAX358M/883B
19-0319
Rev. B
for SMD 7705203
Page 2 of
6
TABLE 1. ELECTRICAL TESTS
TEST
Symbol
CONDITIONS
-55
C <=T
A
<= +125
C
V+=+15V, V-=-15V, V
EN
=2.4V
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
SWITCH
Input Leakage
Current
NOTE 1
I
IH
I
IL
Measure address inputs sequentially,
connect all unused address inputs to
5.0V
1
2
1
2
All
All
-1.0
-1.0
1.0
10.0
1.0
10.0
A
Switch ON
Resistance
r
DS(ON)1
I
D
=
100
A, V
S
=-/+10V
1,3
2
All
1500
1800
Switch ON
Resistance
r
DS(ON)2
I
D
=
100
A, V
S
=-/+5V,
V+=+10V, V-=-10V
1,2,3
All
2200
Source-OFF
Leakage Current
+
I
S(OFF)
V
S
=+10V, V
D
=-10V, V
EN
=0.8V,
All unused inputs =-10V
1,2
All
-50
50 nA
Source-OFF
Leakage Current
-
I
S(OFF)
V
S
=-10V, V
D
=+10V, V
EN
=0.8V,
All unused inputs =+10V
1,2
All
-50
50 nA
Drain-OFF
Leakage Current
+
I
D(OFF)
V
D
=+10V, V
EN
=0.8V, All unused
inputs =-10V
1,2
All
-250
250 nA
Drain-OFF
Leakage Current
-
I
D(OFF)
V
D
=-10V, V
EN
=0.8V, All unused
inputs =+10V
1,2
All
-250
250 nA
Drain-ON
Leakage Current
+
I
D(ON)
V
D
=+10V, V
S
=-10V, All unused
inputs =-10V
1,2,3
All
-250
250 nA
Drain-ON
Leakage Current
-
I
D(ON)
V
D
=-10V, V
S
=+10V, All unused
inputs =+10V
1,2,3
All
-250
250 nA
Overage protected
leakage current
into the drain
terminal of an
"OFF" switch
+
I
D(OFF)
(Over-
voltage)
V
S
=
25V, V
D
=0V, V
EN
=0.8V
1,3
2
All
-2.0
-5.0
+2.0
+5.0
A
SUPPLY
Positive Supply
Current
I+
V
A
=5.0V
1,2,3
All
2.0 mA
Negative Supply
Current
I-
V
A
=5.0V
1,2,3
All
-1.4 mA
Standby Positive
Supply Current
+I
SBY
V
A
=0V, V
EN
=0.8V
1,2,3
All
2.0 mA
Standby Negative
Supply Current
-I
SBY
V
A
=0V, V
EN
=0.8V
1,2,3
All
-1.0 mA
FUNCTIONAL
Capacitance:
Address
C
A
V+=V-=0V, f=1MHz, NOTE 2
4
All
10 pF
Capacitance:
Output Switch
C
OS
V+=V-=0V, f=1MHz, NOTE 2
4
All
45 pF
Capacitance:
Input Switch
C
IS
V+=V-=0V, f=1MHz, NOTE 2
4
All
10 pF
----------------------------
Electrical Characteristics of MAX358M/883B
19-0319
Rev. B
for SMD 7705203
Page 3 of
6
TABLE 1. ELECTRICAL TESTS
TEST
Symbol
CONDITIONS
-55
C <=T
A
<= +125
C
V+=+15V, V-=-15V,V
EN
=2.4V
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
Charge Transfer
Error
V
CTE
V
S
=GND, V
GEN
=0V to 5V,
NOTE 2
4
All
10 mV
Single Channel
Isolation
V
ISO
V
GEN
=1Vp-p, f=200kHz,
NOTE 2
4
All
50
dB
Crosstalk Between
Channels
V
CT
V
GEN
=1Vp-p, f=200kHz,
NOTE 2
4
All
50
dB
DYNAMIC
Break Before
Make Time Delay
t
D
NOTE 2 Figure 2
9
All
5.0
ns
Propagation Delay
Times: Address
Inputs to I/O
Channels
t
ON(A)
t
OFF(A)
R
L
=1k
, C
L
=100pF, NOTE 2
9
10,11
All
1000
1500
ns
Enable to I/O
t
ON(EN)
t
OFF(EN)
R
L
=1k
, C
L
=100pF, NOTE 2
Figure 3
9
10,11
All
1000
1500
ns
NOTE 1: Input current of one input mode
NOTE 2: Guaranteed, if not tested to the limits specified.
FIGURE 2: Break Before Make Delay. See Commercial datasheet.
FIGURE 3: Enable Delay. See Commercial datasheet.
ORDERING INFORMATION:
SMD NUMBER
PACKAGE
MAX358MJE/883B
7705203EA
J16
MAX358MLP/883B
77052032C
L20
TRUTH TABLE TERMINAL CONNECTION
A2
A1
A0
EN
MAX358
ON SWITCH
TERMINAL
NUMBER
MAX358
MAX358
X
X
X
0
None
J16
L20
0
0
0
1
1
1
A0
NC
0
0
1
1
2
2
EN
A0
0
1
0
1
3
3
V-
SUPPLY
EN
0
1
1
1
4
4
IN1
V-
SUPPLY
1
0
0
1
5
5
IN2
IN1
1
0
1
1
6
6
IN3
NC
1
1
0
1
7
7
IN4
IN2
1
1
1
1
8
8
OUT
IN3
9
IN8
IN4
10
IN7
OUT
11
IN6
NC
12
IN5
IN8
13
V+
SUPPLY
IN7
14
GND
IN6
15
A2
IN5
16
A1
NC
17
V+
SUPPLY
18
GND
19
A2
20
A1
----------------------------
Electrical Characteristics of MAX358M/883B
19-0319
Rev. B
for SMD 7705203
Page 4 of
6
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125
C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125
C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004
1
Final Electrical Parameters
Method 5005
1*, 2, 3, 4**
Group A Test Requirements
Method 5005
1, 2, 3, 4,**, 9, 10, 11***
Group C and D End-Point Electrical Parameters
Method 5005
1
* PDA applies to Subgroup 1 only.
** Subgroup 4 (capacitance measurements) shall be measured only for the initial test and
after process or design changes which may affect capacitance.
*** Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in Table 1.
----------------------------
Electrical Characteristics of MAX358M/883B
19-0319
Rev. B
for SMD 7705203
Page 5 of
6
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