54AC574
54ACT574
Octal D-Type Flip-Flop with TRI-STATE
Outputs
General Description
The 'AC/'ACT574 is a high-speed, low power octal flip-flop
with a buffered common Clock (CP) and a buffered common
Output Enable (OE). The information presented to the D in-
puts is stored in the flip-flops on the LOW-to-HIGH Clock
(CP) transition.
The 'AC/'ACT574 is functionally identical to the 'AC/'ACT374
except for the pinouts.
Features
n
I
CC
and I
OZ
reduced by 50%
n
Inputs and outputs on opposite sides of package
allowing easy interface with microprocessors
n
Useful as input or output port for microprocessors
n
Functionally identical to 'AC/'ACT374
n
TRI-STATE outputs for bus-oriented applications
n
Outputs source/sink 24 mA
n
'ACT574 has TTL-compatible inputs
n
Standard Microcircuit Drawing (SMD)
-- 'ACT574: 5962-89601
Logic Symbols
Pin Names
Description
D
0
D
7
Data Inputs
CP
Clock Pulse Input
OE
TRI-STATE Output Enable Input
O
0
O
7
TRI-STATE Outputs
TRI-STATE
is a registered trademark of National Semiconductor Corporation.
FACT
TM
is a trademark of Fairchild Semiconductor Corporation.
DS100256-1
IEEE/IEC
DS100256-4
September 1998
54AC574
54ACT574
Octal
D-T
ype
Flip-Flop
with
TRI-ST
A
T
E
Outputs
1998 National Semiconductor Corporation
DS100256
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Connection Diagrams
Functional Description
The 'AC/'ACT574 consists of eight edge-triggered flip-flops
with individual D-type inputs and TRI-STATE true outputs.
The buffered clock and buffered Output Enable are common
to all flip-flops. The eight flip-flops will store the state of their
individual D inputs that meet the setup and hold time require-
ments on the LOW-to-HIGH Clock (CP) transition. With the
Output Enable (OE) LOW, the contents of the eight flip-flops
are available at the outputs. When OE is HIGH, the outputs
go to the high impedance state. Operation of the OE input
does not affect the state of the flip-flops.
Function Table
Inputs
Internal
Outputs
Function
OE
CP
D
Q
O
N
H
H
L
NC
Z
Hold
H
H
H
NC
Z
Hold
H
N
L
L
Z
Load
H
N
H
H
Z
Load
L
N
L
L
L
Data Available
L
N
H
H
H
Data Available
L
H
L
NC
NC
No Change in Data
L
H
H
NC
NC
No Change in Data
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
N = LOW-to-HIGH Transition
NC = No Change
Pin Assignment for DIP,
and Flatpak
DS100256-2
Pin Assignment
for LCC
DS100256-3
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2
Logic Diagram
DS100256-5
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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3
Absolute Maximum Ratings
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
CC
)
-0.5V to +7.0V
DC Input Diode Current (I
IK
)
V
I
= -0.5V
-20 mA
V
I
= V
CC
+0.5V
+20 mA
DC Input Voltage (V
I
)
-0.5V to V
CC
+0.5V
DC Output Diode Current (I
OK
)
V
O
= -0.5V
-20 mA
V
O
= V
CC
+0.5V
+20 mA
DC Output Voltage (V
O
)
-0.5V to V
CC
+0.5V
DC Output Source or Sink Current
(I
O
)
50 mA
DC V
CC
or Ground Current
Per Output Pin (I
CC
or I
GND
)
50 mA
Storage Temperature (T
STG
)
-65C to +150C
Junction Temperature (T
J
)
CDIP
175C
Recommended Operating
Conditions
Supply Voltage (V
CC
)
(Unless Otherwise Specified) (AC)
2.0V to 6.0V
(ACT)
4.5V to 5.5V
Input Voltage (V
I
)
0V to V
CC
Output Voltage (V
O
)
0V to V
CC
Operating Temperature (T
A
)
54AC/ACT
-55C to +125C
Minimum Input Edge Rate (
V/
t)
'AC Devices
V
IN
from 30% to 70% of V
CC
V
CC
@
3.3V, 4.5V, 5.5V
125 mV/ns
Minimum Input Edge Rate (
V/
t)
'ACT Devices
V
IN
from 0.8V to 2.0V
V
CC
@
4.5V, 5.5V
125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT
TM
circuits outside databook specifications.
DC Characteristics for 'AC Family Devices
54AC
Symbol
Parameter
V
CC
T
A
=
Units
Conditions
(V)
-55C to +125C
Guaranteed Limits
V
IH
Minimum High
3.0
2.1
V
OUT
= 0.1V
Level Input
4.5
3.15
V
or V
CC
- 0.1V
Voltage
5.5
3.85
V
IL
Maximum Low
3.0
0.9
V
OUT
= 0.1V
Level Input
4.5
1.35
V
or V
CC
- 0.1V
Voltage
5.5
1.65
V
OH
Minimum High
3.0
2.9
I
OUT
= -50 A
Level Output
4.5
4.4
V
Voltage
5.5
5.4
(Note 2)
V
IN
= V
IL
or V
IH
3.0
2.4
-12 mA
4.5
3.7
V
I
OH
-24 mA
5.5
4.7
-24 mA
V
OL
Maximum Low
3.0
0.1
I
OUT
= 50 A
Level Output
4.5
0.1
V
Voltage
5.5
0.1
(Note 2)
V
IN
= V
IL
or V
IH
3.0
0.50
12 mA
4.5
0.50
V
I
OL
24 mA
5.5
0.50
24 mA
I
IN
Maximum Input
5.5
1.0
A
V
I
= V
CC
, GND
Leakage Current
I
OZ
Maximum
V
I
(OE) = V
IL
, V
IH
TRI-STATE
5.5
5.0
A
V
I
= V
CC
, V
GND
Leakage Current
V
O
= V
CC
, GND
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4
DC Characteristics for 'AC Family Devices
(Continued)
54AC
Symbol
Parameter
V
CC
T
A
=
Units
Conditions
(V)
-55C to +125C
Guaranteed Limits
I
OLD
(Note 3) Minimum
Dynamic Output
Current
5.5
50
mA
V
OLD
= 1.65V
I
OHD
5.5
-50
mA
V
OHD
= 3.85V
I
CC
Maximum Quiescent
5.5
80.0
A
V
IN
= V
CC
Supply Current
or GND
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
DC Characteristics for 'ACT Family Devices
54ACT
Symbol
Parameter
V
CC
T
A
=
Units
Conditions
(V)
-55C to +125C
Guaranteed Limits
V
IH
Minimum High
Level Input
Voltage
4.5
2.0
V
V
OUT
= 0.1V
5.5
2.0
or V
CC
- 0.1V
V
IL
Maximum Low
Level Input
Voltage
4.5
0.8
V
V
OUT
= 0.1V
5.5
0.8
or V
CC
- 0.1V
V
OH
Minimum High
Level
4.5
4.4
V
I
OUT
= -50 A
5.5
5.4
(Note 4)
V
IN
= V
IL
or V
IH
4.5
3.70
V
I
OH
-24 mA
5.5
4.70
-24 mA
V
OL
Maximum Low
Level Output
Voltage
4.5
0.1
V
I
OUT
= 50 A
5.5
0.1
(Note 4)
V
IN
= V
IL
or V
IH
4.5
0.50
V
I
OL
24 mA
5.5
0.50
24 mA
I
IN
Maximum Input
5.5
1.0
A
V
I
= V
CC
, GND
Leakage Current
I
OZ
Maximum
TRI-STATE
Leakage Current
5.5
5.0
A
V
I
= V
IL
, V
IH
V
O
= V
CC
, GND
I
CCT
Maximum I
CC
/Input
5.5
1.6
mA
V
I
= V
CC
- 2.1V
I
OLD
(Note 5) Minimum
Dynamic Output
Current
5.5
50
mA
V
OLD
= 1.65V
I
OHD
5.5
-50
mA
V
OHD
= 3.85V
I
CC
Maximum Quiescent
5.5
80.0
A
V
IN
= V
CC
Supply Current
or GND
Note 4: All outputs loaded; thresholds on input associated with output under test.
Note 5: Maximum test duration 2.0 ms, one output loaded at a time.
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