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Электронный компонент: PHD10N10E

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Philips Semiconductors
Product Specification
PowerMOS transistor
PHD10N10E
GENERAL DESCRIPTION
QUICK REFERENCE DATA
N-channel enhancement mode
SYMBOL
PARAMETER
MAX.
UNIT
field-effect power transistor in a
plastic envelope suuitable for
V
DS
Drain-source voltage
100
V
surface mounting. The device is
I
D
Drain current (DC)
11
A
intended for use in Switched Mode
P
tot
Total power dissipation
60
W
Power Supplies (SMPS), motor
T
j
Junction temperature
175
C
control, welding, DC/DC and AC/DC
R
DS(ON)
Drain-source on-state resistance
0.25
converters, and in general purpose
switching applications.
PINNING - SOT428
PIN CONFIGURATION
SYMBOL
PIN
DESCRIPTION
1
gate
2
drain
3
source
tab
drain
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
V
DS
Drain-source voltage
-
-
100
V
V
DGR
Drain-gate voltage
R
GS
= 20 k
-
100
V
V
GS
Gate-source voltage
-
-
30
V
I
D
Drain current (DC)
T
mb
= 25 C
-
11
A
I
D
Drain current (DC)
T
mb
= 100 C
-
7.7
A
I
DM
Drain current (pulse peak value)
T
mb
= 25 C
-
44
A
P
tot
Total power dissipation
T
mb
= 25 C
-
60
W
T
stg
Storage temperature
-
- 55
175
C
T
j
Junction Temperature
-
-
175
C
THERMAL RESISTANCES
SYMBOL
PARAMETER
CONDITIONS
TYP.
MAX.
UNIT
R
th j-mb
Thermal resistance junction to
-
2.5
K/W
mounting base
R
th j-a
Thermal resistance junction to
pcb mounted, minimum
50
-
K/W
ambient
footprint
1
2
3
tab
d
g
s
September 1997
1
Rev 1.000
Philips Semiconductors
Product Specification
PowerMOS transistor
PHD10N10E
STATIC CHARACTERISTICS
T
j
= 25 C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
V
(BR)DSS
Drain-source breakdown
V
GS
= 0 V; I
D
= 0.25 mA
100
-
-
V
voltage
V
GS(TO)
Gate threshold voltage
V
DS
= V
GS
; I
D
= 1 mA
2.1
3.0
4.0
V
I
DSS
Zero gate voltage drain current
V
DS
= 100 V; V
GS
= 0 V; T
j
= 25 C
-
1
10
A
I
DSS
Zero gate voltage drain current
V
DS
= 100 V; V
GS
= 0 V; T
j
= 125 C
-
0.1
1.0
mA
I
GSS
Gate source leakage current
V
GS
=
30 V; V
DS
= 0 V
-
10
100
nA
R
DS(ON)
Drain-source on-state
V
GS
= 10 V; I
D
= 5.5 A
-
0.22
0.25
resistance
DYNAMIC CHARACTERISTICS
T
j
= 25 C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
g
fs
Forward transconductance
V
DS
= 25 V; I
D
= 5.5 A
3
4.2
-
S
C
iss
Input capacitance
V
GS
= 0 V; V
DS
= 25 V; f = 1 MHz
-
400
500
pF
C
oss
Output capacitance
-
90
120
pF
C
rss
Feedback capacitance
-
35
50
pF
t
d on
Turn-on delay time
V
DD
= 30 V; I
D
= 3 A;
-
9
14
ns
t
r
Turn-on rise time
V
GS
= 10 V; R
GS
= 50
;
-
25
40
ns
t
d off
Turn-off delay time
R
gen
= 50
-
30
45
ns
t
f
Turn-off fall time
-
20
40
ns
L
d
Internal drain inductance
Measured from tab to centre of die
-
4.5
-
nH
L
s
Internal source inductance
Measured from source lead solder
-
7.5
-
nH
point to source bond pad
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
T
j
= 25 C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
I
DR
Continuous reverse drain
-
-
-
11
A
current
I
DRM
Pulsed reverse drain current
-
-
-
44
A
V
SD
Diode forward voltage
I
F
= 11 A ; V
GS
= 0 V
-
1.2
1.5
V
t
rr
Reverse recovery time
I
F
= 11 A; -dI
F
/dt = 100 A/
s;
-
90
-
ns
Q
rr
Reverse recovery charge
V
GS
= 0 V; V
R
= 30 V
-
0.35
-
C
AVALANCHE LIMITING VALUE
T
mb
= 25 C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
W
DSS
Drain-source non-repetitive
I
D
= 11 A ; V
DD
50 V ;
-
-
35
mJ
unclamped inductive turn-off
V
GS
= 10 V ; R
GS
= 50
energy
September 1997
2
Rev 1.000
Philips Semiconductors
Product Specification
PowerMOS transistor
PHD10N10E
Fig.1. Normalised power dissipation.
PD% = 100
P
D
/P
D 25 C
= f(T
mb
)
Fig.2. Normalised continuous drain current.
ID% = 100
I
D
/I
D 25 C
= f(T
mb
); conditions: V
GS
10 V
Fig.3. Safe operating area. T
mb
= 25 C
I
D
& I
DM
= f(V
DS
); I
DM
single pulse; parameter t
p
Fig.4. Transient thermal impedance.
Z
th j-mb
= f(t); parameter D = t
p
/T
Fig.5. Typical output characteristics, T
j
= 25 C.
I
D
= f(V
DS
); parameter V
GS
Fig.6. Typical on-state resistance, T
j
= 25 C.
R
DS(ON)
= f(I
D
); parameter V
GS
0
20
40
60
80
100
120
140
160
180
Tmb / C
PD%
Normalised Power Derating
120
110
100
90
80
70
60
50
40
30
20
10
0
1E-07
1E-05
1E-03
1E-01
1E+01
t / s
Zth j-mb / (K/W)
1E+01
1E+00
1E-01
1E-02
0
0.5
0.2
0.1
0.05
0.02
D =
t
p
t
p
T
T
P
t
D
BUKX52
0
20
40
60
80
100
120
140
160
180
Tmb / C
ID%
Normalised Current Derating
120
110
100
90
80
70
60
50
40
30
20
10
0
0
2
4
6
8
10
BUK452-100A
VDS / V
20
15
10
5
0
4
5
6
7
8
10
15
20
ID / A
VGS / V =
1
100
VDS / V
ID / A
100
10
1
0.1
BUK452-100
10
tp = 10 us
100 us
1 ms
10 ms
100 ms
DC
RDS(ON) = VDS/ID
A
B
0
2
4
6
8
10
12
14
16
18
20
BUK452-100A
ID / A
1.0
0.8
0.6
0.4
0.2
0
4.5 5
5.5
6
6.5
7
7.5
8
10
20
RDS(ON) / Ohm
VGS / V =
September 1997
3
Rev 1.000
Philips Semiconductors
Product Specification
PowerMOS transistor
PHD10N10E
Fig.7. Typical transfer characteristics.
I
D
= f(V
GS
) ; conditions: V
DS
= 25 V; parameter T
j
Fig.8. Typical transconductance, T
j
= 25 C.
g
fs
= f(I
D
); conditions: V
DS
= 25 V
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)
/R
DS(ON)25 C
= f(T
j
); I
D
= 5.5 A; V
GS
= 10 V
Fig.10. Gate threshold voltage.
V
GS(TO)
= f(T
j
); conditions: I
D
= 1 mA; V
DS
= V
GS
Fig.11. Sub-threshold drain current.
I
D
= f(V
GS)
; conditions: T
j
= 25 C; V
DS
= V
GS
Fig.12. Typical capacitances, C
iss
, C
oss
, C
rss
.
C = f(V
DS
); conditions: V
GS
= 0 V; f = 1 MHz
0
2
4
6
8
10
BUK452-100A
VGS / V
ID / A
20
16
12
8
4
0
Tj / C =
25
150
-60
-20
20
60
100
140
180
Tj / C
VGS(TO) / V
4
3
2
1
0
max.
typ.
min.
0
2
4
6
8
10
12
14
16
18
BUK452-100A
ID / A
gfs / S
5
4
3
2
1
0
0
1
2
3
4
VGS / V
ID / A
1E-01
1E-02
1E-03
1E-04
1E-05
1E-06
SUB-THRESHOLD CONDUCTION
typ
2 %
98 %
-60
-20
20
60
100
140
180
Tj / C
Normalised RDS(ON) = f(Tj)
2.4
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
a
0
20
40
VDS / V
C / pF
Ciss
Coss
Crss
10
100
1000
10000
BUK4y2-100
September 1997
4
Rev 1.000
Philips Semiconductors
Product Specification
PowerMOS transistor
PHD10N10E
Fig.13. Typical turn-on gate-charge characteristics.
V
GS
= f(Q
G
); conditions: I
D
= 11 A; parameter V
DS
Fig.14. Typical reverse diode current.
I
F
= f(V
SDS
); conditions: V
GS
= 0 V; parameter T
j
Fig.15. Normalised avalanche energy rating.
W
DSS
% = f(T
mb
); conditions: I
D
= 11 A
Fig.16. Avalanche energy test circuit.
0
2
4
6
8
10
QG / nC
VGS / V
12
10
8
6
4
2
0
VDS / V =20
80
BUK452-100
20
40
60
80
100
120
140
160
180
Tmb / C
120
110
100
90
80
70
60
50
40
30
20
10
0
WDSS%
0
1
2
BUK452-100A
VSDS / V
20
10
0
IF / A
150
25
Tj / C =
L
T.U.T.
VDD
RGS
R 01
VDS
-ID/100
+
-
shunt
VGS
0
W
DSS
=
0.5
LI
D
2
BV
DSS
/(
BV
DSS
-
V
DD
)
September 1997
5
Rev 1.000
Philips Semiconductors
Product Specification
PowerMOS transistor
PHD10N10E
MECHANICAL DATA
Dimensions in mm : Net Mass: 1.4 g
Fig.17. SOT428 : centre pin connected to mounting base.
MOUNTING INSTRUCTIONS
Dimensions in mm
Fig.18. SOT428 : soldering pattern for surface mounting.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
6.22 max
2.38 max
0.93 max
6.73 max
0.3
10.4 max
0.5
0.8 max
(x2)
2.285 (x2)
0.5
seating plane
1.1
0.5 min
5.4
4 min
4.6
1
2
3
tab
7.0
7.0
2.15
2.5
4.57
1.5
September 1997
6
Rev 1.000
Philips Semiconductors
Product Specification
PowerMOS transistor
PHD10N10E
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1997
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
September 1997
7
Rev 1.000