SCOPE: CMOS, COMPLETE, HIGH-SPEED, 12-BIT A/D CONVERTER
Device Type Generic Number
01
MX7572S(x)12/883B
02 MX7572S(x)05/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835 Case Outline Package Code
Q
GDIP1-T24 or CDIP2-T24 24 LEAD CERDIP J24
E CQCC1-N28 28 LCC L28
Absolute Maximum Ratings:
V
DD
to DGND .................................................................................................. -0.3V to 7V
V
SS
to DGND .............................................................................................. +0.3V to -17V
AGND to DGND ................................................................................... -0.3V, (V
DD
+0.3V)
AIN to AGND ............................................................................................... -15V to +15V
Digital Input Voltage to DGND ............................................................. -0.3V, (V
DD
+0.3V)
Digital Output Voltage to DGND .......................................................... -0.3V, (V
DD
+0.3V)
Lead Temperature (soldering, 10 seconds) ................................................................... +300
C
Storage Temperature ...................................................................................... -65
C to +150
C
Continuous Power Dissipation ............................................................................... T
A
=
+
70
C
24 pin CERDIP(derate 12.5mW/
C above +70
C) .................................................... 1000mW
28 pin LCC(derate 10.2mW/
C above +70
C) ............................................................. 816mW
Junction Temperature T
J
........................................................................................... +150
C
Thermal Resistance, Junction to Case,
JC
24 pin CERDIP....................................................................................................... 40
C/W
28 pin LCC ............................................................................................................ 15
C/W
Thermal Resistance, Junction to Ambient,
JA:
24 pin CERDIP....................................................................................................... 80
C/W
28 pin LCC ............................................................................................................. 98
C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) ................................................................. -55
C to
+
125
C
Positive Supply Voltage (V
DD
) ........................................................ +4.75V dc to +5.25V dc
Negative Supply Voltage (V
SS
) ..................................................... -14.25V dc to +15.75V dc
Clock Frequency (f
CLK
) device 01 ............................................................................. 1.0MHz
Clock Frequency (f
CLK
) device 02 ............................................................................. 2.5MHz
Analog Input Voltage Range (AIN)
(specifications apply to slow memory mode) .......................................................... 0 to 5.0V
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of MX7572/883B
19-0274
Rev. B
for SMD 5962-87591
Page 2 of
8
TABLE 1. ELECTRICAL TESTS:
TEST
Symbol
CONDITIONS
-55
C
T
A
+125
C 1/
V
DD
=+5V, V
SS
=-15V
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
Resolution NOTE 2
RES
All
12
Bits
Integral Nonlinearity
INL
1,2,3
All
1.0 LSB
Differential Nonlinearity
DNL
1,2,3
All
1.0 LSB
Offset Error
VOS
1
2,3
All
4
6
LSB
Full Scale Error
AE
Full Scale = 5V, including internal
voltage reference error, (Ideal last
code transition=FS-3/2LSB's)
1
All
15 LSB
Full Scale Temperature
Coefficient
AE/
T
Guaranteed by internal reference
temperature coefficient tests;
includes internal voltage reference
drift.
2,3
All
45 ppm/
C
Analog Input Current
I
IN
AIN=5V
1,2,3
All
3.5 mA
Internal Reference
Voltage Output
VREF
1
All
-5.3
-5.2 V
Internal Reference Output
Current Sink Capability
Constant external load during
conversion
13,14,15
All
550
A
Digital Input Low
Voltage
V
INL
V
DD
=4.75V, V
SS
=-15V, __ ___
HBEN, CLK IN, CS, RD
1,2,3
All
0.8 V
Digital Input High
Voltage
V
INH
V
DD
=4.75V, V
SS
=-15V, __ ___
HBEN, CLK IN, CS, RD
1,2,3
All
2.4
V
Digital Input Capacitance
C
IN
V
DD
=4.75V, V
SS
=-15V, __ ___
HBEN, CLK IN, CS, RD
13
All
10 pF
Digital Input Current
I
IN
V
DD
=5.25V, V
SS
=-15V, __ ___
HBEN, CLK IN, CS, RD
AIN=0V to V
DD
CLK IN, V
DD
=5.25V, V
SS
=-15V,
AIN=0V to V
DD
1,2,3
All
-10
-20
10
20
A
Digital Output Low
Voltage
V
OL
I
SINK
=1.6mA, BUSY, CLK OUT,
V
DD
=4.75V, V
SS
=-15V, D11-D0/8
1,2,3
All
0.4 V
Digital Output High
Voltage
V
OH
I
SOURCE
=200
A, BUSY, CLK OUT,
V
DD
=4.75V, V
SS
=-15V, D11-D0/8
1,2,3
All
4.0
V
Floating State Leakage
Current
I
LKG
D11-D0/8, V
DD
=5.25V, V
SS
=-15V
1,2,3
All
-10
10
A
Floating State Output
Capacitance NOTE 2
C
OUT
13,14,15
All
15 pF
Conversion Time Using
Synchronous Clock
t
CONV
13,14,15
01
02
12.5
5.0
s
Conversion Time Using
Asynchronous Clock
t
CONV
9,10,11
01
02
12.0
4.8
13.0
5.2
s
Positive Supply Current
I
DD
VDD=5.25V, VSS=-15.75V,
__ __ _____ ____
CS=RD=BUSY=HIGH, AIN=5V
1,2,3
All
7.0 mA
----------------------------
Electrical Characteristics of MX7572/883B
19-0274
Rev. B
for SMD 5962-87591
Page 3 of
8
TEST
Symbol
CONDITIONS
-55
C
T
A
+125
C 1/
V
DD
=+5V, V
SS
=-15V
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
Negative Supply Current
I
SS
V
DD
=5.25V, V
SS
=-15.75V,
__ __ _____ ____
CS=RD=BUSY=HIGH, AIN=5V
1,2,3
All
12.0 mA
__ ___
CS to RD Setup Time
t
1
NOTE 3
9,14,15
All
0
ns
__ _____
RD to BUSY Propagation
Delay
t
2
NOTE 3
9
14,15
All
190
270
ns
Data-Access Time __
after RD
t
3
CL=60pF, NOTE 3, 4, 5
CL=100pF, NOTE 3, 5
9
14,15
9
14,15
All
110
150
125
170
ns
__
RD Pulse Width
t
4
NOTE 3
9,14,15
All
t
3
ns
__ ___
CS to RD Hold Time
t
5
NOTE 3
9,14,15
All
0
ns
Data-Setup Time _____
after BUSY
t
6
CL=60pF, NOTE 3, 5
9
14,15
All
70
100
ns
Bus-Relinquish Time
t
7
NOTE 3, 6
9
14,15
All
35
20
90
90
ns
__
HBEN to RD Setup Time
t
8
NOTE 3
9,14,15
All
0
ns
__
HBEN to RD Hold Time
t
9
NOTE 3
9,14,15
All
0
ns
Delay Between
Successive Read
Operations
t
10
NOTE 3
9,14,15
All
500
ns
NOTE 1: V
DD
=+5V, V
SS
=-15V, AIN=0V to +5V, slow-memory mode, f
CLK
=1.0MHz for -01 and
f
CLK
=2.5MHz for -02, unless otherwise specified.
NOTE 2: Characteristics supplied for use as a typical design limit but not production tested.
NOTE 3: All input control signals are specified with tr=tf=5ns (10% to 90% of +5V) and timed from a
1.6V voltage level. Times t
6
and t
10
are measured only for the initial test and after process or
design changes which may affect switching parameters.
NOTE 4: If not tested, shall be guaranteed to the limits specified in Table 1, herein.
NOTE 5: Times t
3
and t
6
are measured with the load circuits of Figure 2 in the commercial datasheet
and defined as the time required for an output to cross 0.8V or 2.4V.
NOTE 6: Time t
7
is defined as the time required for the data lines to change 0.5V when loaded with the
circuits of Figure 3 in the commercial datasheet.
----------------------------
Electrical Characteristics of MX7572/883B
19-0274
Rev. B
for 5962-87591
Page 4 of
8
ORDERING INFORMATION:
Package
Pkg. Code
MAXIM PART #
SMD Number
01
24 pin CERDIP
J24
MX7572SQ12/883B
5962-8759101LA
01
28 pin LCC
L28
MX7572SE12/883B
5962-87591013C
02
24 pin CERDIP
J24
MX7572SQ05/883B
5962-8759104LA
02
28 pin LCC
L28
MX7572SE05/883B
5962-87591043C
TERMINAL CONNECTIONS:
J24
L28
Pin
1
AIN
NC
2
VREF
AIN
3
AGND
VREF
4
D11
AGND
5
D10
D11
6
D9
D10
7
D8
D9
8
D7
NC
9
D6
D8
10
D5
D7
11
D4
D6
12
DGND
D5
13
D3/11
D4
14
D2/10
DGND
15
D1/9
NC
16
D0/8
D3/11
17
CLK IN
D2/10
18
CLK OUT
D1/9
19
HBEN
D0/8
20
___
RD
CLK IN
21
___
CS
CLK OUT
22
_____
BUSY
NC
23
V
SS
HBEN
24
V
DD
___
RD
25
___
CS
26
_____
BUSY
27
V
SS
28
V
DD
----------------------------
Electrical Characteristics of MX7572/883B
19-0274
Rev. B
for SMD 5962-87591
Page 5 of
8
SLOW MEMORY MODE
PARALLEL READ DATA-BUS STATUS
TWO-BYTE READ DATA-BUS STATUS
DATA OUTPUTS
READ
DATA OUTPUTS
FIRST READ
SECOND READ
D11
DB11
D7
DB7
LOW
D10
DB10
D6
DB6
LOW
D9
DB9
D5
DB5
LOW
D8
DB8
D4
DB4
LOW
D7
DB7
D3/D11
DB3
DB11
D6
DB6
D2/D10
DB2
DB10
D5
DB5
D1/D9
DB1
DB9
D4
DB4
D0/D8
DB0
DB8
D3/D11
DB3
D2/D10
DB2
D1/D9
DB1
D0/D8
DB0
ROM MODE
PARALLEL READ DATA BUS STATUS
TWO-BYTE READ DATA BUS STATUS
DATA
OUTPUTS
FIRST READ
(OLD DATA)
SECOND
READ
DATA
OUTPUTS
FIRST READ
(OLD DATA)
SECOND
READ
THIRD
READ
D11
DB11
DB11
D7
DB7
LOW
DB7
D10
DB10
DB10
D6
DB6
LOW
DB6
D9
DB9
DB9
D5
DB5
LOW
DB5
D8
DB8
DB8
D4
DB4
LOW
DB4
D7
DB7
DB7
D3/D11
DB3
DB11
DB3
D6
DB6
DB6
D2/D10
DB2
DB10
DB2
D5
DB5
DB5
D1/D9
DB1
DB9
DB1
D4
DB4
DB4
D0/D8
DB0
DB8
DB0
D3/D11
DB3
DB3
D2/D10
DB2
DB2
D1/D9
DB1
DB1
D0/D8
DB0
DB0
----------------------------
Electrical Characteristics of MX7572/883B
19-0274
Rev. B
for SMD 5962-87591
Page 6 of
8
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