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Электронный компонент: TPC8107

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TPC8107
2003-02-20
1
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOSIII)
TPC8107
Lithium Ion Battery Applications
Notebook PC Applications
Portable Equipment Applications


Small footprint due to small and thin package
Low drain-source ON resistance: R
DS (ON)
= 5.5 m (typ.)
High forward transfer admittance: |Y
fs
| = 31 S (typ.)
Low leakage current: I
DSS
= -10 A (max) (V
DS
= -30 V)
Enhancement-mode: V
th
= -0.8 to -2.0 V (V
DS
= -10 V, I
D
= -1 mA)
Maximum Ratings
(Ta = 25C)

Characteristics Symbol
Rating
Unit
Drain-source voltage
V
DSS
-30 V
Drain-gate voltage (R
GS
= 20 kW)
V
DGR
-30 V
Gate-source voltage
V
GSS
20 V
DC (Note
1)
I
D
-13
Drain current
Pulse (Note
1)
I
DP
-52
A
Drain power dissipation
(t
= 10 s)
(Note
2a)
P
D
1.9
W
Drain power dissipation
(t
= 10 s)
(Note
2b)
P
D
1.0
W
Single pulse avalanche energy
(Note 3)
E
AS
219
mJ
Avalanche current
I
AR
-13 A
Repetitive avalanche energy
(Note 2a) (Note 4)
E
AR
0.19
mJ
Channel temperature
T
ch
150
C
Storage temperature range
T
stg
-55 to 150
C
Note: For (Note 1), (Note 2), (Note 3) and (Note 4), please refer to the
next page.
This transistor is an electrostatic sensitive device. Please handle with
caution.
Unit: mm
JEDEC
JEITA
TOSHIBA 2-6J1B
Weight: 0.080 g (typ.)
Circuit Configuration
8 6
1 2 3
7
5
4
TPC8107
2003-02-20
2
Thermal Characteristics
Characteristics Symbol
Max
Unit
Thermal resistance, channel to ambient
(t
= 10 s)
(Note 2a)
R
th (ch-a)
65.8
C/W
Thermal resistance, channel to ambient
(t
= 10 s)
(Note 2b)
R
th (ch-a)
125
C/W
Marking
(Note 5)
Note 1: Please use devices on condition that the channel temperature is below 150C.
Note 2: (a) Device mounted on a glass-epoxy board (a)
(b) Device mounted on a glass-epoxy board (b)
Note 3: V
DD
= -24 V, T
ch
= 25C (initial), L = 1.0 mH, R
G
= 25 W, I
AR
= -13 A
Note 4: Repetitive rating; pulse width limited by maximum channel temperature
Note 5:
on lower left of the marking indicates Pin 1.
TYPE
TPC8107
(a)
FR-4
25.4
25.4 0.8
(unit:
mm)
(b)
FR-4
25.4
25.4 0.8
(unit:
mm)
Lot No.
Weekly code:
(Three digits)
Week of manufacture
(01 for first week of year, continues up to 52 or 53)
Year of manufacture
(One low-order digits of calendar year)
TPC8107
2003-02-20
3
Electrical Characteristics
(Ta
=
=
=
=
25C)
Characteristics Symbol
Test
Condition
Min
Typ.
Max
Unit
Gate leakage current
I
GSS
V
GS
= 16 V, V
DS
= 0 V
10
mA
Drain cut-OFF current
I
DSS
V
DS
= -30 V, V
GS
= 0 V
-10
mA
V
(BR) DSS
I
D
= -10 mA, V
GS
= 0 V
-30
Drain-source breakdown voltage
V
(BR) DSX
I
D
= -10 mA, V
GS
= 20 V
-15
V
Gate threshold voltage
V
th
V
DS
= -10 V, I
D
= -1 mA
-0.8
-2.0
V
V
GS
= -4 V, I
D
= -6.5 A
10 15
Drain-source ON resistance
R
DS (ON)
V
GS
= -10 V, I
D
= -6.5 A
5.5 7.0
m
W
Forward transfer admittance
|Y
fs
| V
DS
= -10 V, I
D
= -6.5 A
15.5 31
S
Input capacitance
C
iss
5880
Reverse transfer capacitance
C
rss
1000
Output capacitance
C
oss
V
DS
= -10 V, V
GS
= 0 V, f = 1 MHz
1050
pF
Rise time
t
r
11
Turn-ON time
t
on
22
Fall time
t
f
110
Switching time
Turn-OFF time
t
off
Duty <= 1%, t
w
= 10 ms
395
ns
Total gate charge
(gate-source plus gate-drain)
Q
g
130
Gate-source charge 1
Q
gs1
10
Gate-drain ("miller") charge
Q
gd
V
DD
~
- -24 V, V
GS
= -10 V,
I
D
= -13 A
30
nC
Source-Drain Ratings and Characteristics
(Ta
=
=
=
=
25C)
Characteristics Symbol
Test
Condition
Min
Typ.
Max
Unit
Drain reverse current
Pulse (Note 1)
I
DRP
-52
A
Forward voltage (diode)
V
DSF
I
DR
= -13 A, V
GS
= 0 V
1.2 V
R
L

=
2.
3

W
V
DD
~
- -15 V
-10 V
V
GS
0 V
4.
7
W
I
D
= -6.5 A
V
OUT
TPC8107
2003-02-20
4
















I
D
V
DS
I
D
V
DS
I
D
V
GS
V
DS
V
GS
|Y
fs
| I
D
R
DS (ON)
I
D
Fo
rw
ar
d t
r
a
n
sfe
r

ad
mi
ttanc
e


Y
fs

(
S
)
D
r
ai
n
-
so
urc
e
v
o
l
t
a
ge

V
DS
(V
)
Drain-source voltage V
DS
(V)
D
r
ai
n
cu
rre
nt

I
D
(A
)
Drain-source voltage V
DS
(V)
D
r
ai
n
cu
rre
nt

I
D
(A
)
Gate-source voltage V
GS
(V)
D
r
ai
n
cu
rre
nt

I
D
(A
)
Gate-source voltage V
GS
(V)
Drain current I
D
(A)
Drain current I
D
(A)
D
r
ai
n
-
so
urc
e
O
N
r
e
si
stanc
e
R
DS (
O
N)
(
m
W
)
-2
-3
-4
-5
Common source
VDS = -10 V
Pulse test
0
-20
-30
-40
-50
-10
0
-1
100
Ta
= -55C
25
-8
-12
-16
-20
Common source
Ta
= 25C
Pulse test
0
-0.2
-0.3
-0.4
-0.5
-0.1
0
-4
ID = -13 A
-3
-6.5
0.3
-0.1
-0.3
-1
-3
-10
-30
-100
1
3
10
30
100
Common source
VDS = -10 V
Pulse test
Ta
= -55C
100
25
0.3
-0.1
-0.3
-1
-3
-10
-30
-100
1
3
10
30
100
Common source
Ta
= 25C
Pulse test
-10
VGS = -4 V
-2
-3
-4
-5
Common source
Ta
= 25C
Pulse test
-2.2
VGS = -2 V
0
-20
-30
-40
-50
-10
0
-1
-3
-6
-8
-10
-2.4
-2.6
-2.8
-4
0
-4
-8
-12
-16
-20
Common source
Ta
= 25C
Pulse test
VGS = -2 V
-2.2
-3
-4
-10
-8
-6
-2.4
-2.6
-2.8
-0.4
-0.6
-0.8
-1.0
0
-0.2
TPC8107
2003-02-20
5

















R
DS (ON)
Ta
I
DR
V
DS
Capacitance V
DS
V
th
Ta
P
D
Ta
Dynamic input/output characteristics
D
r
ai
n
po
w
e
r
di
ssi
p
a
ti
on


P
D
(W
)
Gate
th
res
hol
d vol
t
a
ge

V
th
(
V
)
Ambient temperature Ta (C)
D
r
ai
n
-
so
urc
e
O
N
r
e
si
stanc
e
R
DS (ON)
(m
W
)
Drain-source voltage V
DS
(V)
Drain-source voltage V
DS
(V)
C
apaci
t
anc
e C
(p
F)
Ambient temperature Ta (C)
Ambient temperature Ta (C)
D
r
ai
n
-
so
urc
e
v
o
l
t
a
ge

V
DS
(V
)
Gate
-so
u
r
c
e
v
o
l
t
age
V
GS
(V
)
Total gate charge Q
g
(nC)
D
r
ai
n
re
ver
s
e c
u
r
r
e
n
t

I
DR
(
A
)
30
-0.1
-0.3
-1
-3
-10
-30
-100
100
300
1000
3000
10000
Crss
Coss
Ciss
Common source
VGS = 0 V
f
= 1 MHz
Ta
= 25C
-1.2
0
-80
-40 0 40
120
160
80
-0.4
-0.8
-1.6
-2.0
Common source
VDS = -10 V
ID = -1 mA
Pulse test
80 120 160 200
0
0.8
1.2
1.6
2.0
0.4
0 40
(1) Device mounted on a
glass-epoxy board (a)
(Note 2a)
(2) Device mounted on a
glass-epoxy board (b)
(Note 2b)
t
= 10 s
(1)
(2)
0
-10
-20
-30
0 40 80 120
160
Common source
ID = -13 A
Ta
= 25C
Pulse test
VDD = -24 V
VDS
VGS
-30
-20
0
-10
200
VDD = -24 V
-12
-12
-6
-6
0
-80
-40 0 40
120
160
80
10
20
30
VGS = -4 V
-10
ID = -13 A, -6.5 A, -3 A
ID = -13 A, -6.5 A, -3 A
Common source
Pulse test
0
-0.1
-1
-10
-100
0.2 0.4 0.6 0.8 1.0 1.2
-10
Common source
Ta
= 25C
Pulse test
-5
-3
-1
VGS = 0 V
TPC8107
2003-02-20
6
























Drain-source voltage V
DS
(V)
D
r
ai
n
cu
rre
nt

I
D
(A
)
Safe operating area
Pulse width t
w
(S)
r
th
- t
w
Norm
al
i
z
ed t
r
ans
i
e
n
t
t
herm
a
l
i
m
pe
danc
e
r
th
(

C
/
W
)
0.1
0.001 0.01 0.1
1
10 100 1000
1
10
100
1000
Single pulse
(2)
(1) Device mounted on a glass-epoxy board (a)
(Note 2a)
(2) Device mounted on a glass-epoxy board (b)
(Note 2b)
t
= 10 s
(1)
-0.01
-1
-0.1
-10
-100
-0.01
-0.1
-1
-10
-100
* Single
pulse
Ta
= 25C
Curves must be derated
linearly with increase in
temperature.
ID max (pulse) *
10 ms*
1 ms*
VDSS max
TPC8107
2003-02-20
7

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devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
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set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability
Handbook" etc..
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(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
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document shall be made at the customer's own risk.
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
The information contained herein is subject to change without notice.
000707EAA
RESTRICTIONS ON PRODUCT USE