SCOPE: CMOS HIGHSPEED 8-BIT A/D CONVERTER WITH TRACK AND HOLD
Device Type Generic Number
01 MX7820U(x)/883B
02 MX7820T(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835 Case Outline Package Code
MAXIM SMD
Q R GDIP1-T20 or CDIP2-T20 20 LEAD CERDIP J20
E 2 CQCCI-N20 20 LEADLESS CHIP CARRIER L20
Absolute Maximum Ratings
Supply Voltage to GND ................................................................................... 0V, +7V
Digital Input Voltage ................................................................................... -0.3V, V
DD
Digital Output Voltage ................................................................................. -0.3V, V
DD
Positive Reference Voltage ..................................................................... VREF- to V
DD
Negative Reference Voltage ..................................................................... 0V to VREF+
Input Voltage (V
IN
) .................................................................................... -0.3V to V
DD
Lead Temperature (soldering, 10 seconds) ............................................................... +300
C
Storage Temperature .................................................................................. -65
C to +150
C
Continuous Power Dissipation ............................................................................ T
A
=
+
70
C
20 pin CERDIP(derate 11.1mW/
C above +70
C) .................................................. 889mW
20 pin LCC(derate 9.1mW/
C above +70
C) ........................................................... 727mW
Junction Temperature T
J
........................................................................................ +150
C
Thermal Resistance, Junction to Case,
JC
20 pin CERDIP.................................................................................................... 40
C/W
20 pin LCC ......................................................................................................... 20
C/W
Thermal Resistance, Junction to Ambient,
JA:
20 pin CERDIP................................................................................................... 90
C/W
20 pin LCC ...................................................................................................... 110
C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) ............................................................ -55
C to
+
125
C
Supply Voltage Range (V
DD
) ................................................................. +4.75V to 5.25V
Positive Reference Voltage (VREF+) ..................................................................... +5.0V
Negative Reference Voltage (VREF-) ......................................................................... 0V
Ground Potential (GND) .............................................................................................. 0V
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of MX7820/883B
19-0072
Rev. C
for /883B and SMD 5962-88650
Page 2 of
7
TABLE 1. ELECTRICAL TESTS:
TEST
Symbol
CONDITIONS
-55
C
T
A
+125
C 1/ 2/
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
Resolution
RES
This is the minimum resolution
for which no missing codes are
guaranteed.
1,2,3
All
8
LSB
Total Unadjusted Error
TUE
Includes gain error, offset error
and linearity error.
1
2,3,12
1,2,3
01
02
1.0
0.5
1.0
LSB
Analog Input Leakage
Current
I
IN
1,2,3
All
3.0
A
Analog Input Capacitance
CIA
NOTE 3
4
All
60 pF
Reference Input Resistance
R
IN
1,2,3
All
1.0
4.0 k
Digital Input High Level
Voltage
V
IH
__ ___ ___
CS, WR, and RD inputs
Mode Input (Pin 7)
1,2,3
All
2.4
3.5
V
Digital Input Low Level
Voltage
V
IL
__ ___ ___
CS, WR, and RD inputs
Mode Input (Pin 7)
1,2,3
All
0.8
1.5
V
Digital Input High Level
Current
I
IH
__ ___
CS and RD inputs
___
WR Inputs
Mode Input (Pin 7)
1,2,3
All
1.0
3.0
200
A
Digital Input Low Current
I
IL
__ ___ ___
CS, WR, RD and mode inputs
1,2,3
All
-1.0
A
Digital Input Capacitance
C
ID
__ ___ ___ NOTE 3
CS, WR, RD and mode inputs
4
All
8.0 pF
Digital Output High Level
Voltage
V
OH
___ ___
DB0-DB7, OFL and INT outputs
I
SOURCE
=360
A
1,2,3
All
4.0
V
Digital Output Low Level
Voltage
V
OL
___ ___
DB0-DB7, OFL and INT outputs
I
SINK
=1.6mA
1,2,3
All
0.4 V
Floating State Leakage
Current
I
OUT
DB0-DB7
1,2,3
All
3.0
A
Digital Output Capacitance
C
OUT
NOTE 3
4
All
8.0 pF
Supply Current from V
DD
I
DD
__ ___
CS=RD=0V
1,2,3
All
20.0 mA
Power Supply Sensitivity
PSS
V
DD
=5.0V
5%
1,2,3
All
.25 LSB
__ __ ___
CS to RD/WR Setup Time
t
CSS
NOTE 6 and 7
9,10,11
All
0
ns
__ __ ___
CS to RD/WR Hold Time
t
CSH
NOTE 6 and 7
9,10,11
All
0
ns
__
CS to RDY delay
t
RDY
NOTE 6 and 7, CL=50pF, pull-
up resistor=2.0k
9
10,11
All
70
100
ns
----------------------------
Electrical Characteristics of MX7820/883B
19-0072
Rev. C
for /883B and SMD 5962-88650
Page 3 of
7
TEST
Symbol
CONDITIONS
-55
C
T
A
+125
C 1/ 2/
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
___ Conversion Time
(RD mode)
t
CRD
See Figure 3 in Commercial
Datasheet. NOTE 7
9
10,11
All
1.6
2.5
s
___ Data Access Time
(RD mode)
t
ACCO
NOTE 4 and 7
9
10,11
All
1.62
2.55
s
___ ___
__ RD to INT Delay
(RD mode)
t
INTH
NOTE 7, CL=50pF
9
10,11
All
175
225
ns
Data Hold Time
t
DH
NOTE 5, 6, 7
9
10,11
All
60
100
ns
Delay Time Between
Conversion
t
P
NOTE 6, 7
9
10,11
All
500
600
ns
Write Pulse Width
t
WR
NOTE 6
9,10,11
All
0.6
50
s
Delay Time between
___ ___
WR and RD Pulses
t
RD
NOTE 6
9
10,11
All
600
700
ns
Delay Access Time
___ __
WR/RD mode
t
ACC1
NOTE 4, 6
9
10,11
All
160
250
ns
___ ___
RD to INT delay
t
R1
NOTE 6
9
10,11
All
140
225
ns
___ ___
WR to INT delay
t
INTL
NOTE 6, CL=50pF
9
10,11
All
1.0
1.7
s
Data Access Time
___ ___
WR/RD mode
t
ACC2
NOTE 4, 6
9
10,11
All
70
110
ns
___ ___
WR to INT delay, Stand
alone operation
t
IHWR
NOTE 6, CL=50pF
9
10,11
All
100
150
ns
Data access time ___
after INT
Stand alone operation
t
ID
NOTE 6
9
10,11
All
50
75
ns
NOTE 1: V
DD
=+5V, VREF(+)=+5V; VREF(-)=GND=0V, unless otherwise specified.__
Specifications apply for RD mode (pin 7=0V).
NOTE 2: All input control signals are specified with tr=tf=20ns (10 percent to 90 percent of +5.0V) and
timed from a voltage level of 1.6V.
NOTE 3: Tested at initial release and upon redesign. Sample size will be 116 units.
NOTE 4: Measured with load circuits of Figure 2 in the Commercial Datasheet and defined as the time
required for an output to cross 0.8V to 2.4V.
NOTE 5: Defined as the time required for the data lines to change 0.5V when loaded with the circuits of
Figures 2 in the Commercial Datasheet and is measured only for the initial test and after process
or design changes which may affect t
DH
.
NOTE 6: Refer to timing diagrams of Figure 3 of Commercial Datasheet. These parameters, if not tested,
shall be guaranteed to the limits specified in Table 1.
__
NOTE 7: Refer to timing diagram of Figure 3 (RD mode). These parameters are tested to Subgroup 9 under
Group A test requirements.
----------------------------
Electrical Characteristics of MX7820/883B
19-0072
Rev. C
for /883B and SMD 5962-88650
Page 4 of
7
TERMINAL CONNECTIONS
J20, L20
J20, L20
1
V
IN
11
VREF-
2
DB0(LSB)
12
VREF+
3
DB1
13
CS
4
DB2
14
DB4
5
DB3
15
DB5
6
___
WR/RDY
16
DB6
7
Mode
17
DB7(MSB)
8
__
RD
18
___
OFL
9
___
INT
19
NC
10
GND
20
V
DD
Package
ORDERING INFORMATION:
SMD NUMBER
01
20 pin CERDIP
MX7820UQ/883B
5962-8865001RA
01
20 pin LCC
MX7820UE/883B
5962-88650012C
02
20 pin CERDIP
MX7820TQ/883B
5962-8865002RA
02
20 pin LCC
MX7820TE/883B
5962-88650022C
----------------------------
Electrical Characteristics of MX7820/883B
19-0072
Rev. C
for /883B and SMD 5962-88650
Page 5 of
7
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125
C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125
C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004
1
Final Electrical Parameters
Method 5005
1*, 2, 3, 4**, 9, 10, 11***
Group A Test Requirements
Method 5005
1, 2, 3, 4**, 9, 10, 11***
Group C and D End-Point Electrical Parameters
Method 5005
1
* PDA applies to Subgroup 1 only.
** Subgroup 4, Capacitance tests are performed at initial qual and upon redesign.
Sample size will be 116 units.
*** Subgroups 10 and 11 if not tested, are guaranteed to the limits specified in Table 1.
----------------------------
Electrical Characteristics of MX7820/883B
19-0072
Rev. C
for /883B and SMD 5962-88650
Page 6 of
7
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