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Электронный компонент: BUK7675-55

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Philips Semiconductors
Product specification
TrenchMOS
TM
transistor
BUK7675-55
Standard level FET
GENERAL DESCRIPTION
QUICK REFERENCE DATA
N-channel
enhancement
mode
SYMBOL
PARAMETER
MAX.
UNIT
standard level field-effect power
transistor in a plastic envelope
V
DS
Drain-source voltage
55
V
suitable for surface mounting. Using
I
D
Drain current (DC)
19.7
A
'trench'
technology
the
device
P
tot
Total power dissipation
61
W
features very low on-state resistance
T
j
Junction temperature
175
C
and has integral zener diodes giving
R
DS(ON)
Drain-source on-state
75
m
ESD protection up to 2kV. It is
resistance
V
GS
= 10 V
intended for use in automotive and
general
purpose
switching
applications.
PINNING - SOT404
PIN CONFIGURATION
SYMBOL
PIN
DESCRIPTION
1
gate
2
drain
3
source
mb
drain
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
V
DS
Drain-source voltage
-
-
55
V
V
DGR
Drain-gate voltage
R
GS
= 20 k
-
55
V
V
GS
Gate-source voltage
-
-
16
V
I
D
Drain current (DC)
T
mb
= 25 C
-
19.7
A
I
D
Drain current (DC)
T
mb
= 100 C
-
13.9
A
I
DM
Drain current (pulse peak value)
T
mb
= 25 C
-
79
A
P
tot
Total power dissipation
T
mb
= 25 C
-
61
W
T
stg
, T
j
Storage & operating temperature
-
- 55
175
C
ESD LIMITING VALUE
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
V
C
Electrostatic discharge capacitor
Human body model
-
2
kV
voltage, all pins
(100 pF, 1.5 k
)
THERMAL RESISTANCES
SYMBOL
PARAMETER
CONDITIONS
TYP.
MAX.
UNIT
R
th j-mb
Thermal resistance junction to
-
-
2.46
K/W
mounting base
R
th j-a
Thermal resistance junction to
Minimum footprint, FR4
50
-
K/W
ambient
board
d
g
s
1
3
mb
2
April 1998
1
Rev 1.100
Philips Semiconductors
Product specification
TrenchMOS
TM
transistor
BUK7675-55
Standard level FET
STATIC CHARACTERISTICS
T
j
= 25C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
V
(BR)DSS
Drain-source breakdown
V
GS
= 0 V; I
D
= 0.25 mA;
55
-
-
V
voltage
T
j
= -55C
50
-
-
V
V
GS(TO)
Gate threshold voltage
V
DS
= V
GS
; I
D
= 1 mA
2.0
3.0
4.0
V
T
j
= 175C
1.0
-
-
V
T
j
= -55C
-
-
4.4
I
DSS
Zero gate voltage drain current
V
DS
= 55 V; V
GS
= 0 V;
-
0.05
10
A
T
j
= 175C
-
-
500
A
I
GSS
Gate source leakage current
V
GS
=
10 V; V
DS
= 0 V
-
0.04
1
A
T
j
= 175C
-
-
20
A
V
(BR)GSS
Gate source breakdown voltage I
G
=
1 mA;
16
-
-
V
R
DS(ON)
Drain-source on-state
V
GS
= 10 V; I
D
= 10 A
-
60
75
m
resistance
T
j
= 175C
-
-
157
m
DYNAMIC CHARACTERISTICS
T
mb
= 25C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
g
fs
Forward transconductance
V
DS
= 25 V; I
D
= 10 A
1
-
-
S
C
iss
Input capacitance
V
GS
= 0 V; V
DS
= 25 V; f = 1 MHz
-
365
500
pF
C
oss
Output capacitance
-
110
135
pF
C
rss
Feedback capacitance
-
60
85
pF
t
d on
Turn-on delay time
V
DD
= 30 V; I
D
= 10 A;
-
9
14
ns
t
r
Turn-on rise time
V
GS
= 10 V; R
G
= 10
-
16
21
ns
t
d off
Turn-off delay time
Resistive load
-
14
25
ns
t
f
Turn-off fall time
-
13
20
ns
L
d
Internal drain inductance
Measured from upper edge of drain
-
2.5
-
nH
tab to centre of die
L
s
Internal source inductance
Measured from source lead
-
7.5
-
nH
soldering point to source bond pad
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
T
j
= 25C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
I
DR
Continuous reverse drain
-
-
19.7
A
current
I
DRM
Pulsed reverse drain current
-
-
79
A
V
SD
Diode forward voltage
I
F
= 19.7 A; V
GS
= 0 V
-
0.95
1.2
V
t
rr
Reverse recovery time
I
F
= 19.7 A; -dI
F
/dt = 100 A/
s;
-
32
-
ns
Q
rr
Reverse recovery charge
V
GS
= -10 V; V
R
= 30 V
-
0.12
-
C
April 1998
2
Rev 1.100
Philips Semiconductors
Product specification
TrenchMOS
TM
transistor
BUK7675-55
Standard level FET
AVALANCHE LIMITING VALUE
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
W
DSS
Drain-source non-repetitive
I
D
= 10 A; V
DD
25 V;
-
-
30
mJ
unclamped inductive turn-off
V
GS
= 10 V; R
GS
= 50
; T
mb
= 25 C
energy
Fig.1. Normalised power dissipation.
PD% = 100
P
D
/P
D 25 C
= f(T
mb
)
Fig.2. Normalised continuous drain current.
ID% = 100
I
D
/I
D 25 C
= f(T
mb
); conditions: V
GS
10 V
Fig.3. Safe operating area. T
mb
= 25 C
I
D
& I
DM
= f(V
DS
); I
DM
single pulse; parameter t
p
Fig.4. Transient thermal impedance.
Z
th j-mb
= f(t); parameter D = t
p
/T
0
20
40
60
80
100
120
140
160
180
Tmb / C
PD%
Normalised Power Derating
120
110
100
90
80
70
60
50
40
30
20
10
0
1
10
100
1
10
100
tp =
1 us
10us
100 us
1 ms
10ms
100ms
VDS/V
RDS(ON) = VDS/ID
DC
ID/A
0
20
40
60
80
100
120
140
160
180
Tmb / C
ID%
Normalised Current Derating
120
110
100
90
80
70
60
50
40
30
20
10
0
1.0E-06
0.0001
0.01
1
100
0.01
0.1
1
10
Zth/ (K/W)
t/s
0.5
0.2
0.1
0.05
0.02
0
D =
t
p
t
p
T
T
P
t
D
April 1998
3
Rev 1.100
Philips Semiconductors
Product specification
TrenchMOS
TM
transistor
BUK7675-55
Standard level FET
Fig.5. Typical output characteristics, T
j
= 25 C.
I
D
= f(V
DS
); parameter V
GS
Fig.6. Typical on-state resistance, T
j
= 25 C.
R
DS(ON)
= f(I
D
); parameter V
GS
Fig.7. Typical transfer characteristics.
I
D
= f(V
GS
) ; conditions: V
DS
= 25 V; parameter T
j
Fig.8. Typical transconductance, T
j
= 25 C.
g
fs
= f(I
D
); conditions: V
DS
= 25 V
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)
/R
DS(ON)25 C
= f(T
j
); I
D
= 10 A; V
GS
= 10 V
Fig.10. Gate threshold voltage.
V
GS(TO)
= f(T
j
); conditions: I
D
= 1 mA; V
DS
= V
GS
0
2
4
6
8
10
0
10
20
30
40
50
ID/A
VDS/V
VGS/V =
16
14
12
10.0
9.5
9.0
8.5
8.0
7.5
7.0
6.5
6.0
5.5
5.0
4.5
4.0
0
5
10
15
20
25
2
3
4
5
6
7
8
9
gfs/S
ID/A
0
5
10
15
20
25
30
50
60
70
80
90
100
110
120
RDS(ON)/mOhm
VGS/V =
ID/A
6
6.5
7
8
9 10
-100
-50
0
50
100
150
200
0.5
1
1.5
2
2.5
BUK959-60
Tmb / degC
Rds(on) normlised to 25degC
a
0
1
2
3
4
5
6
7
8
9
0
5
10
15
20
25
ID/A
VGS/V
Tj/C =
175
25
BUK759-60
-100
-50
0
50
100
150
200
0
1
2
3
4
5
Tj / C
VGS(TO) / V
max.
typ.
min.
April 1998
4
Rev 1.100
Philips Semiconductors
Product specification
TrenchMOS
TM
transistor
BUK7675-55
Standard level FET
Fig.11. Sub-threshold drain current.
I
D
= f(V
GS)
; conditions: T
j
= 25 C; V
DS
= V
GS
Fig.12. Typical capacitances, C
iss
, C
oss
, C
rss
.
C = f(V
DS
); conditions: V
GS
= 0 V; f = 1 MHz
Fig.13. Typical turn-on gate-charge characteristics.
V
GS
= f(Q
G
); conditions: I
D
= 20 A; parameter V
DS
Fig.14. Typical reverse diode current.
I
F
= f(V
SDS
); conditions: V
GS
= 0 V; parameter T
j
Fig.15. Normalised avalanche energy rating.
W
DSS
% = f(T
mb
); conditions: I
D
= 17 A
Fig.16. Avalanche energy test circuit.
0
1
2
3
4
5
1E-06
1E-05
1E-04
1E-03
1E-02
1E-01
Sub-Threshold Conduction
typ
2%
98%
0
0.5
1
1.5
0
20
40
60
80
100
IF/A
VSDS/V
Tj/C =
175
25
0.01
0.1
1
10
100
0
.1
.2
.3
.4
.5
.6
.7
.8
.9
1
Thousands pF
VDS/V
Ciss
Coss
Crss
20
40
60
80
100
120
140
160
180
Tmb / C
120
110
100
90
80
70
60
50
40
30
20
10
0
WDSS%
0
5
10
15
0
2
4
6
8
10
12
VGS/V
QG/nC
VDS = 14V
VDS = 44V
L
T.U.T.
VDD
RGS
R 01
VDS
-ID/100
+
-
shunt
VGS
0
W
DSS
=
0.5
LI
D
2
BV
DSS
/(
BV
DSS
-
V
DD
)
April 1998
5
Rev 1.100
Philips Semiconductors
Product specification
TrenchMOS
TM
transistor
BUK7675-55
Standard level FET
Fig.17. Switching test circuit.
RD
T.U.T.
VDD
RG
VDS
+
-
VGS
0
April 1998
6
Rev 1.100
Philips Semiconductors
Product specification
TrenchMOS
TM
transistor
BUK7675-55
Standard level FET
MECHANICAL DATA
Dimensions in mm
Net Mass: 1.4 g
Fig.18. SOT404 : centre pin connected to mounting base.
MOUNTING INSTRUCTIONS
Dimensions in mm
Fig.19. SOT404 : soldering pattern for surface mounting.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
11 max
4.5 max
1.4 max
10.3 max
0.5
15.4
2.5
0.85 max
(x2)
2.54 (x2)
17.5
11.5
9.0
5.08
3.8
2.0
April 1998
7
Rev 1.100
Philips Semiconductors
Product specification
TrenchMOS
TM
transistor
BUK7675-55
Standard level FET
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1998
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
April 1998
8
Rev 1.100