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Voltage Regulators
1
Publication date: Jaunuary 2002
SFF00005CEB
AN78Lxx/AN78LxxM Series
3-pin positive output voltage regulator (100 mA type)
I Overview
The AN78Lxx series and the AN78LxxM series are 3-
pin fixed positive output type monolithic voltage regula-
tor.
A stabilized fixed output voltage is obtained from an
unstable DC input voltage without using any external
parts. 12 types of fixed output voltage are available; 4V,
5V, 6V, 7V, 8V, 9V, 10V, 12V, 15V, 18V, 20V and 24V.
They can be used widely as power circuits with a current
capacity of up to 100mA.
I Features
No external components
Output voltage: 4V, 5V, 6V, 7V, 8V, 9V, 10V, 12V, 15V,
18V, 20V, 24V
Built-in overcurrent limit circuit
Built-in thermal overload protection circuit
SSIP003-P-0000
AN78Lxx series
Unit: mm
AN78LxxM series
Unit: mm
I Block Diagram (AN78Lxx series)
1: Output
2: Common
3: Input
1: Input
2: Output
3: Common
HSIP003-P-0000B
5.00.2
5.10.2
13.50.5
(1.0)
(1.0)
4.00.2
2.30.2
0.60.15
0.43
+0.1
0.05
2.54
0.43
+0.1
0.05
2
1
3
2.6 typ.
1.6 max.
1.8 max.
4.6 max.
3.0
1.5
1.5
3
2
1
0.48 max.
0.58 max.
0.44 max.
4.25 max.
2.6 max.
0.8 min.
1
2
3
Input
(3)
Pass Tr
Output
(1)
Common
(2)
Starter
Voltage
Reference
Current
Source
Error Amp.
+
-
Thermal
Protection
Q
1
R
SC
R
2
R
1
Current
Limiter
Note) The number in ( ) shows the pin number for the AN78LxxM series.
Note) The packages (SSIP003-P-0000 and HSIP003-
P-0000B) of this product will be changed to
lead-free type (SSIP003-P-0000S and
HSIP003-P-0000Q). See the new package di-
mensions section later of this datasheet.
AN78Lxx/AN78LxxM Series
2
SFF00005CEB
I Absolute Maximum Ratings at T
a
= 25C
I Electrical Characteristics at T
a
= 25C
AN78L04, AN78L04M (4V type)
V
I
P
D
T
opr
T
stg
V
V
mW
C
C
35 *
1
40 *
2
650 *
3
-30 to +80
-55 to +150
-55 to +125
Input voltage
Power dissipation
Operating ambient temperature
Storage temperature
AN78Lxx series
AN78LxxM series
*1 AN78L04/M, AN78L05/M, AN78L06/M, AN78L07/M, AN78L08/M, AN78L09/M, AN78L10/M, AN78L12/M, AN78L15/M
*2 AN78L18/M, AN78L20/M, AN78L24/M
*3 Follow the derating curve. When T
j
exceeds 150
C, the internal circuit cuts off the output.
AN78LxxM series is mounted on a standard board (glass epoxy: 20mm
20mm t1.7mm with Cu foil of 1cm
2
or more).
Parameter
Symbol
Rating
Unit
V
O
4.16
V
4
T
j
= 25C
V
O
V
V
I
= 6.5 to 19V, I
O
= 1 to 70mA
REG
IN
145
mV
50
V
I
= 6.5 to 19V, T
j
= 25C
mV
REG
L
mV
10
I
O
= 1 to 100mA, T
j
= 25C
mV
I
O
= 1 to 40mA, T
j
= 25C
V
I
= 7 to 19V, T
j
= 25C
mA
2
T
j
= 25C
Note 1) The specified condition T
j
= 25C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 9V, I
O
= 40mA, C
I
= 0.33F, C
O
= 0.1F, T
j
= 0 to 125C (AN78L04) and T
j
= 0 to 100C
(AN78L04M)
40
I
Bias
mA
V
I
= 7 to 19V, T
j
= 25C
I
Bias(IN)
mA
I
Bias(L)
V
40
I
O
= 1 to 40mA, T
j
= 25C
V
no
dB
f
= 10Hz to 100kHz
1
0.1
95
4.2
55
30
3
48
3.84
3.8
RR
V
I
= 7 to 17V, I
O
= 40mA, f = 120Hz
V
1.7
T
j
= 25C
V
DIF(min)
mA
140
I
O(Short)
mV/
C
- 0.6
T
j
= 25C, V
I
= 35V
4.5
58
V
O
/T
a
I
O
= 5mA, T
j
= 0 to 125C
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
AN78Lxx/AN78LxxM Series
3
SFF00005CEB
I Electrical Characteristics at T
a
= 25C (continued)
AN78L05, AN78L05M (5V type)
AN78L06, AN78L06M (6V type)
V
O
5.2
V
5
T
j
= 25C
V
O
V
V
I
= 7.5 to 20V, I
O
= 1 to 70mA
REG
IN
150
mV
55
V
I
= 7.5 to 20V, T
j
= 25C
mV
REG
L
mV
11
I
O
= 1 to 100mA, T
j
= 25C
mV
I
O
= 1 to 40mA, T
j
= 25C
V
I
= 8 to 20V, T
j
= 25C
mA
2
T
j
= 25C
Note 1) The specified condition T
j
= 25C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 10V, I
O
= 40mA, C
I
= 0.33F, C
O
= 0.1F, T
j
= 0 to 125C (AN78L05) and T
j
= 0 to 100C
(AN78L05M)
45
I
Bias
mA
V
I
= 8 to 20V, T
j
= 25C
I
Bias(IN)
mA
I
Bias(L)
V
40
I
O
= 1 to 40mA, T
j
= 25C
V
no
dB
f
= 10Hz to 100kHz
1
0.1
100
5.25
60
30
3
47
4.8
4.75
RR
V
I
= 8 to 18V, I
O
= 40mA, f = 120Hz
V
1.7
T
j
= 25C
V
DIF(min)
mA
140
I
O(Short)
mV/
C
- 0.65
T
j
= 25C, V
I
= 35V
5
57
V
O
/T
a
I
O
= 5mA, T
j
= 0 to 125C
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
V
O
6.24
V
6
T
j
= 25C
V
O
V
V
I
= 8.5 to 21V, I
O
= 1 to 70mA
REG
IN
155
mV
60
V
I
= 8.5 to 21V, T
j
= 25C
mV
REG
L
mV
12
I
O
= 1 to 100mA, T
j
= 25C
mV
I
O
= 1 to 40mA, T
j
= 25C
V
I
= 9 to 21V, T
j
= 25C
mA
2
T
j
= 25C
Note 1) The specified condition T
j
= 25C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 11V, I
O
= 40mA, C
I
= 0.33F, C
O
= 0.1F, T
j
= 0 to 125C (AN78L06) and T
j
= 0 to 100C
(AN78L06M)
50
I
Bias
mA
V
I
= 9 to 21V, T
j
= 25C
mA
V
50
I
O
= 1 to 40mA, T
j
= 25C
V
no
dB
f
= 10Hz to 100kHz
1
0.1
105
6.3
65
35
3
46
5.76
5.7
RR
V
I
= 9 to 19V, I
O
= 40mA, f = 120Hz
V
1.7
T
j
= 25C
mA
140
mV/
C
- 0.7
T
j
= 25C, V
I
= 35V
5.5
56
I
O
= 5mA, T
j
= 0 to 125C
I
Bias(IN)
I
Bias(L)
V
DIF(min)
I
O(Short)
V
O
/T
a
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
AN78Lxx/AN78LxxM Series
4
SFF00005CEB
I Electrical Characteristics at T
a
= 25C (continued)
AN78L07, AN78L07M (7V type)
AN78L08, AN78L08M (8V type)
V
O
7.28
V
7
T
j
= 25C
V
O
V
V
I
= 9.5 to 22V, I
O
= 1 to 70mA
REG
IN
165
mV
70
V
I
= 9.5 to 22V, T
j
= 25C
mV
REG
L
mV
13
I
O
= 1 to 100mA, T
j
= 25C
mV
I
O
= 1 to 40mA, T
j
= 25C
V
I
= 10 to 22V, T
j
= 25C
mA
2
T
j
= 25C
Note 1) The specified condition T
j
= 25C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 12V, I
O
= 40mA, C
I
= 0.33F, C
O
= 0.1F, T
j
= 0 to 125C (AN78L07) and T
j
= 0 to 100C
(AN78L07M)
60
I
Bias
mA
V
I
= 10 to 22V, T
j
= 25C
I
Bias(IN)
mA
I
Bias(L)
V
50
I
O
= 1 to 40mA, T
j
= 25C
V
no
dB
f
= 10Hz to 100kHz
1
0.1
115
7.35
75
35
3
45
6.72
6.65
RR
V
I
= 10 to 20V, I
O
= 40mA, f = 120Hz
V
1.7
T
j
= 25C
V
DIF(min)
mA
140
I
O(Short)
mV/
C
- 0.75
T
j
= 25C, V
I
= 35V
6
55
V
O
/T
a
I
O
= 5mA, T
j
= 0 to 125C
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
V
O
8.3
V
8
T
j
= 25C
V
O
V
V
I
= 10.5 to 23V, I
O
= 1 to 70mA
REG
IN
175
mV
80
V
I
= 10.5 to 23V, T
j
= 25C
mV
REG
L
mV
15
I
O
= 1 to 100mA, T
j
= 25C
mV
I
O
= 1 to 40mA, T
j
= 25C
V
I
= 11 to 23V, T
j
= 25C
mA
2
T
j
= 25C
Note 1) The specified condition T
j
= 25C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 14V, I
O
= 40mA, C
I
= 0.33F, C
O
= 0.1F, T
j
= 0 to 125C (AN78L08) and T
j
= 0 to 100C
(AN78L08M)
70
I
Bias
mA
V
I
= 11 to 23V, T
j
= 25C
I
Bias(IN)
mA
I
Bias(L)
V
60
I
O
= 1 to 40mA, T
j
= 25C
V
no
dB
f
= 10Hz to 100kHz
1
0.1
125
8.4
80
40
3
44
7.7
7.6
RR
V
I
= 11 to 21V, I
O
= 40mA, f = 120Hz
V
1.7
T
j
= 25C
V
DIF(min)
mA
140
I
O(Short)
mV/
C
- 0.8
T
j
= 25C, V
I
= 35V
7
54
V
O
/T
a
I
O
= 5mA, T
j
= 0 to 125C
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
AN78Lxx/AN78LxxM Series
5
SFF00005CEB
I Electrical Characteristics at T
a
= 25C (continued)
AN78L09, AN78L09M (9V type)
AN78L10, AN78L10M (10V type)
V
O
9.35
V
9
T
j
= 25C
V
O
V
V
I
= 11.5 to 24V, I
O
= 1 to 70mA
REG
IN
190
mV
90
V
I
= 11.5 to 24V, T
j
= 25C
mV
REG
L
mV
16
I
O
= 1 to 100mA, T
j
= 25C
mV
I
O
= 1 to 40mA, T
j
= 25C
V
I
= 12 to 24V, T
j
= 25C
mA
2
T
j
= 25C
Note 1) The specified condition T
j
= 25C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 15V, I
O
= 40mA, C
I
= 0.33F, C
O
= 0.1F, T
j
= 0 to 125C (AN78L09) and T
j
= 0 to 100C
(AN78L09M)
80
I
Bias
mA
V
I
= 12 to 24V, T
j
= 25C
I
Bias(IN)
mA
I
Bias(L)
V
65
I
O
= 1 to 40mA, T
j
= 25C
V
no
dB
f
= 10Hz to 100kHz
1
0.1
140
9.45
85
45
3
43
8.64
8.55
RR
V
I
= 12 to 22V, I
O
= 40mA, f = 120Hz
V
1.7
T
j
= 25C
V
DIF(min)
mA
140
I
O(Short)
mV/
C
- 0.85
T
j
= 25C, V
I
= 35V
8
53
V
O
/T
a
I
O
= 5mA, T
j
= 0 to 125C
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
V
O
10.4
V
10
V
O
V
V
I
= 12.5 to 25V, I
O
= 1 to 70mA
REG
IN
210
mV
100
V
I
= 12.5 to 25V, T
j
= 25C
mV
REG
L
mV
17
I
O
= 1 to 100mA, T
j
= 25C
mV
I
O
= 1 to 40mA, T
j
= 25C
V
I
= 13 to 25V, T
j
= 25C
mA
2
T
j
= 25C
Note 1) The specified condition T
j
= 25C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= 16V, I
O
= 40mA, C
I
= 0.33F, C
O
= 0.1F, T
j
= 0 to 125C (AN78L10) and T
j
= 0 to 100C
(AN78L10M)
90
I
Bias
mA
V
I
= 13 to 25V, T
j
= 25C
mA
V
70
I
O
= 1 to 40mA, T
j
= 25C
V
no
dB
f
= 10Hz to 100kHz
1
0.1
160
10.5
90
45
3
42
9.6
9.5
RR
V
I
= 13 to 23V, I
O
= 40mA, f = 120Hz
V
1.7
T
j
= 25C
mA
140
mV/
C
- 0.9
T
j
= 25C, V
I
= 35V
9
52
I
O
= 5mA, T
j
= 0 to 125C
T
j
= 25C
I
Bias(IN)
I
Bias(L)
V
DIF(min)
I
O(Short)
V
O
/T
a
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input