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Электронный компонент: HCF4585M013TR

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1/9
October 2002
s
EXPANSION TO 8, 12, 16....4 N BITS BY
CASCADING UNIT
s
MEDIUM SPEED OPERATION : COMPARES
TWO 4-BIT WORDS IN 180ns (Typ.) at 10V
s
STANDARDIZED SYMMETRICAL OUTPUT
CHARACTERISTICS
s
QUIESCENT CURRENT SPECIFIED UP TO
20V
s
5V, 10V AND 15V PARAMETRIC RATINGS
s
INPUT LEAKAGE CURRENT
I
I
= 100nA (MAX) AT V
DD
= 18V T
A
= 25C
s
100% TESTED FOR QUIESCENT CURRENT
s
MEETS ALL REQUIREMENTS OF JEDEC
JESD13B "STANDARD SPECIFICATIONS
FOR DESCRIPTION OF B SERIES CMOS
DEVICES"
DESCRIPTION
HCF4585B is a monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
HCF4585B is a 4-bit magnitude comparator
designed for use in computer and logic
applications that require the comparison of two
4-bit words. This logic circuit determines whether
one 4-bit word (Binary or BCD) is "less than",
"equal to" or "greater than" a second 4-bit word.
HCF4585B has eight comparing inputs (A3, B3
through A0, B0), three outputs (A<B, A=B, A>B)
and three cascading inputs (A<B, A=B, A>B) that
permit system designers to expand the
comparator function to 8, 12, 16...4N bits. When a
single HCF4585B is used, the cascading inputs
are connected as follows: (A<B) = low, (A=B) =
high, (A>B) = high. Cascading these units for
comparison of more than 4 bits is accomplished
as shown in Typical application.
HCF4585B
4-BIT MAGNITUDE COMPARATOR
PIN CONNECTION
ORDER CODES
PACKAGE
TUBE
T & R
DIP
HCF4585BEY
SOP
HCF4585BM1
HCF4585M013TR
DIP
SOP
HCF4585B
2/9
IINPUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
TRUTH TABLE
X : Don't Care
FUNCTIONAL DIAGRAM
PIN No
SYMBOL
NAME AND FUNCTION
10, 7, 2, 15
A0 to A3
Word A Inputs
11, 9, 1, 14
B0 to B3
Word B Inputs
13, 3, 12
A>B, A=B,
A<B
Outputs
4, 6, 5
A>B, A=B,
A<B
Cascading Inputs
8
V
SS
Negative Supply Voltage
16
V
DD
Positive Supply Voltage
INPUTS
OUTPUTS
COMPARING
CASCADING
A3, B3
A2, B2
A1, B1
A0, B0
A<B
A=B
A>B
A<B
A=B
A>B
A3 > B3
X
X
X
X
X
H
L
L
H
A3 = B3
A2 > B2
X
X
X
X
H
L
L
H
A3 = B3
A2 = B2
A1 > B1
X
X
X
H
L
L
H
A3 = B3
A2 = B2
A1 = B1
A0 > B0
X
X
H
L
L
H
A3 = B3
A2 = B2
A1 = B1
A0 = B0
L
L
H
L
L
H
A3 = B3
A2 = B2
A1 = B1
A0 = B0
L
H
X
L
H
L
A3 = B3
A2 = B2
A1 = B1
A0 = B0
H
L
X
H
L
L
A3 = B3
A2 = B2
A1 = B1
A0 < B0
X
X
X
H
L
L
A3 = B3
A2 = B2
A1 < B1
X
X
X
X
H
L
L
A3 = B3
A2 < B2
X
X
X
X
X
H
L
L
A3 < B3
X
X
X
X
X
X
H
L
L
HCF4585B
3/9
LOGIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to V
SS
pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Value
Unit
V
DD
Supply Voltage
-0.5 to +22
V
V
I
DC Input Voltage
-0.5 to V
DD
+ 0.5
V
I
I
DC Input Current
10
mA
P
D
Power Dissipation per Package
200
mW
Power Dissipation per Output Transistor
100
mW
T
op
Operating Temperature
-55 to +125
C
T
stg
Storage Temperature
-65 to +150
C
Symbol
Parameter
Value
Unit
V
DD
Supply Voltage
3 to 20
V
V
I
Input Voltage
0 to V
DD
V
T
op
Operating Temperature
-55 to 125
C
HCF4585B
4/9
DC SPECIFICATIONS
The Noise Margin for both "1" and "0" level is: 1V min. with V
DD
=5V, 2V min. with V
DD
=10V, 2.5V min. with V
DD
=15V
DYNAMIC ELECTRICAL CHARACTERISTICS (T
amb
= 25C, C
L
= 50pF, R
L
= 200K
, t
r
= t
f
= 20 ns)
(*) Typical temperature coefficient for all V
DD
value is 0.3 %/C.
Symbol
Parameter
Test Condition
Value
Unit
V
I
(V)
V
O
(V)
|I
O
|
(
A)
V
DD
(V)
T
A
= 25C
-40 to 85C
-55 to 125C
Min.
Typ.
Max.
Min.
Max.
Min.
Max.
I
L
Quiescent Current
0/5
5
0.04
5
150
150
A
0/10
10
0.04
10
300
300
0/15
15
0.04
20
600
600
0/20
20
0.08
100
3000
3000
V
OH
High Level Output
Voltage
0/5
<1
5
4.95
4.95
4.95
V
0/10
<1
10
9.95
9.95
9.95
0/15
<1
15
14.95
14.95
14.95
V
OL
Low Level Output
Voltage
5/0
<1
5
0.05
0.05
0.05
V
10/0
<1
10
0.05
0.05
0.05
15/0
<1
15
0.05
0.05
0.05
V
IH
High Level Input
Voltage
0.5/4.5
<1
5
3.5
3.5
3.5
V
1/9
<1
10
7
7
7
1.5/13.5
<1
15
11
11
11
V
IL
Low Level Input
Voltage
4.5/0.5
<1
5
1.5
1.5
1.5
V
9/1
<1
10
3
3
3
13.5/1.5
<1
15
4
4
4
I
OH
Output Drive
Current
0/5
2.5
<1
5
-1.36
-3.2
-1.1
-1.1
mA
0/5
4.6
<1
5
-0.44
-1
-0.36
-0.36
0/10
9.5
<1
10
-1.1
-2.6
-0.9
-0.9
0/15
13.5
<1
15
-3.0
-6.8
-2.4
-2.4
I
OL
Output Sink
Current
0/5
0.4
<1
5
0.44
1
0.36
0.36
mA
0/10
0.5
<1
10
1.1
2.6
0.9
0.9
0/15
1.5
<1
15
3.0
6.8
2.4
2.4
I
I
Input Leakage
Current
0/18
Any Input
18
10
-5
0.1
1
1
A
C
I
Input Capacitance
Any Input
5
7.5
pF
Symbol
Parameter
Test Condition
Value (*)
Unit
V
DD
(V)
Min.
Typ.
Max.
t
PHL
t
PLH
Propagation Delay
Time
5
Comparing Inputs to Outputs
300
600
ns
10
125
250
15
80
160
t
PHL
t
PLH
Propagation Delay
Time
5
Cascading Inputs to Outputs
200
400
ns
10
80
160
15
60
120
t
THL
t
TLH
Transition Time
5
100
200
ns
10
50
100
15
40
80
HCF4585B
5/9
TEST CIRCUIT
C
L
= 50pF or equivalent (includes jig and probe capacitance)
R
L
= 200K
R
T
= Z
OUT
of pulse generator (typically 50
)
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)