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Электронный компонент: DSP56F807VF80

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DSP56F807/D
Rev. 12.0, 02/2004
Motorola, Inc., 2004. All rights reserved.
56F807
Technical Data
56F807 16-bit Hybrid Processor
Up to 40 MIPS at 80MHz core frequency
DSP and MCU functionality in a unified,
C-efficient architecture
Hardware DO and REP loops
MCU-friendly instruction set supports both
DSP and controller functions: MAC, bit
manipulation unit, 14 addressing modes
60K
16-bit words Program Flash
2K
16-bit words Program RAM
8K
16-bit words Data Flash
4K
16-bit words Data RAM
2K
16-bit words Boot Flash
Up to 64K
16- bit words each of external
Program and Data memory
Two 6 channel PWM Modules
Four 4 channel, 12-bit ADCs
Two Quadrature Decoders
CAN 2.0 B Module
Two Serial Communication Interfaces (SCIs)
Serial Peripheral Interface (SPI)
Up to four General Purpose Quad Timers
JTAG/OnCE
TM
port for debugging
14 Dedicated and 18 Shared GPIO lines
160-pin LQFP or 160 MAPBGA Packages
Figure 1. 56F807 Block Diagram
JTAG/
OnCE
Port
Digital Reg
Analog Reg
Low Voltage
Supervisor
Program Controller
and
Hardware Looping Unit
Data ALU
16 x 16 + 36
36-Bit MAC
Three 16-bit Input Registers
Two 36-bit Accumulators
Address
Generation
Unit
Bit
Manipulation
Unit
PLL
Clock Gen
16-Bit
56800
Core
PAB
PDB
XDB2
CGDB
XAB1
XAB2
XTAL
EXTAL
INTERRUPT
CONTROLS
IPBB
CONTROLS
IPBus Bridge
(IPBB)
MODULE CONTROLS
ADDRESS BUS [8:0]
DATA BUS [15:0]
COP RESET
RESET
IRQA
IRQB
Applica-
tion-Specific
Memory &
Peripherals
Interrupt
Controller
Program Memory
61440 x 16 Flash
2048 x 16 SRAM
Boot Flash
2048 x 16 Flash
Data Memory
8192 x 16 Flash
4096 x 16 SRAM
COP/
Watchdog
SPI
or
GPIO
SCI0
or
GPIO
Quad Timer D
/ Alt Func
Quad Timer C
A/D1
A/D2
ADCA
4
2
4
4
4
4
6
PWM Outputs
Fault Inputs
PWMA
16
16
VCAPC
V
DD
V
SS
V
DDA
V
SSA
6
2
8
10*
3
EXTBOOT
Current Sense Inputs
3
Quadrature
Decoder 0
/Quad Timer
CAN 2.0A/B
2
CLKO
External
Address Bus
Switch
Bus
Control
External
Data Bus
Switch
External
Bus
Interface
Unit
RD Enable
WR Enable
DS Select
PS Select
10
16
6
A[00:05]
D[00:15]
A[06:15] or
GPIO-E2:E3 &
GPIO-A0:A7
4
4
6
PWM Outputs
Fault Inputs
PWMB
Current Sense Inputs
3
Quadrature
Decoder 1
/Quad Timer B
4
2
SCI1
or
GPIO
2
Dedicated
GPIO
14
VPP
RSTO
A/D1
A/D2
ADCB
4
4
3
VREF2
VREF
*
includes TCS pin which is reserved for factory use and is tied to
VSS
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2
56F807 Technical Data
Part 1 Overview
1.1 56F807 Features
1.1.1
Digital Signal Processing Core
Efficient 16-bit 56800 family hybrid controller engine with dual Harvard architecture
As many as 40 Million Instructions Per Second (MIPS) at 80MHz core frequency
Single-cycle 16
16-bit parallel Multiplier-Accumulator (MAC)
Two 36-bit accumulators including extension bits
16-bit bidirectional barrel shifter
Parallel instruction set with unique DSP addressing modes
Hardware DO and REP loops
Three internal address buses and one external address bus
Four internal data buses and one external data bus
Instruction set supports both DSP and controller functions
Controller style addressing modes and instructions for compact code
Efficient C compiler and local variable support
Software subroutine and interrupt stack with depth limited only by memory
JTAG/OnCE debug programming interface
1.1.2
Memory
Harvard architecture permits as many as three simultaneous accesses to Program and Data memory
On-chip memory including a low-cost, high-volume Flash solution
-- 60K
16-bit words of Program Flash
-- 2K
16-bit words of Program RAM
-- 8K
16-bit words of Data Flash
-- 4K
16-bit words of Data RAM
-- 2K
16-bit words of Boot Flash
Off-chip memory expansion capabilities programmable for 0, 4, 8, or 12 wait states
-- As much as 64K
16 bits of Data memory
-- As much as 64K
16 bits of Program memory
1.1.3
Peripheral Circuits for 56F807
Two Pulse Width Modulator modules each with six PWM outputs, three Current Sense inputs, and
four Fault inputs, fault tolerant design with dead time insertion, supports both center- and
edge-aligned modes
Four 12-bit, Analog-to-Digital Converters (ADCs), which support four simultaneous conversions
with quad, 4-pin multiplexed inputs; ADC and PWM modules can be synchronized
Two Quadrature Decoders each with four inputs or two additional Quad Timers
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56F807 Description
56F807 Technical Data
3
Two dedicated General Purpose Quad Timers totaling six pins: Timer C with two pins and Timer D
with four pins
CAN 2.0 B Module with 2-pin port for transmit and receive
Two Serial Communication Interfaces each with two pins (or four additional GPIO lines)
Serial Peripheral Interface (SPI) with configurable 4-pin port (or four additional GPIO lines)
Computer-Operating Properly (COP) Watchdog timer
Two dedicated external interrupt pins
14 dedicated General Purpose I/O (GPIO) pins, 18 multiplexed GPIO pins
External reset input pin for hardware reset
External reset output pin for system reset
JTAG/On-Chip Emulation (OnCETM) for unobtrusive, processor speed-independent debugging
Software-programmable, Phase Locked Loop-based frequency synthesizer for the hybrid controller
core clock
1.1.4
Energy Information
Fabricated in high-density CMOS with 5V-tolerant, TTL-compatible digital inputs
Uses a single 3.3V power supply
On-chip regulators for digital and analog circuitry to lower cost and reduce noise
Wait and Stop modes available
1.2 56F807 Description
The 56F807 is a member of the 56800 core-based family of hybrid controllers. It combines, on a single chip,
the processing power of a DSP and the functionality of a microcontroller with a flexible set of peripherals
to create an extremely cost-effective solution. Because of its low cost, configuration flexibility, and compact
program code, the 56F807 is well-suited for many applications. The 56F807 includes many peripherals that
are especially useful for applications such as motion control, smart appliances, steppers, encoders,
tachometers, limit switches, power supply and control, automotive control, engine management, noise
suppression, remote utility metering, industrial control for power, lighting, and automation.
The 56800 core is based on a Harvard-style architecture consisting of three execution units operating in
parallel, allowing as many as six operations per instruction cycle. The MCU-style programming model and
optimized instruction set allow straightforward generation of efficient, compact DSP and control code. The
instruction set is also highly efficient for C/C++ Compilers to enable rapid development of optimized
control applications.
The 56F807 supports program execution from either internal or external memories. Two data operands can
be accessed from the on-chip Data RAM per instruction cycle. The 56F807 also provides two external
dedicated interrupt lines and up to 32 General Purpose Input/Output (GPIO) lines, depending on peripheral
configuration.
The 56F807 controller includes 60K, 16-bit words of Program Flash and 8K words of Data Flash (each
programmable through the JTAG port) with 2K words of Program RAM and 4K words of Data RAM. It
also supports program execution from external memory.
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4
56F807 Technical Data
A total of 2K words of Boot Flash is incorporated for easy customer-inclusion of field-programmable
software routines that can be used to program the main Program and Data Flash memory areas. Both
Program and Data Flash memories can be independently bulk erased or erased in page sizes of 256 words.
The Boot Flash memory can also be either bulk or page erased.
A key application-specific feature of the 56F807 is the inclusion of two Pulse Width Modulator (PWM)
modules. These modules each incorporate three complementary, individually programmable PWM signal
outputs (each module is also capable of supporting six independent PWM functions, for a total of 12 PWM
outputs) to enhance motor control functionality. Complementary operation permits programmable dead
time insertion, distortion correction via current sensing by software, and separate top and bottom output
polarity control. The up-counter value is programmable to support a continuously variable PWM frequency.
Edge- and center-aligned synchronous pulse width control (0% to 100% modulation) is supported. The
device is capable of controlling most motor types: ACIM (AC Induction Motors), both BDC and BLDC
(Brush and Brushless DC motors), SRM and VRM (Switched and Variable Reluctance Motors), and stepper
motors. The PWMs incorporate fault protection and cycle-by-cycle current limiting with sufficient output
drive capability to directly drive standard optoisolators. A "smoke-inhibit", write-once protection feature
for key parameters is also included. A patented PWM waveform distortion correction circuit is also
provided. Each PWM is double-buffered and includes interrupt controls to permit integral reload rates to be
programmable from 1 to 16. The PWM modules provide a reference output to synchronize the
analog-to-digital converters.
The 56F807 incorporates two separate Quadrature Decoders capable of capturing all four transitions on the
two-phase inputs, permitting generation of a number proportional to actual position. Speed computation
capabilities accommodate both fast- and slow-moving shafts. An integrated watchdog timer in the
Quadrature Decoder can be programmed with a time-out value to alarm when no shaft motion is detected.
Each input is filtered to ensure only true transitions are recorded.
This controller also provides a full set of standard programmable peripherals that include two Serial
Communications Interfaces (SCI), one Serial Peripheral Interface (SPI), and four Quad Timers. Any of
these interfaces can be used as General-Purpose Input/Outputs (GPIO) if that function is not required. A
Controller Area Network interface (CAN Version 2.0 A/B-compliant), an internal interrupt controller, and
14 dedicated GPIO lines are also included on the 56F807.
1.3 State of the Art Development Environment
Processor Expert
TM
(PE) provides a Rapid Application Design (RAD) tool that combines
easy-to-use component-based software application creation with an expert knowledge system.
The Code Warrior Integrated Development Environment is a sophisticated tool for code navigation,
compiling, and debugging. A complete set of evaluation modules (EVMs) and development system
cards will support concurrent engineering. Together, PE, Code Warrior and EVMs create a
complete, scalable tools solution for easy, fast, and efficient development.
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Product Documentation
56F807 Technical Data
5
1.4 Product Documentation
The four documents listed in
Table 1
are required for a complete description and proper design with the 56F807.
Documentation is available from local Motorola distributors, Motorola semiconductor sales offices, Motorola
Literature Distribution Centers, or online at http://www.motorola.com/semiconductors.
Table 1. 56F807 Chip Documentation
1.5 Data Sheet Conventions
This data sheet uses the following conventions:
Topic
Description
Order Number
DSP56800
Family Manual
Detailed description of the 56800 family architecture,
and 16-bit core processor and the instruction set
DSP56800FM/D
DSP56F801/803/805/807
User's Manual
Detailed description of memory, peripherals, and
interfaces of the 56F801, 56F803, 56F805, and
56F807
DSP56F801-7UM/D
56F807
Technical Data Sheet
Electrical and timing specifications, pin descriptions,
and package descriptions (this document)
DSP56F807/D
56F807
Product Brief
Summary description and block diagram of the 56F807
core, memory, peripherals and interfaces
DSP56F807PB/D
DSP56F807
Errata
Details any chip issues that might be present
DSP56F807E/D
OVERBAR
This is used to indicate a signal that is active when pulled low. For example, the RESET pin is
active when low.
"asserted"
A high true (active high) signal is high or a low true (active low) signal is low.
"deasserted"
A high true (active high) signal is low or a low true (active low) signal is high.
Examples:
Signal/Symbol
Logic State
Signal State
Voltage
1
1.
Values for V
IL
, V
OL
, V
IH
, and V
OH
are defined by individual product specifications.
PIN
True
Asserted
V
IL
/V
OL
PIN
False
Deasserted
V
IH
/V
OH
PIN
True
Asserted
V
IH
/V
OH
PIN
False
Deasserted
V
IL
/V
OL
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6
56F807 Technical Data
Part 2 Signal/Connection Descriptions
2.1 Introduction
The input and output signals of the 56F807 are organized into functional groups, as shown in
Table 2
and
as illustrated in
Figure 2
. In
Table 3
through
Table 19
, each table row describes the signal or signals
present on a pin.
Table 2. Functional Group Pin Allocations
Functional Group
Number of
Pins
Detailed
Description
Power (V
DD
or V
DDA
)
11
Table 3
Ground (V
SS
or V
SSA
)
13
Table 4
Supply Capacitors & V
PP
4
Table 5
PLL and Clock
3
Table 6
Address Bus
1
16
Table 7
Data Bus
16
Table 8
Bus Control
4
Table 9
Interrupt and Program Control
5
Table 10
Dedicated General Purpose Input/Output
14
Table 11
Pulse Width Modulator (PWM) Ports
26
Table 12
Serial Peripheral Interface (SPI) Port
1
1.
Alternately, GPIO pins
4
Table 13
Quadrature Decoder Ports
2
2.
Alternately, Quad Timer pins
8
Table 14
Serial Communications Interface (SCI) Ports
1
4
Table 15
CAN Port
2
Table 16
Analog to Digital Converter (ADC) Ports
20
Table 17
Quad Timer Module Ports
6
Table 18
JTAG/On-Chip Emulation (OnCE)
6
Table 19
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Introduction
56F807 Technical Data
7
Figure 2. 56F807 Signals Identified by Functional Group
1
1. Alternate pin functionality is shown in parenthesis.
56F807
Power Port
Ground Port
Power Port
Ground Port
PLL
and
Clock
External
Address Bus or
GPIO
External
Data Bus
External
Bus Control
Dedicated
GPIO
SCI0 Port
or GPIO
SCI1 Port
or GPI0
V
DD
V
SS
V
DDA
V
SSA
VCAPC
V
PP
EXTAL
XTAL
CLKO
A0-A5
A6-7 (GPIOE2-E3)
A8-15 (GPIOA0-A7)
D0D15
PS
DS
RD
WR
PHASEA0 (TA0)
PHASEB0 (TA1)
INDEX0 (TA2)
HOME0 (TA3)
PHASEA1 (TB0)
PHASEB1 (TB1)
INDEX1 (TB2)
HOME1 (TB3)
TCK
TMS
TDI
TDO
TRST
DE
Quadrature
Decoder or
Quad Timer A
JTAG/OnCE
Port
GPIOB07
GPIOD05
PWMA0-5
ISA0-2
FAULTA0-3
PWMB0-5
ISB0-2
FAULTB0-3
SCLK (GPIOE4)
MOSI (GPIOE5)
MISO (GPIOE6)
SS (GPIOE7)
TXD0 (GPIOE0)
RXD0 (GPIOE1)
TXD1 (GPIOD6)
RXD1 (GPIOD7)
ANA0-7
VREF
ANB0-7
MSCAN_RX
MSCAN_TX
TC0-1
TD0-3
IRQA
IRQB
RESET
RSTO
EXTBOOT
PWMB
Port
Quad
Timers
C & D
ADCA
Port
ADCB
Port
Other
Supply
Ports
8
10*
3
3
2
2
1
1
1
6
2
8
16
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
Interrupt/
Program
Control
8
6
6
3
4
6
3
4
1
1
1
1
1
1
1
1
8
2
8
1
1
2
4
1
1
1
1
1
Quadrature
Decoder1 or
Quad Timer B
PWMA
Port
SPI Port
or GPIO
CAN
*
includes TCS pin which is reserved for factory use and is tied to
VSS
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8
56F807 Technical Data
2.2 Power and Ground Signals
2.3 Clock and Phase Locked Loop Signals
Table 3. Power Inputs
No. of Pins
Signal Name
Signal Description
8
V
DD
Power--These pins provide power to the internal structures of the chip, and
should all be attached to V
DD.
3
V
DDA
Analog Power--These pins is a dedicated power pin for the analog portion
of the chip and should be connected to a low noise 3.3V supply.
Table 4. Grounds
No. of Pins
Signal Name
Signal Description
9
V
SS
GND--These pins provide grounding for the internal structures of the chip and
should all be attached to V
SS.
3
V
SSA
Analog Ground--This pin supplies an analog ground.
1
TCS
TCS--This Schmitt pin is reserved for factory use and must be tied to V
SS
for
normal use. In block diagrams, this pin is considered an additional V
SS.
Table 5. Supply Capacitors and VPP
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
2
VCAPC Supply
Supply
VCAPC--Connect each pin to a 2.2uF or greater bypass
capacitor in order to bypass the core logic voltage regulator
(required for proper chip operation). For more information, please
refer to
Section 5.2
2
VPP
Input
Input
VPP--This pin should be left unconnected as an open circuit for
normal functionality.
Table 6. PLL and Clock
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
EXTAL
Input
Input
External Crystal Oscillator Input--This input should be
connected to an 8MHz external crystal or ceramic resonator.
For more information, please refer to
Section 3.5
.
1
XTAL
Input/
Output
Chip-driven
Crystal Oscillator Output--This output should be connected
to an 8MHz external crystal or ceramic resonator. For more
information, please refer to
Section 3.5
.
This pin can also be connected to an external clock source. For
more information, please refer to
Section 3.5.2
.
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Address, Data, and Bus Control Signals
56F807 Technical Data
9
2.4 Address, Data, and Bus Control Signals
1
CLKO
Output
Chip-driven
Clock Output--This pin outputs a buffered clock signal. By
programming the CLKOSEL[4:0] bits in the CLKO Select
Register (CLKOSR), the user can select between outputting a
version of the signal applied to XTAL and a version of the
device's master clock at the output of the PLL. The clock
frequency on this pin can also be disabled by programming the
CLKOSEL[4:0] bits in CLKOSR.
Table 7. Address Bus Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
6
A0A5
Output
Tri-stated
Address Bus--A0A5 specify the address for external
Program or Data memory accesses.
2
A6A7
GPIOE2-
GPIOE3
Output
Input/O
utput
Tri-stated
Input
Address Bus--A6A7 specify the address for external
Program or Data memory accesses.
Port E GPIO--These two General Purpose I/O (GPIO) pins
can individually be programmed as input or output pins.
After reset, the default state is Address Bus.
8
A8A15
GPIOA0-
GPIOA7
Output
Input/O
utput
Tri-stated
Input
Address Bus--A8A15 specify the address for external
Program or Data memory accesses.
Port A GPIO--These eight General Purpose I/O (GPIO) pins
can be individually programmed as input or output pins.
After reset, the default state is Address Bus.
Table 8. Data Bus Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
16
D0D15
Input/O
utput
Tri-stated
Data Bus-- D0D15 specify the data for external program or
data memory accesses. D0D15 are tri-stated when the external
bus is inactive. Internal pullups may be active.
Table 6. PLL and Clock (Continued)
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
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10
56F807 Technical Data
2.5 Interrupt and Program Control Signals
Table 9. Bus Control Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
PS
Output
Tri-stated
Program Memory Select--PS is asserted low for external program
memory access.
1
DS
Output
Tri-stated
Data Memory Select--DS is asserted low for external data
memory access.
1
WR
Output
Tri-stated
Write Enable--WR is asserted during external memory write
cycles. When WR is asserted low, pins D0D15 become outputs
and the device puts data on the bus. When WR is deasserted high,
the external data is latched inside the external device. When WR is
asserted, it qualifies the A0A15, PS, and DS pins. WR can be
connected directly to the WE pin of a Static RAM.
1
RD
Output
Tri-stated
Read Enable--RD is asserted during external memory read cycles.
When RD is asserted low, pins D0D15 become inputs and an
external device is enabled onto the device's data bus. When RD is
deasserted high, the external data is latched inside the device.
When RD is asserted, it qualifies the A0A15, PS, and DS pins. RD
can be connected directly to the OE pin of a Static RAM or ROM.
Table 10. Interrupt and Program Control Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
IRQA
Input
(Schmitt)
Input
External Interrupt Request A--The IRQA input is a
synchronized external interrupt request that indicates that an
external device is requesting service. It can be programmed to
be level-sensitive or negative-edge-triggered.
1
IRQB
Input
(Schmitt)
Input
External Interrupt Request B--The IRQB input is an external
interrupt request that indicates that an external device is
requesting service. It can be programmed to be level-sensitive
or negative-edge-triggered.
1
RSTO
Output
Output
Reset Output--This output reflects the internal reset state of
the chip.
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GPIO Signals
56F807 Technical Data
11
2.6 GPIO Signals
2.7 Pulse Width Modulator (PWM) Signals
1
RESET
Input
(Schmitt)
Input
Reset--This input is a direct hardware reset on the processor.
When RESET is asserted low, the device is initialized and
placed in the Reset state. A Schmitt trigger input is used for
noise immunity. When the RESET pin is deasserted, the initial
chip operating mode is latched from the EXTBOOT pin. The
internal reset signal will be deasserted synchronous with the
internal clocks, after a fixed number of internal clocks.
To ensure complete hardware reset, RESET and TRST should
be asserted together. The only exception occurs in a
debugging environment when a hardware device reset is
required and it is necessary not to reset the OnCE/JTAG
module. In this case, assert RESET, but do not assert TRST.
1
EXTBOOT
Input
(Schmitt)
Input
External Boot--This input is tied to V
DD
to force device to boot
from off-chip memory. Otherwise, it is tied to VSS.
Table 11. Dedicated General Purpose Input/Output (GPIO) Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
8
GPIOB0-G
PIOB7
Input
or
Output
Input
Port B GPIO--These eight pins are dedicated General
Purpose I/O (GPIO) pins that can individually be programmed
as input or output pins.
After reset, the default state is GPIO input.
6
GPIOD0-G
PIOD5
Input
or
Output
Input
Port D GPIO--These six pins are dedicated GPIO pins that
can individually be programmed as an input or output pins.
After reset, the default state is GPIO input.
Table 12. Pulse Width Modulator (PWMA and PWMB) Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
6
PWMA0-5
Output
Tri- stated
PWMA0-5-- Six PWMA output pins.
3
ISA0-2
Input
(Schmitt)
Input
ISA0-2-- These three input current status pins are used for
top/bottom pulse width correction in complementary channel
operation for PWMA.
4
FAULTA0-3
Input
(Schmitt)
Input
FAULTA0-3-- These Fault input pins are used for disabling
selected PWMA outputs in cases where fault conditions
originate off-chip.
6
PWMB0-5
Output
Tri- stated
PWMB0-5-- Six PWMB output pins.
Table 10. Interrupt and Program Control Signals (Continued)
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
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12
56F807 Technical Data
2.8 Serial Peripheral Interface (SPI) Signals
3
ISB0-2
Input
(Schmitt)
Input
ISB0-2-- These three input current status pins are used for
top/bottom pulse width correction in complementary channel
operation for PWMB.
4
FAULTB0-3
Input
(Schmitt)
Input
FAULTB0-3-- These four Fault input pins are used for
disabling selected PWMB outputs in cases where fault
conditions originate off-chip.
Table 13. Serial Peripheral Interface (SPI) Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
MISO
GPIOE6
Input/
Output
Input/Outp
ut
Input
Input
SPI Master In/Slave Out (MISO)--This serial data pin is an
input to a master device and an output from a slave device. The
MISO line of a slave device is placed in the high-impedance
state if the slave device is not selected.
Port E GPIO--This pin is a General Purpose I/O (GPIO) pin that
can individually be programmed as input or output pin.
After reset, the default state is MISO.
1
MOSI
GPIOE5
Input/
Output
Input/Outp
ut
Input
Input
SPI Master Out/Slave In (MOSI)--This serial data pin is an
output from a master device and an input to a slave device. The
master device places data on the MOSI line a half-cycle before
the clock edge that the slave device uses to latch the data.
Port E GPIO--This pin is a General Purpose I/O (GPIO) pin that
can individually be programmed as input or output pin.
After reset, the default state is MOSI.
1
SCLK
GPIOE4
Input/Outp
ut
Input/Outp
ut
Input
Input
SPI Serial Clock--In master mode, this pin serves as an
output, clocking slaved listeners. In slave mode, this pin serves
as the data clock input.
Port E GPIO--This pin is a General Purpose I/O (GPIO) pin that
can individually be programmed as input or output pin.
After reset, the default state is SCLK.
1
SS
GPIOE7
Input
Input/Outp
ut
Input
Input
SPI Slave Select--In master mode, this pin is used to arbitrate
multiple masters. In slave mode, this pin is used to select the
slave.
Port E GPIO--This pin is a General Purpose I/O (GPIO) pin that
can individually be programmed as input or output pin.
After reset, the default state is SS.
Table 12. Pulse Width Modulator (PWMA and PWMB) Signals (Continued)
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
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Quadrature Decoder Signals
56F807 Technical Data
13
2.9 Quadrature Decoder Signals
2.10 Serial Communications Interface (SCI) Signals
Table 14. Quadrature Decoder (Quad Dec0 and Quad Dec1) Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
PHASEA0
TA0
Input
Input/Output
Input
Input
Phase A--Quadrature Decoder #0 PHASEA input
TA0--Timer A Channel 0
1
PHASEB0
TA1
Input
Input/Output
Input
Input
Phase B--Quadrature Decoder #0 PHASEB input
TA1--Timer A Channel 1
1
INDEX0
TA2
Input
Input/Output
Input
Input
Index--Quadrature Decoder #0 INDEX input
TA2--Timer A Channel 2
1
HOME0
TA3
Input
Input/Output
Input
Input
Home--Quadrature Decoder #0 HOME input
TA3--Timer A Channel 3
1
PHASEA1
TB0
Input
Input/Output
Input
Input
Phase A--Quadrature Decoder #1 PHASEA input
TB0--Timer B Channel 0
1
PHASEB1
TB1
Input
Input/Output
Input
Input
Phase B--Quadrature Decoder #1 PHASEB input
TB1--Timer B Channel 1
1
INDEX1
TB2
Input
Input/Output
Input
Input
Index--Quadrature Decoder #1 INDEX input
TB2--Timer B Channel 2
1
HOME1
TB3
Input
Input/Output
Input
Input
Home--Quadrature Decoder #1 HOME input
TB3--Timer B Channel 3
Table 15. Serial Communications Interface (SCI0 and SCI1) Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
TXD0
GPIOE0
Output
Input/Outp
ut
Input
Input
Transmit Data (TXD0)--transmit data output
Port E GPIO--This pin is a General Purpose I/O (GPIO) pin
that can individually be programmed as input or output pin.
After reset, the default state is SCI output.
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14
56F807 Technical Data
2.11 CAN Signals
2.12 Analog-to-Digital Converter (ADC) Signals
1
RXD0
GPIOE1
Input
Input/Outp
ut
Input
Input
Receive Data (RXD0)-- receive data input
Port E GPIO--This pin is a General Purpose I/O (GPIO) pin
that can individually be programmed as input or output pin.
After reset, the default state is SCI input.
1
TXD1
GPIOD6
Output
Input/Outp
ut
Input
Input
Transmit Data (TXD1)--transmit data output
Port D GPIO--This pin is a General Purpose I/O (GPIO) pin
that can individually be programmed as input or output pin.
After reset, the default state is SCI output.
1
RXD1
GPIOD7
Input
Input/Outp
ut
Input
Input
Receive Data (RXD1)-- receive data input
Port D GPIO--This pin is a General Purpose I/O (GPIO) pin
that can individually be programmed as input or output pin.
After reset, the default state is SCI input.
Table 16. CAN Module Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
MSCAN_ RX
Input
(Schmitt)
Input
MSCAN Receive Data--MSCAN input. This pin has
an internal pull-up resistor.
1
MSCAN_ TX
Output
Output
MSCAN Transmit Data--MSCAN output. CAN output
is open-drain output and pull-up resistor is needed.
Table 17. Analog to Digital Converter Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
4
ANA0-3
Input
Input
ANA0-3--Analog inputs to ADCA channel 1
4
ANA4-7
Input
Input
ANA4-7--Analog inputs to ADCA channel 2
2
VREF
Input
Input
VREF--Analog reference voltage for ADC. Must be set to
V
DDA
-0.3V for optimal performance.
4
ANB0-3
Input
Input
ANB0-3--Analog inputs to ADCB, channel 1
4
ANB4-7
Input
Input
ANB4-7--Analog inputs to ADCB, channel 2
Table 15. Serial Communications Interface (SCI0 and SCI1) Signals (Continued)
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
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Quad Timer Module Signals
56F807 Technical Data
15
2.13 Quad Timer Module Signals
2.14 JTAG/OnCE
Part 3 Specifications
3.1 General Characteristics
The 56F807 is fabricated in high-density CMOS with 5V-tolerant TTL-compatible digital inputs. The term
"5V-tolerant" refers to the capability of an I/O pin, built on a 3.3V compatible process technology, to
withstand a voltage up to 5.5V without damaging the device. Many systems have a mixture of devices
designed for 3.3V and 5V power supplies. In such sytems, a bus may carry both 3.3V and 5V-compatible
I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of 3.3V
10% during
normal operation without causing damage). This 5V-tolerant capability therefore offers the power savings
of 3.3V I/O levels while being able to receive 5V levels without being damaged.
Table 18. Quad Timer Module Signals
No. of
Pins
Signal
Name
Signal Type
State During
Reset
Signal Description
2
TC0-1
Input/Output
Input
TC0-1--Timer C Channels 0 and 1
4
TD0-3
Input/Output
Input
TD0-3--Timer D Channels 0, 1, 2, and 3
Table 19. JTAG/On-Chip Emulation (OnCE) Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
TCK
Input
(Schmitt)
Input, pulled
low internally
Test Clock Input--This input pin provides a gated clock to
synchronize the test logic and shift serial data to the JTAG/OnCE
port. The pin is connected internally to a pull-down resistor.
1
TMS
Input
(Schmitt)
Input, pulled
high internally
Test Mode Select Input--This input pin is used to sequence the
JTAG TAP controller's state machine. It is sampled on the rising
edge of TCK and has an on-chip pull-up resistor.
1
TDI
Input
(Schmitt)
Input, pulled
high internally
Test Data Input--This input pin provides a serial input data
stream to the JTAG/OnCE port. It is sampled on the rising edge
of TCK and has an on-chip pull-up resistor.
1
TDO
Output
Tri-stated
Test Data Output--This tri-statable output pin provides a serial
output data stream from the JTAG/OnCE port. It is driven in the
Shift-IR and Shift-DR controller states, and changes on the falling
edge of TCK.
1
TRST
Input
(Schmitt)
Input, pulled
high internally
Test Reset--As an input, a low signal on this pin provides a
reset signal to the JTAG TAP controller. To ensure complete
hardware reset, TRST should be asserted at power-up and
whenever RESET is asserted. The only exception occurs in a
debugging environment when a hardware device reset is
required and it is necessary not to reset the OnCE/JTAG module.
In this case, assert RESET, but do not assert TRST.
1
DE
Output
Output
Debug Event--DE provides a low pulse on recognized debug
events.
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16
56F807 Technical Data
Absolute maximum ratings given in
Table 20
are stress ratings only, and functional operation at the
maximum is not guaranteed. Stress beyond these ratings may affect device reliability or cause permanent
damage to the device.
The 56F807 DC/AC electrical specifications are preliminary and are from design simulations. These
specifications may not be fully tested or guaranteed at this early stage of the product life cycle. Finalized
specifications will be published after complete characterization and device qualifications have been
completed.
CAUTION
This device contains protective circuitry to guard against
damage due to high static voltage or electrical fields. However,
normal precautions are advised to avoid application of any
voltages higher than maximum rated voltages to this
high-impedance circuit. Reliability of operation is enhanced if
unused inputs are tied to an appropriate voltage level.
Table 20. Absolute Maximum Ratings
Characteristic
Symbol
Min
Max
Unit
Supply voltage
V
DD
V
SS
0.3
V
SS
+ 4.0
V
All other input voltages, excluding Analog inputs
V
IN
V
SS
0.3
V
SS
+ 5.5V
V
Analog inputs, ANA0-7 and VREF
V
IN
V
SSA
0.3
V
DDA
+ 0.3
V
Analog inputs EXTAL and XTAL
V
IN
V
SSA
0.3
V
SSA
+ 3.0
V
Current drain per pin excluding V
DD
, V
SS
, PWM
outputs, TCS, VPP, V
DDA
, V
SSA
I
--
10
mA
Table 21. Recommended Operating Conditions
Characteristic
Symbol
Min
Typ
Max
Unit
Supply voltage, digital
V
DD
3.0
3.3
3.6
V
Supply Voltage, analog
V
DDA
3.0
3.3
3.6
V
ADC reference voltage
VREF
2.7
V
DDA
V
Ambient operating temperature
T
A
40
85
C
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General Characteristics
56F807 Technical Data
17
Notes:
1.
Theta-JA determined on 2s2p test boards is frequently lower than would be observed in an application.
Determined on 2s2p thermal test board.
2.
Junction to ambient thermal resistance, Theta-JA (
R
JA
) was simulated to be equivalent to the
JEDEC specification JESD51-2 in a horizontal configuration in natural convection. Theta-JA was
also simulated on a thermal test board with two internal planes (2s2p where "s" is the number of
signal layers and "p" is the number of planes) per JESD51-6 and JESD51-7. The correct name for
Theta-JA for forced convection or with the non-single layer boards is Theta-JMA.
3.
Junction to case thermal resistance, Theta-JC (R
JC
), was simulated to be equivalent to the measured
values using the cold plate technique with the cold plate temperature used as the "case" temperature.
The basic cold plate measurement technique is described by MIL-STD 883D, Method 1012.1. This
is the correct thermal metric to use to calculate thermal performance when the package is being used
with a heat sink.
4.
Thermal Characterization Parameter, Psi-JT (
JT
), is the "resistance" from junction to reference
point thermocouple on top center of case as defined in JESD51-2.
JT
is a useful value to use to
estimate junction temperature in steady state customer environments.
5.
Junction temperature is a function of on-chip power dissipation, package thermal resistance,
mounting site (board) temperature, ambient temperature, air flow, power dissipation of other
components on the board, and board thermal resistance.
6.
See Section 5.1 from more details on thermal design considerations.
Table 22. Thermal Characteristics
6
Characteristic
Comments
Symbol
Value
Unit
Notes
160-pin
LQFP
160
MBGA
Junction to ambient
Natural convection
R
JA
38.5
63.4
C/W
2
Junction to ambient (@1m/sec)
R
JMA
35.4
60.3
C/W
2
Junction to ambient
Natural convection
Four layer
board (2s2p)
R
JMA
(2s2p)
33
49.9
C/W
1,2
Junction to ambient (@1m/sec)
Four layer
board (2s2p)
R
JMA
31.5
46.8
C/W
1,2
Junction to case
R
JC
8.6
8.1
C/W
3
Junction to center of case
JT
0.8
0.6
C/W
4, 5
I/O pin power dissipation
P
I/O
User Determined
W
Power dissipation
P
D
P
D
= (I
DD
x V
DD
+ P
I/O
)
W
Junction to center of case
P
DMAX
(TJ - TA) /
JA
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18
56F807 Technical Data
3.2 DC Electrical Characteristics
Table 23. DC Electrical Characteristics
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
op
= 80MHz
Characteristic
Symbol
Min
Typ
Max
Unit
Input high voltage (XTAL/EXTAL)
V
IHC
2.25
--
2.75
V
Input low voltage (XTAL/EXTAL)
V
ILC
0
--
0.5
V
Input high voltage (Schmitt trigger inputs)
1
V
IHS
2.2
--
5.5
V
Input low voltage (Schmitt trigger inputs)
1
V
ILS
-0.3
--
0.8
V
Input high voltage (all other digital inputs)
V
IH
2.0
--
5.5
V
Input low voltage (all other digital inputs)
V
IL
-0.3
--
0.8
V
Input current high (pullup/pulldown resistors disabled,
V
IN
=V
DD
)
I
IH
-1
--
1
A
Input current low (pullup/pulldown resistors disabled,
V
IN
=V
SS
)
I
IL
-1
--
1
A
Input current high (with pullup resistor, V
IN
=V
DD
)
I
IHPU
-1
--
1
A
Input current low (with pullup resistor, V
IN
=V
SS
)
I
ILPU
-210
--
-50
A
Input current high (with pulldown resistor, V
IN
=V
DD
)
I
IHPD
20
--
180
A
Input current low (with pulldown resistor, V
IN
=V
SS
)
I
ILPD
-1
--
1
A
Nominal pullup or pulldown resistor value
R
PU
, R
PD
30
K
Output tri-state current low
I
OZL
-10
--
10
A
Output tri-state current high
I
OZH
-10
--
10
A
Input current high (analog inputs, V
IN
=V
DDA
)
2
I
IHA
-15
--
15
A
Input current low (analog inputs, V
IN
=V
SSA
)
3
I
ILA
-15
--
15
A
Output High Voltage (at IOH)
V
OH
V
DD
0.7
--
--
V
Output Low Voltage (at IOL)
V
OL
--
--
0.4
V
Output source current
I
OH
4
--
--
mA
Output source current
I
OL
4
--
--
mA
PWM pin output source current
3
I
OHP
10
--
--
mA
PWM pin output sink current
4
I
OLP
16
--
--
mA
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DC Electrical Characteristics
56F807 Technical Data
19
Input capacitance
C
IN
--
8
--
pF
Output capacitance
C
OUT
--
12
--
pF
V
DD
supply current
I
DDT
5
Run
6
--
195
220
mA
Wait
7
--
170
200
mA
Stop
--
115
145
mA
Low Voltage Interrupt, external power supply
8
V
EIO
2.4
2.7
3.0
V
Low Voltage Interrupt, internal power supply
9
V
EIC
2.0
2.2
2.4
V
Power on Reset
10
V
POR
--
1.7
2.0
V
1.
Schmitt Trigger inputs are: EXTBOOT, IRQA, IRQB, RESET, TCS, ISA0-2, FAULTA0-3, ISB0-2, FAULTB0-3,
TCK, TRST, TMS, TDI, and MSCAN_RX
2.
Analog inputs are: ANA[0:7], XTAL and EXTAL. Specification assumes ADC is not sampling.
3.
PWM pin output source current measured with 50% duty cycle.
4.
PWM pin output sink current measured with 50% duty cycle.
5.
I
DDT
= I
DD
+ I
DDA
(Total supply current for V
DD
+ V
DDA
)
6.
Run (operating) I
DD
measured using 8MHz clock source. All inputs 0.2V from rail; outputs unloaded. All ports
configured as inputs; measured with all modules enabled.
7.
Wait I
DD
measured using external square wave clock source (f
osc
= 8MHz) into XTAL; all inputs 0.2V from rail; no
DC loads; less than 50pF on all outputs. C
L
= 20pF on EXTAL; all ports configured as inputs; EXTAL capacitance linearly
affects wait I
DD
; measured with PLL enabled.
8.
This low voltage interrupt monitors the V
DDA
external power supply. V
DDA
is generally connected to the same
potential as V
DD
via separate traces. If V
DDA
drops below V
EIO
, an interrupt is generated. Functionality of the device is
guaranteed under transient conditions when V
DDA
>V
EIO
(between the minimum specified V
DD
and the point when the
V
EIO
interrupt is generated).
9.
This low voltage interrupt monitors the internally regulated core power supply. If the output from the internal voltage
is regulator drops below V
EIC
, an interrupt is generated. Since the core logic supply is internally regulated, this interrupt
will not be generated unless the external power supply drops below the minimum specified value (3.0V).
10. Power
on reset occurs whenever the internally regulated 2.5V digital supply drops below 1.5V typical. While power
is ramping up, this signal remains active as long as the internal 2.5V is below 1.5V typical, no matter how long the ramp-up
rate is. The internally regulated voltage is typically 100mV less than V
DD
during ramp-up until 2.5V is reached, at which
time it self-regulates.
Table 23. DC Electrical Characteristics (Continued)
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
op
= 80MHz
Characteristic
Symbol
Min
Typ
Max
Unit
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20
56F807 Technical Data
Figure 3. Maximum Run IDD vs. Frequency (see Note
6.
in
Table 16
)
3.3 AC Electrical Characteristics
Timing waveforms in
Section 3.3
are tested using the V
IL
and V
IH
levels specified in the DC Characteristics
table. In
Figure 4
the levels of V
IH
and V
IL
for an input signal are shown.
Figure 4. Input Signal Measurement References
Figure 5
shows the definitions of the following signal states:
Active state, when a bus or signal is driven, and enters a low impedance state.
Tri-stated, when a bus or signal is placed in a high impedance state.
Data Valid state, when a signal level has reached V
OL
or V
OH.
Data Invalid state, when a signal level is in transition between V
OL
and V
OH.
0
50
100
200
250
10
20
30
40
50
60
70
80
Freq. (MHz)
IDD (mA)
150
IDD Digital
IDD Analog
IDD Total
V
IH
V
IL
Fall Time
Input Signal
Note: The midpoint is V
IL
+ (V
IH
V
IL
)/2.
Midpoint1
Low
High
90%
50%
10%
Rise Time
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Flash Memory Characteristics
56F807 Technical Data
21
3.4 Flash Memory Characteristics
Figure 5. Signal States
Table 24. Flash Memory Truth Table
Mode
XE
1
1.
X address enable, all rows are disabled when XE=0
YE
2
2.
Y address enable, YMUX is disabled when YE=0
SE
3
3.
Sense amplifier enable
OE
4
4.
Output enable, tri-state Flash data out bus when OE=0
PROG
5
5.
Defines program cycle
ERASE
6
6.
Defines erase cycle
MAS1
7
7.
Defines mass erase cycle, erase whole block
NVSTR
8
8.
Defines non-volatile store cycle
Standby
L
L
L
L
L
L
L
L
Read
H
H
H
H
L
L
L
L
Word Program
H
H
L
L
H
L
L
H
Page Erase
H
L
L
L
L
H
L
H
Mass Erase
H
L
L
L
L
H
H
H
Table 25. IFREN Truth Table
Mode
IFREN=1
IFREN=0
Read
Read information block
Read main memory block
Word program
Program information block
Program main memory block
Page erase
Erase information block
Erase main memory block
Mass erase
Erase both block
Erase main memory block
Data Invalid State
Data1
Data2 Valid
Data
Tri-stated
Data3 Valid
Data2
Data3
Data1 Valid
Data Active
Data Active
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56F807 Technical Data
Table 26. Flash Timing Parameters
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6V, T
A
= 40
to +85
C, C
L
50pF
Characteristic
Symbol
Min Typ
Max
Unit
Figure
Program time
T
prog*
20
us
Figure 6
Erase time
T
erase*
20
ms
Figure 7
Mass erase time
T
me*
100
ms
Figure 8
Endurance
1
1.
One cycle is equal to an erase program and read.
E
CYC
10,000
20,000
cycles
Data Retention
1
@ 5000 cycles
D
RET
10
30
years
The following parameters should only be used in the Manual Word Programming Mode
PROG/ERASE to NVSTR set
up time
T
nvs*
5
us
Figure 6
,
Figure 7
,
Figure 8
NVSTR hold time
T
nvh*
5
us
Figure 6
,
Figure 7
NVSTR hold time (mass erase)
T
nvh1*
100
us
Figure 8
NVSTR to program set up time
T
pgs*
10
us
Figure 6
Recovery time
T
rcv*
1
us
Figure 6
,
Figure 7
,
Figure 8
Cumulative program
HV period
2
2.
Thv is the cumulative high voltage programming time to the same row before next erase. The same address cannot
be programmed twice before next erase.
T
hv
3
ms
Figure 6
Program hold time
3
3.
Parameters are guaranteed by design in smart programming mode and must be one cycle or greater.
*The Flash interface unit provides registers for the control of these parameters.
T
pgh
Figure 6
Address/data set up time
3
T
ads
Figure 6
Address/data hold time
3
T
adh
Figure 6
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Flash Memory Characteristics
56F807 Technical Data
23
Figure 6. Flash Program Cycle
XADR
YADR
YE
DIN
PROG
NVSTR
Tnvs
Tpgs
Tadh
Tprog
Tads
Tpgh
Tnvh
Trcv
Thv
IFREN
XE
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56F807 Technical Data
Figure 7. Flash Erase Cycle
Figure 8. Flash Mass Erase Cycle
XADR
YE=SE=OE=MAS1=0
ERASE
NVSTR
Tnvs
Tnvh
Trcv
Terase
IFREN
XE
XADR
YE=SE=OE=0
ERASE
NVSTR
Tnvs
Tnvh1
Trcv
Tme
MAS1
IFREN
XE
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External Clock Operation
56F807 Technical Data
25
3.5 External Clock Operation
The 56F807 system clock can be derived from an external crystal or an external system clock signal. To
generate a reference frequency using the internal oscillator, a reference crystal must be connected between
the EXTAL and XTAL pins.
3.5.1
Crystal Oscillator
The internal oscillator is also designed to interface with a parallel-resonant crystal resonator in the
frequency range specified for the external crystal in
Table 28
. In
Figure 9
a recommended crystal
oscillator circuit is shown. Follow the crystal supplier's recommendations when selecting a crystal, since
crystal parameters determine the component values required to provide maximum stability and reliable
start-up. The crystal and associated components should be mounted as close as possible to the EXTAL and
XTAL pins to minimize output distortion and start-up stabilization time. The internal 56F80x oscillator
circuitry is designed to have no external load capacitors present. As shown in
Figure 10
no external load
capacitors should be used.
The 56F80x components internally are modeled as a parallel resonant oscillator circuit to provide a
capacitive load on each of the oscillator pins (XTAL and EXTAL) of 10pF to 13pF over temperature and
process variations. Using a typical value of internal capacitance on these pins of 12pF and a value of 3pF as
a typical circuit board trace capacitance the parallel load capacitance presented to the crystal is 9pF as
determined by the following equation:
This is the value load capacitance that should be used when selecting a crystal and determining the actual
frequency of operation of the crystal oscillator circuit.
Figure 9. Connecting to a Crystal Oscillator
3.5.2
Ceramic Resonator
It is also possible to drive the internal oscillator with a ceramic resonator, assuming the overall system
design can tolerate the reduced signal integrity. In
Figure 10
, a typical ceramic resonator circuit is shown.
Refer to supplier's recommendations when selecting a ceramic resonator and associated components. The
resonator and components should be mounted as close as possible to the EXTAL and XTAL pins. The
internal 56F80x oscillator circuitry is designed to have no external load capacitors present. As shown in
Figure 9
no external load capacitors should be used.
CL =
CL1 * CL2
CL1 + CL2
+ Cs =
+ 3 = 6 + 3 = 9pF
12 * 12
12 + 12
Recommended External Crystal
Parameters:
R
z
= 1 to 3 M
f
c
= 8MHz (optimized for 8MHz)
EXTAL XTAL
R
z
f
c
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56F807 Technical Data
Figure 10. Connecting a Ceramic Resonator
Note: Motorola recommends only two terminal ceramic resonators vs. three terminal
resonators (which contain an internal bypass capacitor to ground).
3.5.3
External Clock Source
The recommended method of connecting an external clock is given in
Figure 11
. The external clock
source is connected to XTAL and the EXTAL pin is grounded.
Figure 11. Connecting an External Clock Signal
Figure 12. External Clock Timing
Table 27. External Clock Operation Timing Requirements
5
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C
Characteristic
Symbol
Min
Typ
Max
Unit
Frequency of operation (external clock driver)
1
1.
See
Figure 11
for details on using the recommended connection of an external clock driver.
f
osc
0
--
80
MHz
Clock Pulse Width
2
,
3
2.
The high or low pulse width must be no smaller than 6.25ns or the chip will not function.
3.
Parameters listed are guaranteed by design.
t
PW
6.25
--
--
ns
Recommended Ceramic Resonator
Parameters:
R
z
= 1 to 3 M
f
c
= 8MHz (optimized for 8MHz)
EXTAL XTAL
R
z
f
c
56F807
XTAL
EXTAL
External
V
SS
Clock
External
Clock
V
IH
V
IL
Note: The midpoint is V
IL
+ (V
IH
V
IL
)/2.
90%
50%
10%
90%
50%
10%
t
PW
t
PW
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External Bus Asynchronous Timing
56F807 Technical Data
27
3.5.4
Phase Locked Loop Timing
3.6 External Bus Asynchronous Timing
Table 28. PLL Timing
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C
Characteristic
Symbol
Min
Typ
Max
Unit
External reference crystal frequency for the PLL
1
1.
An externally supplied reference clock should be as free as possible from any phase jitter for the PLL to work
correctly. The PLL is optimized for 8MHz input crystal.2.
f
osc
4
8
10
MHz
PLL output frequency
2
2.
ZCLK may not exceed 80MHz. For additional information on ZCLK and
f
out
/2,
please refer to the OCCS chapter
in the User Manual. ZCLK = f
op
f
out
/2
40
--
110
MHz
PLL stabilization time
3
0
o
to +85
o
C
3.
This is the minimum time required after the PLL set-up is changed to ensure reliable operation.
t
plls
--
1
10
ms
PLL stabilization time
3
-40
o
to 0
o
C
t
plls
--
100
200
ms
Table 29. External Bus Asynchronous Timing
1,2
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
op
= 80MHz
Characteristic
Symbol
Min
Max
Unit
Address Valid to WR Asserted
t
AWR
6.5
--
ns
WR Width Asserted
Wait states = 0
Wait states > 0
t
WR
7.5
(T*WS)+7.5
--
--
ns
ns
WR Asserted to D0D15 Out Valid
t
WRD
--
T + 4.2
ns
Data Out Hold Time from WR Deasserted
t
DOH
4.8
--
ns
Data Out Set Up Time to WR Deasserted
Wait states = 0
Wait states > 0
t
DOS
2.2
(T*WS)+6.4
--
--
ns
ns
RD Deasserted to Address Not Valid
t
RDA
0
--
ns
Address Valid to RD Deasserted
Wait states = 0
Wait states > 0
t
ARDD
18.7
(T*WS) + 18.7
--
ns
ns
Input Data Hold to RD Deasserted
t
DRD
0
--
ns
RD Assertion Width
Wait states = 0
Wait states > 0
t
RD
19
(T*WS)+19
--
--
ns
ns
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56F807 Technical Data
Address Valid to Input Data Valid
Wait states = 0
Wait states > 0
t
AD
--
--
1
(T*WS)+1
ns
ns
Address Valid to RD Asserted
t
ARDA
-4.4
--
ns
RD Asserted to Input Data Valid
Wait states = 0
Wait states > 0
t
RDD
--
--
2.4
(T*WS) + 2.4
ns
ns
WR Deasserted to RD Asserted
t
WRRD
6.8
--
ns
RD Deasserted to RD Asserted
t
RDRD
0
--
ns
WR Deasserted to WR Asserted
t
WRWR
14.1
--
ns
RD Deasserted to WR Asserted
t
RDWR
12.8
--
ns
1.
Timing is both wait state and frequency dependent. In the formulas listed, WS = the number of wait states and
T = Clock Period. For 80MHz operation, T = 12.5ns.
2.
Parameters listed are guaranteed by design.
To calculate the required access time for an external memory for any frequency < 80MHz, use this formula:
Top = Clock period @ desired operating frequency
WS = Number of wait states
Memory Access Time = (Top*WS) + (Top- 11.5)
Figure 13. External Bus Asynchronous Timing
Table 29. External Bus Asynchronous Timing
1,2
(Continued)
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
op
= 80MHz
Characteristic
Symbol
Min
Max
Unit
A0A15,
PS, DS
(See Note)
WR
D0D15
RD
Note: During read-modify-write instructions and internal instructions, the address lines do not change state.
Data In
Data Out
t
AWR
t
ARDA
t
ARDD
t
RDA
t
RD
t
RDRD
t
RDWR
t
WRWR
t
WR
t
DOS
t
WRD
t
WRRD
t
AD
t
DOH
t
DRD
t
RDD
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Reset, Stop, Wait, Mode Select, and Interrupt Timing
56F807 Technical Data
29
3.7 Reset, Stop, Wait, Mode Select, and Interrupt Timing
,5
Table 30. Reset, Stop, Wait, Mode Select, and Interrupt Timing
1,5
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF
1.
In the formulas, T = clock cycle. For an operating frequency of 80MHz, T = 12.5ns.
Characteristic
Symbol
Min
Max
Unit
See
Figure
RESET Assertion to Address, Data and Control Signals
High Impedance
t
RAZ
--
21
ns
Figure 14
Minimum RESET Assertion Duration
2
OMR Bit 6 = 0
OMR Bit 6 = 1
2.
Circuit stabilization delay is required during reset when using an external clock or crystal oscillator in two cases:
After power-on reset
When recovering from Stop state
t
RA
275,000T
128T
--
--
ns
ns
Figure 14
RESET Deassertion to First External Address Output
t
RDA
33T
34T
ns
Figure 14
Edge-sensitive Interrupt Request Width
t
IRW
1.5T
--
ns
Figure 15
IRQA, IRQB Assertion to External Data Memory Access
Out Valid, caused by first instruction execution in the
interrupt service routine
t
IDM
15T
--
ns
Figure 16
IRQA, IRQB Assertion to General Purpose Output Valid,
caused by first instruction execution in the interrupt
service routine
t
IG
16T
--
ns
Figure 16
IRQA Low to First Valid Interrupt Vector Address Out
recovery from Wait State
3
3.
The minimum is specified for the duration of an edge-sensitive IRQA interrupt required to recover from the Stop state.
This is not the minimum required so that the IRQA interrupt is accepted.
t
IRI
13T
--
ns
Figure 17
IRQA Width Assertion to Recover from Stop State
4
4.
The interrupt instruction fetch is visible on the pins only in Mode 3.
5.
Parameters listed are guaranteed by design.
t
IW
2T
--
ns
Figure 18
Delay from IRQA Assertion to Fetch of first instruction
(exiting Stop)
OMR Bit 6 = 0
OMR Bit 6 = 1
t
IF
--
--
275,000T
12T
ns
ns
Figure 18
Duration for Level Sensitive IRQA Assertion to Cause
the Fetch of First IRQA Interrupt Instruction (exiting Stop)
OMR Bit 6 = 0
OMR Bit 6 = 1
t
IRQ
--
--
275,000T
12T
ns
ns
Figure 19
Delay from Level Sensitive IRQA Assertion to First
Interrupt Vector Address Out Valid (exiting Stop)
OMR Bit 6 = 0
OMR Bit 6 = 1
t
II
--
--
275,000T
12T
ns
ns
Figure 19
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56F807 Technical Data
Figure 14. Asynchronous Reset Timing
Figure 15. External Interrupt Timing (Negative-Edge-Sensitive)
Figure 16. External Level-Sensitive Interrupt Timing
Figure 17. Interrupt from Wait State Timing
First Fetch
t
RA
t
RAZ
t
RDA
A0A15,
D0D15
PS, DS,
RD, WR
RESET
First Fetch
IRQA,
IRQB
t
IRW
t
IDM
A0A15,
PS
,
DS
,
RD
,
WR
IRQA
,
IRQB
First Interrupt Instruction Execution
a) First Interrupt Instruction Execution
t
IG
General
Purpose
I/O Pin
IRQA
,
IRQB
b) General Purpose I/O
Instruction Fetch
t
IRI
IRQA,
IRQB
First Interrupt Vector
A0A15,
PS, DS,
RD, WR
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Serial Peripheral Interface (SPI) Timing
56F807 Technical Data
31
Figure 18. Recovery from Stop State Using Asynchronous Interrupt Timing
Figure 19. Recovery from Stop State Using IRQA Interrupt Service
Figure 20. Reset Output Timing
3.8 Serial Peripheral Interface (SPI) Timing
Table 31. SPI Timing
1
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
OP
= 80MHz
Characteristic
Symbol
Min
Max
Unit
See Figure
Cycle time
Master
Slave
t
C
50
25
--
--
ns
ns
Figures
21
-
24
Enable lead time
Master
Slave
t
ELD
--
25
--
--
ns
ns
Figure
24
Enable lag time
Master
Slave
t
ELG
--
100
--
--
ns
ns
Figure
24
Not IRQA Interrupt Vector
t
IW
IRQA
t
IF
A0A15,
PS, DS,
RD, WR
First Instruction Fetch
Instruction Fetch
t
IRQ
IRQA
t
II
A0A15
PS, DS,
RD, WR
First IRQA Interrupt
RSTO
t
RSTO
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56F807 Technical Data
1.
Parameters listed are guaranteed by design.
Clock (SCK) high time
Master
Slave
t
CH
17.6
12.5
--
--
ns
ns
Figures
21
,
22
,
23
,
24
Clock (SCK) low time
Master
Slave
t
CL
24.1
25
--
--
ns
ns
Figure
24
Data set-up time required for inputs
Master
Slave
t
DS
20
0
--
--
ns
ns
Figures
21
,
22
,
23
,
24
Data hold time required for inputs
Master
Slave
t
DH
0
2
--
--
ns
ns
Figures
21
,
22
,
23
,
24
Access time (time to data active from
high-impedance state)
Slave
t
A
4.8
15
ns
Figure
24
Disable time (hold time to high-impedance state)
Slave
t
D
3.7
15.2
ns
Figure
24
Data Valid for outputs
Master
Slave (after enable edge)
t
DV
--
--
4.5
20.4
ns
ns
Figures
21
,
22
,
23
,
24
Data invalid
Master
Slave
t
DI
0
0
--
--
ns
ns
Figures
21
,
22
,
23
,
24
Rise time
Master
Slave
t
R
--
--
11.5
10.0
ns
ns
Figures
21
,
22
,
23
,
24
Fall time
Master
Slave
t
F
--
--
9.7
9.0
ns
ns
Figures
21
,
22
,
23
,
24
Table 31. SPI Timing
1
(Continued)
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
OP
= 80MHz
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Serial Peripheral Interface (SPI) Timing
56F807 Technical Data
33
Figure 21. SPI Master Timing (CPHA = 0)
Figure 22. SPI Master Timing (CPHA = 1)
SCLK (CPOL = 0)
(Output)
SCLK (CPOL = 1)
(Output)
MISO
(Input)
MOSI
(Output)
MSB in
Bits 141
LSB in
t
F
t
C
t
CL
t
CL
t
R
t
R
t
F
t
DS
t
DH
t
CH
t
DI
t
DV
t
DI
(ref)
t
R
Master MSB out
Bits 141
Master LSB out
SS
(Input)
t
CH
SS is held High on master
t
F
SCLK (CPOL = 0)
(Output)
SCLK (CPOL = 1)
(Output)
MISO
(Input)
MOSI
(Output)
MSB in
Bits 141
LSB in
t
R
t
C
t
CL
t
CL
t
F
t
CH
t
DV
(ref)
t
DV
t
DI
(ref)
t
R
t
F
Master MSB out
Bits 14 1
Master LSB out
SS
(Input)
t
CH
SS is held High on master
t
DS
t
DH
t
DI
t
R
t
F
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34
56F807 Technical Data
Figure 23. SPI Slave Timing (CPHA = 0)
Figure 24. SPI Slave Timing (CPHA = 1)
SCLK (CPOL = 0)
(Input)
SCLK (CPOL = 1)
(Input)
MISO
(Output)
MOSI
(Input)
Slave MSB out
Bits 141
t
C
t
CL
t
CL
t
F
t
CH
t
DI
MSB in
Bits 141
LSB in
SS
(Input)
t
CH
t
DH
t
R
t
ELG
t
ELD
t
F
Slave LSB out
t
D
t
A
t
DS
t
DV
t
DI
t
R
SCLK (CPOL = 0)
(Input)
SCLK (CPOL = 1)
(Input)
MISO
(Output)
MOSI
(Input)
Slave MSB out
Bits 141
t
C
t
CL
t
CL
t
CH
t
DI
MSB in
Bits 141
LSB in
SS
(Input)
t
CH
t
DH
t
F
t
R
Slave LSB out
t
D
t
A
t
ELD
t
DV
t
F
t
R
t
ELG
t
DV
t
DS
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Quad Timer Timing
56F807 Technical Data
35
3.9 Quad Timer Timing
3.10 Quadrature Decoder Timing
Table 32. Timer Timing
1, 2
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
OP
= 80MHz
1.
In the formulas listed, T = the clock cycle. For 80MHz operation, T = 12.5ns.
2.
Parameters listed are guaranteed by design.
Characteristic
Symbol
Min
Max
Unit
Timer input period
P
IN
4T + 6
--
ns
Timer input high/low period
P
INHL
2T + 3
--
ns
Timer output period
P
OUT
2T
--
ns
Timer output high/low period
P
OUTHL
1T
--
ns
Figure 25. Timer Timing
Table 33. Quadrature Decoder Timing
1, 2
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
OP
= 80MHz
1.
In the formulas listed, T = the clock cycle. For 80MHz operation, T=12.5ns. V
SS
= 0V, V
DD
=
3.03.6V,
T
A
= 40
to +85
C, C
L
50pF.
2.
Parameters listed are guaranteed by design.
Characteristic
Symbol
Min
Max
Unit
Quadrature input period
P
IN
8T + 12
--
ns
Quadrature input high/low period
P
HL
4T + 6
--
ns
Quadrature phase period
P
PH
2T + 3
--
ns
P
OUT
P
OUTHL
P
OUTHL
P
IN
P
INHL
P
INHL
Timer Inputs
Timer Outputs
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36
56F807 Technical Data
3.11 Serial Communication Interface (SCI) Timing
Table 34. SCI Timing
4
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
OP
= 80MHz
Figure 27. RXD Pulse Width
Figure 28. TXD Pulse Width
Figure 26. Quadrature Decoder Timing
Characteristic
Symbol
Min
Max
Unit
Baud Rate
1
1.
f
MAX
is the frequency of operation of the system clock in MHz.
BR
--
(f
MAX
*2.5)/(80)
Mbps
RXD
2
Pulse Width
2.
The RXD pin in SCI0 is named RXD0 and the RXD pin in SCI1 is named RXD1.
RXD
PW
0.965/BR
1.04/BR
ns
TXD
3
Pulse Width
3.
The TXD pin in SCI0 is named TXD0 and the TXD pin in SCI1 is named TXD1.
4.
Parameters listed are guaranteed by design.
TXD
PW
0.965/BR
1.04/BR
ns
Phase B
(Input)
P
IN
P
HL
P
HL
Phase A
(Input)
P
IN
P
HL
P
HL
P
PH
P
PH
P
PH
P
PH
RXD
PW
RXD
SCI receive
data pin
(Input)
TXD
PW
TXD
SCI receive
data pin
(Input)
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Analog-to-Digital Converter (ADC) Characteristics
56F807 Technical Data
37
3.12 Analog-to-Digital Converter (ADC) Characteristics
Table 35. ADC Characteristics
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, V
REF
= V
DD
-0.3V, ADCDIV = 4, 9, or 14, (for optimal
performance), ADC clock = 4MHz, 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
OP
= 80MHz
Characteristic
Symbol
Min
Typ
Max
Unit
ADC input voltages
V
ADCIN
0
1
1.
For optimum ADC performance, keep the minimum V
ADCIN
value > 25mV. Inputs less than 25mV may convert
to a digital output code of 0.
--
V
REF
2
2.
V
REF
must be equal to or less than V
DDA
and must be greater than 2.7V. For optimal ADC performance, set V
REF
to V
DDA
-0.3V.
V
Resolution
R
ES
12
--
12
Bits
Integral Non-Linearity
3
3.
Measured in 10-90% range.
INL
--
+/- 2.5
+/- 4
LSB
4
4.
LSB = Least Significant Bit.
Differential Non-Linearity
DNL
--
+/- 0.9
+/- 1
LSB
4
Monotonicity
GUARANTEED
ADC internal clock
5
5.
Guaranteed by characterization.
f
ADIC
0.5
--
5
MHz
Conversion range
R
AD
V
SSA
--
V
DDA
V
Conversion time
t
ADC
--
6
--
t
AIC
cycles
6
6.
t
AIC
= 1/
f
ADIC
Sample time
t
ADS
--
1
--
t
AIC
cycles
6
Input capacitance
C
ADI
--
5
--
pF
6
Gain Error (transfer gain)
5
E
GAIN
0.93
1.00
1.08
--
Total Harmonic Distortion
5
THD
60
64
--
Offset Voltage
5
V
OFFSET
-90
-25
+10
mV
Signal-to-Noise plus Distortion
5
SINAD
55
60
--
--
Effective Number of Bits
5
ENOB
9
10
--
bit
Spurious Free Dynamic Range
5
SFDR
65
70
--
dB
Bandwidth
BW
--
100
--
KHz
ADC Quiescent Current (each dual ADC)
I
ADC
--
50
--
mA
V
REF
Quiescent Current (each dual ADC)
I
VREF
--
12
16.5
mA
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56F807 Technical Data
.
Figure 29. Equivalent Analog Input Circuit
1.
Parasitic capacitance due to package, pin to pin, and pin to package base coupling. (1.8pf)
2.
Parasitic capacitance due to the chip bond pad, ESD protection devices and signal routing. (2.04pf)
3.
Equivalent resistance for the ESD isolation resistor and the channel select mux. (500 ohms)
4.
Sampling capacitor at the sample and hold circuit. Capacitor 4 is normally disconnected from the input and is
only connected to it at sampling time. (1pf)
3.13 Controller Area Network (CAN) Timing
Table 36. CAN Timing
2
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, MSCAN Clock = 30MHz
Figure 30. Bus Wakeup Detection
Characteristic
Symbol
Min
Max
Unit
Baud Rate
BR
CAN
--
1
Mbps
Bus Wakeup detection
1
1.
If Wakeup glitch filter is enabled during the design initialization and also CAN is put into SLEEP mode then, any
bus event (on MSCAN_RX pin) whose duration is less than 5 microseconds is filtered away. However, a valid CAN bus
wakeup detection takes place for a wakeup pulse equal to or greater than 5 microseconds. The number 5 microseconds
originates from the fact that the CAN wakeup message consists of 5 dominant bits at the highest possible baud rate of
1Mbps.
2.
Parameters listed are guaranteed by design
T
WAKEUP
5
--
s
1
2
3
4
ADC analog input
T
WAKEUP
MSCAN_RX
CAN receive
data pin
(Input)
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JTAG Timing
56F807 Technical Data
39
3.14 JTAG Timing
Table 37. JTAG Timing
1, 3
Operating Conditions:
V
SS
= V
SSA
= 0 V, V
DD
= V
DDA
= 3.03.6 V, T
A
= 40
to +85
C, C
L
50pF, f
OP
= 80MHz
1.
Timing is both wait state and frequency dependent. For the values listed, T = clock cycle. For 80MHz operation,
T = 12.5ns.
Characteristic
Symbol
Min
Max
Unit
TCK frequency of operation
2
2.
TCK frequency of operation must be less than 1/8 the processor rate.
3.
Parameters listed are guaranteed by design.
f
OP
DC
10
MHz
TCK cycle time
t
CY
100
--
ns
TCK clock pulse width
t
PW
50
--
ns
TMS, TDI data set-up time
t
DS
0.4
--
ns
TMS, TDI data hold time
t
DH
1.2
--
ns
TCK low to TDO data valid
t
DV
--
26.6
ns
TCK low to TDO tri-state
t
TS
--
23.5
ns
TRST assertion time
t
TRST
50
--
ns
DE assertion time
t
DE
4T
--
ns
Figure 31. Test Clock Input Timing Diagram
TCK
(Input)
V
M
V
IL
V
M
= V
IL
+ (V
IH
V
IL
)/2
t
PW
t
CY
t
PW
V
M
V
IH
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40
56F807 Technical Data
Figure 32. Test Access Port Timing Diagram
Figure 33. TRST Timing Diagram
Figure 34. OnCE--Debug Event
Input Data Valid
Output Data Valid
Output Data Valid
t
DS
t
DH
t
DV
t
TS
t
DV
TCK
(Input)
TDI
(Input)
TDO
(Output)
TDO
(Output
)
TDO
(Output)
TMS
TRST
(Input)
t
TRST
DE
t
DE
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Package and Pin-Out Information 56F807
56F807 Technical Data
41
Part 4 Packaging
4.1 Package and Pin-Out Information 56F807
This section contains package and pin-out information for the 56F807. This device comes in two case types:
low-profile quad flat pack (LQFP) or mold array process ball grid assembly (MAPBGA).
Figure 35
shows
the package outline for the LQFP case,
Figure 36
shows the mechanical parameters for the LQFP case, and
Table 38
lists the pinout for the LQFP case.
Figure 37
shows the mechanical parameters for the MAPBGA
case, and
Table 39
lists the pinout for the MAPBGA package.
Figure 35. Top View, 56F807 160-pin LQFP Package
A0
A1
A2
A3
A4
A5
A6
A7
V
DD
A8
A9
A10
A11
A12
A13
A14
A15
V
SS
PS
DS
WR
RD
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
D10
V
DD
D11
D12
D13
D14
D15
GPIOB0
GP
I
O
B
1
GP
I
O
B
2
GP
I
O
B
3
GP
I
O
B
4
GP
I
O
B
5
GP
I
O
B
6
GP
I
O
B
7
V
SS
GP
I
O
D0
GP
I
O
D1
GP
I
O
D2
GP
I
O
D3
GP
I
O
D4
GP
I
O
D5
TX
D
1
RX
D1
PW
M
B0
PW
M
B1
PW
M
B2
PW
M
B3
PW
M
B4
PW
M
B5
V
DD
ISB
0
VC
AP
C1
ISB
1
ISB
2
VPP
2
IR
Q
A
IR
Q
B
FA
U
L
T
B
0
FA
U
L
T
B
1
FA
U
L
T
B
2
FA
U
L
T
B
3
PW
M
A0
V
SS
PW
M
A1
PW
M
A2
PW
M
A3
PW
M
A4
PIN 1
ORIENTATION
MARK
PIN 41
PIN 121
PIN 81
ANB7
ANB6
ANB5
ANB4
ANB3
ANB2
ANB1
ANB0
V
SSA
V
DDA
VREF2
ANA7
ANA6
ANA5
ANA4
ANA3
ANA2
ANA1
ANA0
V
SSA
V
DDA
VREF
RESET
RSTO
V
DD
V
SS
V
DD
EXTAL
XTAL
V
SS
V
SS
V
DD
V
DDA
V
SSA
EXTBOOT
FAULTA3
FAULTA2
FAULTA1
FAULTA0
PWMA5
RX
D0
TX
D
0
CL
K0
V
SS
VP
P
HOM
E
1
IN
D
X
1
V
DD
PH
B1
PH
A1
HOM
E
0
IN
D
X
0
PH
B0
PH
A0
MOS
I
MI
S
O
SC
L
K
SS
M
S
C
A
N_
RX
V
SS
V
DD
MS
C
A
N
_
T
X
VC
AP
C2
TD
O
TD
I
TM
S
TC
K
TC
S
TR
S
T
TC
1
TC
0
TD
3
TD
2
TD
1
TD
0
IS
A2
IS
A1
IS
A0
V
SS
DE
Motorola
56F807
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42
56F807 Technical Data
Figure 36. 160-pin LQFP Mechanical Information
CASE 1259-01
ISSUE O
DIM
MIN
MAX
MILLIMETERS
A
---
1.60
A1
0.05
0.15
A2
1.35
1.45
b
0.17
0.27
b1
0.17
0.23
c
0.09
0.20
c1
0.09
0.16
D
26.00 BSC
D1
24.00 BSC
e
0.50 BSC
E
26.00 BSC
E1
24.00 BSC
L
0.45
0.75
L1
1.00 REF
R1
0.08
---
R2
0.08
0.20
S
0.20
---
0
7
1
0
---
2
11
13
3
11
13
0.25
6
NOTES:
1.
DIMENSIONS ARE IN MILLIMETERS.
2.
INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3.
DATUMS A, B, AND D TO BE DETERMINED
WHERE THE LEADS EXIT THE PLASTIC BODY
AT DATUM PLANE H.
4.
DIMENSIONS D1 AND E1 DO NOT INCLUDE
MOLD PROTRUSION. ALLOWABLE
PROTRUSION IS 0.25mm PER SIDE.
DIMENSIONS D1 AND E1 ARE MAXIMUM
PLASTIC BODY SIZE DIMENSIONS
INCLUDING MOLD MISMATCH.
5.
DIMENSION b DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL NOT CAUSE THE LEAD
WIDTH TO EXCEED THE MAXIMUM b
DIMENSION BY MORE THAN 0.08mm.
DAMBAR CAN NOT BE LOCATED ON THE
LOWER RADIUS OR THE FOOT. MINIMUM
SPACE BETWEEN A PROTRUSION AND AN
ADJACENT LEAD IS 0.07mm.
6.
EXACT SHAPE OF CORNERS MAY VARY.
D
B
A
D
G G
D
2
D1
2
E1
2
D1
E1
E
2
E
A-B
0.20
D
H
A-B
M
0.08
D
C
4X
A-B
0.20
D
C
160X
0.08 C
C
SEATING
PLANE
156X
e
4X
e/2
160X
e
DETAIL F
2
1
3
A
A2
A1
S
L
(L1)
R1
R2
H
GAGE
PLANE
DETAIL F
c
(b)
b
c1
SECTION G-G
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Package and Pin-Out Information 56F807
56F807 Technical Data
43
Table 38. 56F807 LQFP Package Pin Identification by Pin Number
Pin No.
Signal Name
Pin No.
Signal Name
Pin No.
Signal Name
Pin No.
Signal Name
1
A0
41
GPIOB1
81
PWMA5
121
DE
2
A1
42
GPIOB2
82
FAULTA0
122
V
SS
3
A2
43
GPIOB3
83
FAULTA1
123
ISA0
4
A3
44
GPIOB4
84
FAULTA2
124
ISA1
5
A4
45
GPIOB5
85
FAULTA3
125
ISA2
6
A5
46
GPIOB6
86
EXTBOOT
126
TD0
7
A6
47
GPIOB7
87
V
SSA
127
TD1
8
A7
48
V
SS
88
V
DDA
128
TD2
9
V
DD
49
GPIOD0
89
V
DD
129
TD3
10
A8
50
GPIOD1
90
V
SS
130
TC0
11
A9
51
GPIOD2
91
V
SS
131
TC1
12
A10
52
GPIOD3
92
XTAL
132
TRST
13
A11
53
GPIOD4
93
EXTAL
133
TCS
14
A12
54
GPIOD5
94
V
DD
134
TCK
15
A13
55
TXD1
95
V
SS
135
TMS
16
A14
56
RXD1
96
V
DD
136
TDI
17
A15
57
PWMB0
97
RSTO
137
TDO
18
V
SS
58
PWMB1
98
RESET
138
VCAPC2
19
PS
59
PWMB2
99
VREF
139
MSCAN_TX
20
DS
60
PWMB3
100
V
DDA
140
V
DD
21
WR
61
PWMB4
101
V
SSA
141
V
SS
22
RD
62
PWMB5
102
ANA0
142
MSCAN_RX
23
D0
63
V
DD
103
ANA1
143
SS
24
D1
64
ISB0
104
ANA2
144
SCLK
25
D2
65
VCAPC1
105
ANA3
145
MISO
26
D3
66
ISB1
106
ANA4
146
MOSI
27
D4
67
ISB2
107
ANA5
147
PHA0
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44
56F807 Technical Data
28
D5
68
VPP2
108
ANA6
148
PHB0
29
D6
69
IRQA
109
ANA7
149
INDX0
30
D7
70
IRQB
110
VREF2
150
HOME0
31
D8
71
FAULTB0
111
V
DDA
151
PHA1
32
D9
72
FAULTB1
112
V
SSA
152
PHB1
33
D10
73
FAULTB2
113
ANB0
153
V
DD
34
V
DD
74
FAULTB3
114
ANB1
154
INDX1
35
D11
75
PWMA0
115
ANB2
155
HOME1
36
D12
76
V
SS
116
ANB3
156
VPP
37
D13
77
PWMA1
117
ANB4
157
V
SS
38
D14
78
PWMA2
118
ANB5
158
CLKO
39
D15
79
PWMA3
119
ANB6
159
TXD0
40
GPIOB0
80
PWMA4
120
ANB7
160
RXD0
Table 38. 56F807 LQFP Package Pin Identification by Pin Number (Continued)
Pin No.
Signal Name
Pin No.
Signal Name
Pin No.
Signal Name
Pin No.
Signal Name
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Package and Pin-Out Information 56F807
56F807 Technical Data
45
Figure 37. 160 MAPBGA Mechanical Information
NOTES:
1.
DIMENSIONS ARE IN MILLIMETERS.
2.
INTERPRET DIMENSIONS AND
TOLERANCES PER ASME Y14.5M, 1994.
3.
DIMENSION b IS MEASURED AT THE
MAXIMUM SOLDER BALL DIAMETER,
PARALLEL TO DATUM PLANE Z.
4.
DATUM Z (SEATING PLANE) IS DEFINED BY
THE SPHERICAL CROWNS OF THE SOLDER
BALLS.
5.
PARALLELISM MEASUREMENT SHALL
EXCLUDE ANY EFFECT OF MARK ON TOP
SURFACE OF PACKAGE.
CASE 1268-01
ISSUE O
DATE 04/06/98
X
0.20
LASER MARK FOR PIN 1
IDENTIFICATION IN
THIS AREA
e
13X
D
E
M
S
A1
A2
A
0.15 Z
0.30 Z
Z
ROTATED 90 CLOCKWISE
DETAIL K
5
VIEW M-M
e
13X
S
X
0.30
Y
Z
0.10 Z
3
b
160X
METALIZED MARK FOR
PIN 1 IDENTIFICATION
IN THIS AREA
14
13
12 11 10
9
6
5
4
3
2
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
4
160X
DIM MIN
MAX
MILLIMETERS
A
1.32
1.75
A1
0.27
0.47
A2
1.18 REF
b
0.35
0.65
D
15.00 BSC
E
15.00 BSC
e
1.00 BSC
S
0.50 BSC
Y
K
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56F807 Technical Data
Table 39. 160 MAPBGA Package Pin Identification by Pin Number
Solder
Ball
Signal Name
Solder
Ball
Signal Name
Solder
Ball
Signal Name
Solder
Ball
Signal Name
C3
A0
N4
GPIOB5
K12
V
SSA
E10
TC1
B2
A1
P4
GPIOB6
K13
V
DDA
D9
TRST
D3
A2
M4
GPIOB7
L14
V
DD
B9
TCS
C2
A3
L5
V
SS
K11
V
SS
E9
TCK
B1
A4
N5
GPIOD0
K14
V
SS
A9
TMS
D2
A5
P5
GPIOD1
J13
XTAL
D8
TDI
C1
A6
K5
GPIOD2
J12
EXTAL
B8
TDO
D1
A7
N6
GPIOD3
J14
V
DD
A8
VCAPC2
E3
V
DD
L6
GPIOD4
J11
V
SS
E8
MSCAN_TX
E2
A8
K6
GPIOD5
H13
V
DD
D7
V
DD
E1
A9
P6
TXD1
H12
RSTO
E7
V
SS
F3
A10
N7
RXD1
H14
RESET
D6
MSCAN_RX
F2
A11
L7
PWMB0
H11
VREF
H1
D1
F1
A12
P7
PWMB1
G12
V
DDA
H2
D2
G3
A13
K7
PWMB2
G11
V
SSA
J3
D3
G2
A14
L8
PWMB3
G14
ANA0
J1
D4
G1
A15
K8
PWMB4
B13
DE
J2
D5
F4
V
SS
P8
PWMB5
A14
V
SS
K3
D6
G4
PS
L9
V
DD
B12
ISA0
K1
D7
H4
DS
N8
ISB0
A13
ISA1
L1
D8
J4
WR
P14
PWMA5
A12
ISA2
K2
D9
K4
RD
M13
FAULTA0
B11
TD0
L3
D10
P1
GPIOB1
L12
FAULTA1
A11
TD1
M1
V
DD
N3
GPIOB2
N14
FAULTA2
D10
TD2
L2
D11
P2
GPIOB3
L13
FAULTA3
B10
TD3
N1
D12
P3
GPIOB4
M14
EXTBOOT
A10
TC0
M2
D13
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Package and Pin-Out Information 56F807
56F807 Technical Data
47
N2
D14
N11
V
SS
D14
V
SSA
D5
PHB0
M3
D15
P13
PWMA1
D11
ANA8
B6
INDX0
L4
GPIOB0
N12
PWMA2
D12
ANA9
A5
HOME0
K10
VCAPC1
N13
PWMA3
D13
ANA10
E4
PHA1
K9
ISB1
M12
PWMA4
C14
ANA11
B5
PHB1
P9
ISB2
F11
ANA1
C13
ANA12
A4
V
DD
L10
VPP2
G13
ANA2
C11
ANA13
D4
INDX1
N9
IRQA
F12
ANA3
B14
ANA14
C4
HOME1
P10
IRQB
F14
ANA4
C12
ANA15
B4
VPP
P11
FAULTB0
E11
ANA5
A7
SS
A2
CLKO
N10
FAULTB1
F13
ANA6
E5
SCLK
B3
TXD0
L11
FAULTB2
E12
ANA7
B7
MISO
A1
RXD0
M11
FAULTB3
E14
VREF2
A6
MOSI
A3
V
SS
P12
PWMA0
E13
V
DDA
E6
PHA0
H3
D0
Table 39. 160 MAPBGA Package Pin Identification by Pin Number (Continued)
Solder
Ball
Signal Name
Solder
Ball
Signal Name
Solder
Ball
Signal Name
Solder
Ball
Signal Name
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56F807 Technical Data
Part 5 Design Considerations
5.1 Thermal Design Considerations
An estimation of the chip junction temperature, T
J
, in
C can be obtained from the equation:
Equation 1:
Where:
T
A
= ambient temperature C
R
JA
= package junction-to-ambient thermal resistance C/W
P
D
= power dissipation in package
Historically, thermal resistance has been expressed as the sum of a junction-to-case thermal resistance and
a case-to-ambient thermal resistance:
Equation 2:
Where:
R
JA
= package junction-to-ambient thermal resistance C/W
R
JC
= package junction-to-case thermal resistance C/W
R
CA
= package case-to-ambient thermal resistance C/W
R
JC
is device-related and cannot be influenced by the user. The user controls the thermal environment to
change the case-to-ambient thermal resistance, R
CA
. For example, the user can change the air flow around
the device, add a heat sink, change the mounting arrangement on the Printed Circuit Board (PCB), or
otherwise change the thermal dissipation capability of the area surrounding the device on the PCB. This
model is most useful for ceramic packages with heat sinks; some 90% of the heat flow is dissipated through
the case to the heat sink and out to the ambient environment. For ceramic packages, in situations where the
heat flow is split between a path to the case and an alternate path through the PCB, analysis of the device
thermal performance may need the additional modeling capability of a system level thermal simulation tool.
The thermal performance of plastic packages is more dependent on the temperature of the PCB to which the
package is mounted. Again, if the estimations obtained from R
JA
do not satisfactorily answer whether the
thermal performance is adequate, a system level model may be appropriate.
Definitions:
A complicating factor is the existence of three common definitions for determining the junction-to-case
thermal resistance in plastic packages:
Measure the thermal resistance from the junction to the outside surface of the package (case) closest
to the chip mounting area when that surface has a proper heat sink. This is done to minimize
temperature variation across the surface.
Measure the thermal resistance from the junction to where the leads are attached to the case. This
definition is approximately equal to a junction to board thermal resistance.
Use the value obtained by the equation (T
J
T
T
)/P
D
where T
T
is the temperature of the package
case determined by a thermocouple.
T
J
T
A
P
D
R
JA
(
)
+
=
R
JA
R
JC
R
CA
+
=
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56F807 Technical Data
The thermal characterization parameter is measured per JESD51-2 specification using a 40-gauge type T
thermocouple epoxied to the top center of the package case. The thermocouple should be positioned so that
the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple
junction and over about 1mm of wire extending from the junction. The thermocouple wire is placed flat
against the package case to avoid measurement errors caused by cooling effects of the thermocouple wire.
When heat sink is used, the junction temperature is determined from a thermocouple inserted at the interface
between the case of the package and the interface material. A clearance slot or hole is normally required in
the heat sink. Minimizing the size of the clearance is important to minimize the change in thermal
performance caused by removing part of the thermal interface to the heat sink. Because of the experimental
difficulties with this technique, many engineers measure the heat sink temperature and then back-calculate
the case temperature using a separate measurement of the thermal resistance of the interface. From this case
temperature, the junction temperature is determined from the junction-to-case thermal resistance.
5.2 Electrical Design Considerations
Use the following list of considerations to assure correct operation:
Provide a low-impedance path from the board power supply to each V
DD
pin on the hybrid
controller, and from the board ground to each V
SS
pin.
The minimum bypass requirement is to place 0.1
F capacitors positioned as close as possible to
the package supply pins. The recommended bypass configuration is to place one bypass capacitor
on each of the V
DD
/V
SS
pairs, including V
DDA
/V
SSA.
Ceramic and tantalum capacitors tend to
provide better performance tolerances.
Ensure that capacitor leads and associated printed circuit traces that connect to the chip V
DD
and
V
SS
pins are less than 0.5 inch per capacitor lead.
Bypass the V
DD
and V
SS
layers of the PCB with approximately 100
F, preferably with a
high-grade capacitor such as a tantalum capacitor.
Because the controller's output signals have fast rise and fall times, PCB trace lengths should be
minimal.
Consider all device loads as well as parasitic capacitance due to PCB traces when calculating
capacitance. This is especially critical in systems with higher capacitive loads that could create
higher transient currents in the V
DD
and V
SS
circuits.
CAUTION
This device contains protective circuitry to guard
against damage due to high static voltage or electrical
fields. However, normal precautions are advised to
avoid application of any voltages higher than maximum
rated voltages to this high-impedance circuit. Reliability
of operation is enhanced if unused inputs are tied to an
appropriate voltage level.
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56F807 Technical Data
Take special care to minimize noise levels on the VREF, V
DDA
and V
SSA
pins.
Designs that utilize the TRST pin for JTAG port or OnCE module functionality (such as
development or debugging systems) should allow a means to assert TRST whenever RESET is
asserted, as well as a means to assert TRST independently of RESET. TRST must be asserted at
power up for proper operation. Designs that do not require debugging functionality, such as
consumer products, TRST should be tied low.
Because the Flash memory is programmed through the JTAG/OnCE port, designers should provide
an interface to this port to allow in-circuit Flash programming.
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Electrical Design Considerations
56F807 Technical Data
51
Part 6 Ordering Information
Table 40
lists the pertinent information needed to place an order. Consult a Motorola Semiconductor sales
office or authorized distributor to determine availability and to order parts.
Table 40. 56F807 Ordering Information
Part
Supply
Voltage
Package Type
Pin
Count
Frequency
(MHz)
Order Number
56F807
3.03.6 V
Low-Profile Quad Flat Pack (LQFP)
160
80
DSP56F807PY80
56F807
3.03.6 V
Mold Array Process Ball Grid Array
(MAPBGA)
160
80
DSP56F807VF80
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HOW TO REACH US:
USA/EUROPE/LOCATIONS NOT LISTED:
Motorola Literature Distribution
P.O. Box 5405, Denver, Colorado 80217
1-800-521-6274 or 480-768-2130
JAPAN:
Motorola Japan Ltd.
SPS, Technical Information Center
3-20-1, Minami-Azabu
Minato-ku
Tokyo 106-8573, Japan
81-3-3440-3569
ASIA/PACIFIC:
Motorola Semiconductors H.K. Ltd.
Silicon Harbour Centre
2 Dai King Street
Tai Po Industrial Estate
Tai Po, N.T. Hong Kong
852-26668334
HOME PAGE:
http://motorola.com/semiconductors
Information in this document is provided solely to enable system and software
implementers to use Motorola products. There are no express or implied copyright
licenses granted hereunder to design or fabricate any integrated circuits or
integrated circuits based on the information in this document.
Motorola reserves the right to make changes without further notice to any products
herein. Motorola makes no warranty, representation or guarantee regarding the
suitability of its products for any particular purpose, nor does Motorola assume any
liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation consequential or incidental
damages. "Typical" parameters which may be provided in Motorola data sheets
and/or specifications can and do vary in different applications and actual
performance may vary over time. All operating parameters, including "Typicals"
must be validated for each customer application by customer's technical experts.
Motorola does not convey any license under its patent rights nor the rights of
others. Motorola products are not designed, intended, or authorized for use as
components in systems intended for surgical implant into the body, or other
applications intended to support or sustain life, or for any other application in which
the failure of the Motorola product could create a situation where personal injury or
death may occur. Should Buyer purchase or use Motorola products for any such
unintended or unauthorized application, Buyer shall indemnify and hold Motorola
and its officers, employees, subsidiaries, affiliates, and distributors harmless
against all claims, costs, damages, and expenses, and reasonable attorney fees
arising out of, directly or indirectly, any claim of personal injury or death associated
with such unintended or unauthorized use, even if such claim alleges that Motorola
was negligent regarding the design or manufacture of the part.
Motorola and the Stylized M Logo are registered in the U.S. Patent and Trademark
Office. digital dna is a trademark of Motorola, Inc. All other product or service
names are the property of their respective owners. Motorola, Inc. is an Equal
Opportunity/Affirmative Action Employer.
Motorola, Inc. 2004
DSP56F807/D
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