HCC/HCF4014B
HCC/HCF4021B
8-STAGE STATIC SHIFT REGISTERS
DESCRIPTION
.
MEDIUM-SPEED OPERATION-12MHz (typ.)
CLOCK RATE AT V
DD
V
SS
= 10V
.
FULLY STATIC OPERATION
.
8 MASTER-SLAVE FLIP-FLOPS PLUS OUT-
PUT BUFFERING AND CONTROL GATING
.
QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
.
5V, 10V AND 15V PARAMETRIC RATINGS
.
INPUT CURRENT OF 100nA AT 18V AND 25
C
FOR HCC DEVICE
.
100% TESTED FOR QUIESCENT CURRENT
.
MEETS ALL REQUIREMENTS OF JEDEC TEN-
TATIVE STANDARD N
o
13A, "STANDARD
SPECIFICATIONS FOR DESCRIPTION OF "B"
SERIES CMOS DEVICES"
November 1996
The HCC4014B, HCC4021B (extended temperatu-
re range) and the HCF4014B, HCF4021B (interme-
diate temperature range) are monolithic integrated
circuits, available in 16-lead dual in-line plastic or ce-
ramic package and plastic micro package. The
HCC/HCF4014B and HCC/HCF4021B series types
are 8-stage parallel-or serial-input/serial-output re-
gisters having common CLOCK and PARAL-
LEL/SERIAL CONTROL inputs, a single SERIAL
data input, and individual parallel "JAM" inputs to
each register stage. Each register stage is a D type,
master-slave flip-flop in addition to an output from
stage 8, "Q" outputs are also available from stages
6 and 7. Parallel as well as serial entry is made into
the register synchronously with the positive clock li-
ne transition in the HCC/HCF4014B. In the
HCC/HCF4021B serial entry is synchronous with
the clock but parallel entry is asynchronous. In both
types, entry is controlled by the PARALLEL/SERIAL
CONTROL input. When the PARALLEL/SERIAL
CONTROL input is low, data is serially shifted into
the 8-stage register synchronously with the positive
transition of the clock line. When the PARAL-
LEL/SERIAL CONTROL input is high, data is jam-
med into the 8-stage register via the parallel input
EY
(Plastic Package)
F
(Ceramic Package)
C1
(Plastic Chip Carrier)
ORDER CODES :
HCC40XXBF
HCF40XXBM1
HCF40XXBEY
HCF40XXBC1
PIN CONNECTIONS
4014B
SYNCHRONOUS PARALLEL OR
SERIAL INPUT/SERIAL OUTPUT
4021B
ASYNCHRONOUS PARALLEL
INPUT OR SYNCHRONOUS
SERIAL INPUT/SERIAL OUTPUT
lines and synchronous with the positive transition of
the clock line. In the HCC/HCF4021B, the CLOCK
input of the internal stage is "forced" when asynchro-
nous parallel entry is made. Register expansion
using multiple package is permitted.
M1
(Micro Package)
1/13
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V
DD
*
Supply Voltage : HC C Types
H CF Types
0.5 to + 20
0.5 to + 18
V
V
V
i
Input Voltage
0.5 to V
DD
+ 0.5
V
I
I
DC Input Current (any one input)
10
mA
P
t o t
Total Power Dissipation (per package)
Dissipation per Output Transistor
for T
o p
= Full Package-temperature Range
200
100
mW
mW
T
o p
Operating Temperature : HCC Types
H CF Types
55 to + 125
40 to + 85
C
C
T
s t g
Storage Temperature
65 to + 150
C
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Value
Unit
V
DD
Supply Voltage : HCC Types
HC F Types
3 to 18
3 to 15
V
V
V
I
Input Voltage
0 to V
DD
V
T
o p
Operating Temperature : HCC Types
H CF Types
55 to + 125
40 to + 85
C
C
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for external periods may affect device reliability.
* All voltage values are referred to V
SS
pin voltage.
HCC/HCF4014B/4021B
2/13
LOGIC DIAGRAMS
4014B
4021B
HCC/HCF4014B/4021B
3/13
TRUTH TABLES
HCC/HCF 4014B
C L
Serial
Input
Para llel/
Se ria l
Control
Pl 1 Pl n
Q
1
(internal)
Q
n
/
X
1
0
0
0
0
/
X
1
1
0
1
0
/
X
1
0
1
0
1
/
X
1
1
1
1
1
/
0
0
X
X
0
Q
n
1
/
1
0
X
X
1
Q
n
1
\
X
X
X
X
Q
1
Q
n
HCC/HCF4021B
C L
Seri al
Input
Parallel/
Serial
Control
Pl 1 Pl n
Q
1
(internal)
Q
n
X
X
1
0
0
0
0
X
X
1
0
1
0
1
X
X
1
1
0
1
0
X
X
1
1
1
1
1
/
0
1
0
0
X
X
X
X
0
1
Q
n
1
Q
n
1
\
X
0
X
X
Q
1
Q
n
X = don't care case.
NC = no change.
I
NC
I
NC
X = don't care case.
NC = no change.
STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions)
Test Conditions
Value
V
I
V
O
| I
O
|
V
DD
T
Low
*
25
C
T
High
*
Symbol
Parameter
(V)
(V)
(
A)
(V)
Min.
Max.
Min.
Typ.
Max.
Min.
Max.
Unit
I
L
Quiescent
Current
HCC
Types
0/ 5
5
5
0.04
5
150
A
0/10
10
10
0.04
10
300
0/15
15
20
0.04
20
600
0/20
20
100
0.08
100
3000
HCF
Types
0/ 5
5
20
0.04
20
150
0/10
10
40
0.04
40
300
0/15
15
80
0.04
80
600
V
OH
Output High
Voltage
0/ 5
< 1
5
4.95
4.95
4.95
V
0/10
< 1
10
9.95
9.95
9.95
0/15
< 1
15
14.95
14.95
14.95
V
OL
Output Low
Voltage
5/0
< 1
5
0.05
0.05
0.05
V
10/0
< 1
10
0.05
0.05
0.05
15/0
< 1
15
0.05
0.05
0.05
V
IH
Input High
Voltage
0.5/4.5
< 1
5
3.5
3.5
3.5
V
1/9
< 1
10
7
7
7
1.5/13.5
< 1
15
11
11
11
V
IL
Input Low
Voltage
4.5/0.5
< 1
5
1.5
1.5
1.5
V
9/1
< 1
10
3
3
3
13.5/1.5
< 1
15
4
4
4
* T
Low
= 55
C for HCC device : 40
C for HCF device.
* T
High
= + 125
C for HCC device : + 85
C for HCF device.
The Noise Margin for both "1" and "0" level is : 1V min. with V
DD
= 5V, 2V min. with V
DD
= 10V, 2.5 V min. with V
DD
= 15V.
HCC/HCF4014B/4021B
4/13
STATIC ELECTRICAL CHARACTERISTICS (continued)
Test Conditions
Value
V
I
V
O
|I
O
|
V
D D
T
L o w
*
25
C
T
Hi g h
*
Symbol
Parameter
(V)
(V)
(
A)
(V)
Min. Max. Min. Typ. Max. Min. Max.
Unit
I
O H
Output
Drive
Current
HCC
Types
0/ 5
2.5
5
2
1.6 3.2
1.15
mA
0/ 5
4.6
5
0.64
0.51 1
0.36
0/10
9.5
10
1.6
1.3 2.6
0.9
0/15
13.5
15
4.2
3.4 6.8
2.4
HCF
Types
0/ 5
2.5
5
1.53
1.36 3.2
1.1
0/ 5
4.6
5
0.52
0.44 1
0.36
0/10
9.5
10
1.3
1.1 2.6
0.9
0/15
13.5
15
3.6
3.0 6.8
2.4
I
O L
Output
Sink
Current
HCC
Types
0/ 5
0.4
5
0.64
0.51
1
0.36
mA
0/10
0.5
10
1.6
1.3
2.6
0.9
0/15
1.5
15
4.2
3.4
6.8
2.4
HCF
Types
0/ 5
0.4
5
0.52
0.44
1
0.36
0/10
0.5
10
1.3
1.1
2.6
0.9
0/15
1.5
15
3.6
3.0
6.8
2.4
I
IH
, I
IL
Input
Leakage
Current
HCC
Types
0/18
Any Input
18
0.1
10
5
0.1
1
A
HCF
Types
0/15
15
0.3
10
5
0.3
1
C
I
Input Capacitance
Any Input
5
7.5
pF
* T
Low
= 55
C for HCC device : 40
C for HCF device.
* T
High
= + 125
C for HCC device : + 85
C for HCF device.
The Noise Margin for both "1" and "0" level is : 1V min. with V
DD
= 5V, 2V min. with V
DD
= 10V, 2.5 V min. with V
DD
= 15V.
DYNAMIC ELECTRICAL CHARACTERISTICS (T
amb
= 25
C, C
L
= 50pF, R
L
= 200k
,
typical temperature coefficient for all V
DD
= 0.3%/
C values, all input rise and fall time = 20ns)
Val ue
Symbol
Parameter
Test Conditions
V
D D
(V)
Min.
Typ.
Max.
Unit
CLOCKED OPERATI ON
t
P L H
, t
P HL
Propagation Delay Time
5
160
320
ns
10
80
160
15
60
120
t
THL
, t
T L H
Transition Time
5
100
200
ns
10
50
100
15
40
80
f
CL
*
Maximum Clock Input Frequency
5
3
6
MHz
10
6
12
15
8.5
17
t
W
Clock Pulse Width
5
180
90
ns
10
80
40
15
50
25
* If more than one unit is cascaded t
r
CL should be made less than or equal to the sum of the transition time and the fixed propagation delay of
the output of the driving stage of the estimated capacitive load.
HCC/HCF4014B/4021B
5/13
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