SCOPE: CMOS, 12-BIT MONOLITHIC, MULTIPLYING D/A CONVERTER
Device Type Generic Number
01
MX7541AS(x)/883B
02 MX7541AT(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835 Case Outline Package Code
Q
GDIP1-T18 or CDIP2-T18 18 LEAD CERDIP J18
E CQCC1-N20 20 LCC L20
Absolute Maximum Ratings:
V
DD
to GND ...............................................................................................................+ 17V
V
RFB
to GND ...............................................................................................................
25V
V
REF
to GND ...............................................................................................................
25V
Digital Input Voltage Range ........................................................................... -0.3V to V
DD
V
OUT1
, V
OUT2
, to GND ..................................................................................... -0.3V to V
DD
Lead Temperature (soldering, 10 seconds) ................................................................... +300
C
Storage Temperature ...................................................................................... -65
C to +150
C
Continuous Power Dissipation ............................................................................... T
A
=
+
70
C
18 pin CERDIP(derate 10.5mW/
C above +70
C) ..................................................... 842mW
20 pin LCC(derate 9.1mW/
C above +70
C) .............................................................. 727mW
Junction Temperature T
J
........................................................................................... +150
C
Thermal Resistance, Junction to Case,
JC
18 pin CERDIP...................................................................................................... 45
C/W
20 pin LCC ........................................................................................................... 20
C/W
Thermal Resistance, Junction to Ambient,
JA:
18 pin CERDIP..................................................................................................... 95
C/W
20 pin LCC ......................................................................................................... 110
C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) ................................................................ -55
C to
+
125
C
Logic Supply Voltage (VLOGIC) ............................................................... +4.5D to +5.5V
Positive Supply Voltage .............................................................................................. +15V
Negative Supply Voltage ............................................................................................. -15V
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of MX7541A/883B
19-1051
Rev. C
for /883B and SMD 5962-89481
Page 2 of
6
TABLE 1. ELECTRICAL TESTS:
TEST
Symbol
CONDITIONS
-55
C <=T
A
<= +125
C 1/
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
ACCURACY
Resolution NOTE 2
RES
All
12
Bits
Relative Accuracy
RA
1,2,3
01
02
1.0
0.5
LSB
Differential Nonlinearity
DNL
All grades guaranteed monotonic
over temperature
1,2,3
01
02
1.0
0.5
LSB
Gain Error NOTE 3
AE
1
2,3
1
2,3
01
02
6
8
3
5
LSB
Gain Temperature
Coefficient NOTE 2
TC
AE
All
5 ppm/
C
Power Supply Rejection
PSRR
V
DD
=
5%
1
2,3
All
0.01
0.02
%/%
Output Leakage Current
I
OUT1
I
OUT2
Digital inputs = 0V
Digital inputs = V
DD
1
2,3
1
2,3
All
All
5.0
200
5.0
200
nA
Output Current Settling
Time NOTE 2
To
0.5%LSB. OUT 1 load is
100
|
|
13pF, digital inputs =V
IH
to V
IL
or V
IL
to V
IH
4
All
0.6
s
Feedthrough Error
NOTE 2, NOTE 4
FTE
VREF=20Vp-p at 10kHz sine
wave
4
All
1.0 mVp-p
Input Resistance
R
IN
1,2,3
All
7
18 k
Digital Input High
Voltage
V
IH
1,2,3
All
2.4
V
Digital Input Low
Voltage
V
IL
1,2,3
All
0.8 V
Digital Input Leakage
Current
I
IN
V
IN
=0V or V
DD
1
2,3
All
1.0
A
Supply Current
I
DD
All digital inputs V
IL
or V
IH
All digital inputs 0V or V
DD
1,2,3
1
2,3
All
All
2.0
100
500
mA
Digital Input Capacitance
NOTE 2
C
IN
4
All
8 pF
Output Capacitance
NOTE 2
C
OUT1
C
OUT2
Digital inputs at V
IH
Digital inputs at V
IL
Digital inputs at V
IH
Digital inputs at V
IL
4
All
200
70
70
200
pF
----------------------------
Electrical Characteristics of MX7541A/883B
19-1051
Rev. C
for /883B and SMD 5962-89481
Page 3 of
6
NOTE 1: V
DD
=+15V, V
OUT1
=V
OUT2
=0V; VREF=+10V, unless otherwise specified.
NOTE 2: Characteristics supplied for use as a typical design limit, but not production tested.
NOTE 3: Measured using internal feedback resistor and includes effect of leakage current and gain TC.
NOTE 4: Feedthrough error can be reduced by connecting the metal lid on the package to ground.
ORDERING INFORMATION:
Package
Pkg. Code
MAXIM PART #
SMD NUMBER
01
18 pin CERDIP
J18
MX7541ASQ/883B
5962-8948101VA
01
20 pin LCC
L20
MX7541ASE/883B
5962-89481012C
02
18 pin CERDIP
J18
MX7541ATQ/883B
5962-8948102VA
02
20 pin LCC
L20
MX7541ATE/883B
5962-89481022C
TERMINAL CONNECTIONS:
J18
L20
Pin
1
OUT1
NC
2
OUT2
OUT1
3
GND
OUT2
4
D1(MSB)
GND
5
D2
D1(MSB)
6
D3
D2
7
D4
D3
8
D5
D4
9
D6
D5
10
D7
D6
11
D8
NC
12
D9
D7
13
D10
D8
14
D11
D9
15
D12(LSB)
D10
16
V
DD
D11
17
VREF
D12(LSB)
18
R
FB
V
DD
19
VREF
20
R
FB
----------------------------
Electrical Characteristics of MX7541A/883B
19-1051
Rev. C
for /883B and SMD 5962-89481
Page 4 of
6
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125
C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125
C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004
1
Final Electrical Parameters
Method 5005
1*, 2, 3
Group A Test Requirements
Method 5005
1, 2, 3, 4**
Group C and D End-Point Electrical Parameters
Method 5005
1
* PDA applies to Subgroup 1 only.
** Subgroup 4 shall be tested at initial qualification and upon redesign. Sample size will
be 116 units.
----------------------------
Electrical Characteristics of MX7541A/883B
19-1051
Rev. C
for /883B and SMD 5962-89481
Page 5 of
6
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